Current sense amplifier with common mode rejection

Patent metadata

Field	Value
Publication number	US-10132844-B2
Application number	US-201615069518-A
Country	US
Kind code	B2
Filing date	Mar 14, 2016
Priority date	Nov 17, 2015
Publication date	Nov 20, 2018
Grant date	Nov 20, 2018

Abstract

The overall performance of a current sense amplifier system may be improved by increasing the common mode rejection of the system. In particular, improved current sense amplifier systems of this disclosure may be configured to use a first ADC path to measure a current flowing through a device, a second ADC path to measure a common mode value, a memory element to store a calibration value, and a summer block to output a voltage proportional to the measured current through the device by correcting a voltage value output by the first ADC path based on the measured common mode value of the second ADC path and the stored calibration value.

First claim

What is claimed is:

1. An apparatus for measuring a current through a device, comprising:
a first analog-to-digital conversion (ADC) path coupled to the device and configured to measure a current value;
a second ADC path coupled to the device and configured to measure a common mode value;
a memory element comprising a stored calibration value; and
a summer block coupled to the first ADC path, the second ADC path, and the memory element, wherein the summer block is configured to output a voltage proportional to the measured current through the device by correcting a voltage value output by the first ADC path based, at least in part, on the measured common mode value of the second ADC path and the stored calibration value.

2. The apparatus of claim 1 , wherein a voltage across a sense resistor generated based, at least in part, on the measured current through the device comprises a small signal voltage having an amplitude smaller than the common mode value present on each node of the sense resistor.

3. The apparatus of claim 1 , wherein the first ADC path comprises:
an amplifier coupled to a sense resistor, wherein the sense resistor is in series with the device; and
an ADC coupled to an output of the amplifier and configured to provide a digital value representative of the measured current value to the summer block.

4. The apparatus of claim 3 , wherein the first ADC path further comprises:
a first resistor coupled between the sense resistor and a first input node of the amplifier; and
a second resistor having a second resistance value approximately equal to a first resistance value of the first resistor, wherein the second resistor is coupled between the sense resistor and a second input node of the amplifier,
wherein a modified common mode value generated by the multiplication of a voltage proportional to the measured common mode value and the stored calibration value is subtracted from an output of the first ADC path by the summer block to compensate for a mismatch between the first resistance value and the second resistance value.

5. The apparatus of claim 4 , wherein the second ADC path further comprises a phase equalization filter coupled between the ADC and the summer block.

6. The apparatus of claim 4 , wherein an ADC of the second ADC path is configured with a dynamic range that is smaller than a dynamic range of a second analog-to-digital converter (ADC) of the first ADC path.

7. The apparatus of claim 4 , wherein the second ADC path comprises at least one component configured to perform voltage monitoring within the apparatus.

8. The apparatus of claim 1 , wherein the second ADC path comprises:
an amplifier block coupled to the device; and
an ADC coupled to an output of the amplifier and configured to provide a digital value for the measured common mode to the summer block.

9. The apparatus of claim 1 , wherein the device comprises a transducer and an output of the summer block is coupled to a speaker protection circuit.

10. The apparatus of claim 1 , wherein the device comprises a transducer and an output of the summer block is coupled to a speaker linearization circuit.

11. The apparatus of claim 1 , wherein the device comprises a haptic feedback device and an output of the summer block is coupled to a haptic control circuit.

12. A method for measuring a current through a device, comprising:
measuring, with a first analog-to-digital conversion (ADC) path, a current value for the current through the device;
measuring, with a second ADC path, a common mode value for the device;
receiving, from a memory element, a stored calibration value; and
determining the current through the device by correcting a voltage proportional to the measured current value based, at least in part, on the measured common mode value and the stored calibration value.

13. The method of claim 12 , wherein a voltage across a sense resistor generated based, at least in part, on the measured current through the device comprises a small signal voltage having an amplitude smaller than the common mode value present on each node of the sense resistor.

14. The method of claim 12 , wherein the step of measuring the current value comprises:
sensing a voltage proportional to a current through a sense resistor in series with the device with an amplifier; and
converting an analog signal at an output of the amplifier to a digital signal for determining the current.

15. The method of claim 12 , wherein the step of correcting the voltage proportional to the measured current value comprises correcting for a resistor mismatch in the first ADC path.

16. The method of claim 12 , further comprising performing a phase equalization in the second ADC path.

17. The method of claim 12 , wherein the first ADC path has a dynamic range that is larger than a dynamic range of the second ADC path.

18. The method of claim 12 , further comprising performing speaker protection based, at least in part, on the determined current through the device.

19. The method of claim 12 , further comprising performing speaker linearization based, at least in part, on the determined current through the device.

20. The method of claim 12 , further comprising providing haptic feedback based, at least in part, on the determined current through the device.

21. A mobile device, comprising:
a transducer;
a controller integrated circuit (IC) coupled to the transducer, wherein the controller IC is configured to measure a current through the transducer, the controller IC comprising:
a first analog-to-digital conversion (ADC) path coupled to the device and configured to measure a current value;
a second ADC path coupled to the device and configured to measure a common mode value;
a memory element comprising a stored calibration value; and
a summer block coupled to the first ADC path, the second ADC path, and the memory element, wherein the summer block is configured to output a voltage proportional to the measured current through the device by correcting a voltage value output by the first ADC path based, at least in part, on the measured common mode value and the stored calibration value.

22. The apparatus of claim 21 , wherein the first ADC path comprises:
an amplifier coupled to a sense resistor in series with the device; and
an ADC coupled to an output of the amplifier and configured to provide a digital value to the summer block.

23. The apparatus of claim 22 , wherein the first ADC path further comprises:
a first resistor coupled between the sense resistor and a first input node of the amplifier;
a second resistor having a second resistance value approximately equal to a first resistance value of the first resistor, wherein the second resistor is coupled between the sense resistor and a second input node of the amplifier,
wherein a modified common mode value generated by the multiplication of a voltage proportional to the measured common mode value and the stored calibration value is subtracted from an output of the first ADC path by the summer block to compensate for a mismatch between the first resistance value and the second resistance value.

24. The apparatus of claim 21 , wherein an ADC of the second ADC path is configured with a dynamic range that is smaller than a dynamic range of an ADC of the first ADC path.

25. The apparatus of claim 21 , wherein the controller IC is further configured to perform speaker protection based, at least in part

Assignees

• Cirrus Logic Int Semiconductor Ltd
• Cirrus Logic Inc

Inventors

• Parupalli Vamsikrishna
• Tyagi Itisha

Classifications

• G01R19/10 Primary

  Measuring sum, difference or ratio · CPC title

• H03F3/45

  Differential amplifiers (differential sense amplifiers G11C7/062) · CPC title

• H03F3/45475

  using IC blocks as the active amplifying circuit · CPC title

• H03F2203/45081

  the common mode signal being level shifted before using it for controlling or adding · CPC title

• H03F2200/171

  A filter circuit coupled to the output of an amplifier · CPC title