Method for testing a latching solenoid of a switch and testing device for carrying out the method

Patent metadata

Field	Value
Publication number	US-10132866-B2
Application number	US-201514608499-A
Country	US
Kind code	B2
Filing date	Jan 29, 2015
Priority date	Apr 3, 2014
Publication date	Nov 20, 2018
Grant date	Nov 20, 2018

Abstract

A method is disclosed for testing a latching solenoid of a switch and a testing device for carrying out the method is disclosed. The switch includes a switching contact, formed by contact elements mechanically separated from one another when the switching contact is open; an electronic trip unit, to respectively monitor the current passing via the contact elements and test whether a current-dependent tripping condition is satisfied; and an actuator, to separate contact elements after actuation, the trip unit actuating the actuator via the latching solenoid when the tripping condition is satisfied; and an electrical energy store, to charge to a voltage before the tripping and to be discharged via the latching solenoid. After a period of time after the tripping, the voltage of the energy store is compared with a reference value and a fault signal is output if the voltage of the energy store is above the reference.

First claim

What is claimed is:

1. A method for testing a winding for wire rupture of a latching solenoid of a switch, wherein the latching solenoid includes a permanent magnet and the switch including a switching contact formed by contact elements which are mechanically separated from one another to open the switching contact in a conductor having a magnetic field region; a sensor coil, in the magnetic field region, configured to sense current flowing through the conductor and to emit a voltage signal proportional to current of the sensor coil; an electronic trip unit, by which current passing via the contact elements is respectively monitored and it is tested whether a current-dependent tripping condition is satisfied; an actuator, actuatable by the electronic trip unit via the latching solenoid when the tripping condition is satisfied and by which the contact elements are separated after actuation; an electrical energy store, chargeable to a voltage before the tripping and dischargeable via the latching solenoid to separate the contact elements, and a transistor switch connected to the energy store and to the winding of the latching solenoid, the method comprising:
closing, after the tripping condition is satisfied, the transistor switch and creating a closed circuit including the transistor switch, the electrical energy store and the winding of the latching solenoid;
comparing, after a period of time after tripping, the voltage of the energy store with a reference value;
determining whether a wire rupture of the winding exists on the basis of whether the voltage of the energy store is greater than, equal to and smaller than the reference value;
outputting a fault signal if the voltage of the energy store is above the reference value; and
wherein the fault signal indicates a non-discharging of the energy store due to a wire rupture of the winding of the latching solenoid.

2. The method for testing a winding for wire rupture of a latching solenoid of a switch of claim 1 , wherein the tripping condition includes actuating the actuator via the latching solenoid.

3. A testing device for testing a winding for wire rupture of a latching solenoid of a switch, wherein the latching solenoid includes a permanent magnet and the switch including a switching contact in a conductor, the conductor having a magnetic field region and formed by contact elements which are mechanically separated from one another when the switching contact is open; an electronic trip unit, to respectively monitor current passing via the contact elements and to test whether a current-dependent tripping condition is satisfied; an actuator, configured to separate the contact elements after actuation, the electronic trip unit being configured to actuate the actuator via the latching solenoid when the tripping condition is satisfied; an electrical energy store, charging of the electrical energy store to a voltage takes place before the tripping, configured to be discharged via the latching solenoid to separate the contact elements, and a transistor switch connected to the energy store and to the winding of the latching solenoid, the testing device comprising:
a sensor coil, in the magnetic field region, which is configured to sense current flowing through the conductor and to emit a voltage signal proportional to current of the sensor coil;
a comparator to, after a predetermined period of time after the tripping, compare the voltage of the energy store with a reference value, a fault signal being output if the voltage of the energy store is above the reference value; and
a processor configured to
close, after the tripping condition is satisfied, the transistor switch and creating a closed circuit including the transistor switch, the electrical energy store and the winding of the latching solenoid;
determine whether a wire rupture of the winding exists based on whether the voltage of the energy store is greater than, equal to or smaller than the reference value,
output a fault signal indicative of the wire rupture if the voltage of the energy store is above the reference value,
wherein the fault signal indicates a non-discharging of the energy store due to a wire rupture of the winding of the latching solenoid.

4. The testing device of claim 3 , wherein the permanent magnet, which on account of its magnetic field, is configured to attract a push rod counter to a resilient force.

5. The testing device of claim 4 , further comprising a spring to generate the resilient force.

6. The testing device of claim 4 , wherein the latching solenoid includes a winding, via which the energy store is dischargeable, the discharge weakening the magnetic force of the permanent magnet by the opposing magnetic field of the winding flowed through by current, in such a way that the push rod comes away from the permanent magnet.

7. The testing device of claim 4 , wherein the actuator includes a breaker mechanism, kept under prestress and unlatchable via the push rod.

8. The testing device of claim 4 , wherein the trip unit includes the processor, which is further configured to
close a circuit to discharge the energy store via the winding.

9. The testing device of claim 4 , wherein the energy store is an electrical capacitor.

10. The testing device of claim 3 , wherein the latching solenoid includes the winding, via which the energy store is dischargeable, the discharge weakening the magnetic force of the permanent magnet by the opposing magnetic field of the winding flowed through by current, in such a way that a push rod comes away from the permanent magnet.

11. The testing device of claim 3 , wherein the actuator includes a breaker mechanism, kept under prestress and unlatchable via a push rod.

12. The testing device of claim 3 , wherein the processor is further configured to close a circuit to discharge the energy store via the winding.

13. The testing device of claim 3 , wherein the energy store is an electrical capacitor.

14. The testing device of claim 3 , wherein the tripping condition includes actuating the actuator via the latching solenoid.

Assignees

• Siemens Ag

Inventors

• Fischer Andreas
• Widmann Stefan

Classifications

• H01H50/32

  Latching movable parts mechanically · CPC title

• H01H50/20

  movable inside coil and substantially lengthwise with respect to axis thereof; movable coaxially with respect to coil · CPC title

• G01R31/3278

  of relays, solenoids or reed switches (measuring contact resistance G01R27/205; high voltage magnetic switches G01R31/3271, G01R31/333; testing electric windings G01R31/72; monitoring of fail safe circuits H01H47/002) · CPC title

• H01H51/01

  Relays in which the armature is maintained in one position by a permanent magnet and freed by energisation of a coil producing an opposing magnetic field {(H01H51/02 - H01H51/26 take precedence)} · CPC title

• H01H47/002 Primary

  Monitoring or fail-safe circuits · CPC title