Method of compensating for an excimer laser annealing mura and display device employing the same

US10127853B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10127853-B2
Application numberUS-201615388933-A
CountryUS
Kind codeB2
Filing dateDec 22, 2016
Priority dateJan 20, 2016
Publication dateNov 13, 2018
Grant dateNov 13, 2018

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Abstract

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A method of compensating for Mura in a display panel includes displaying a high gray-scale image and a low gray-scale image on a display panel. The displayed images are photographed to generate a high gray-scale luminance image and a low gray-scale luminance image. An ELA Mura for-measurement image having moiré-removed luminance values is generated by dividing luminance values of the low gray-scale luminance image by luminance values of the high gray-scale luminance image. One-dimensional average data is obtained from the ELA Mura for-measurement image. The one-dimensional average data is transformed into frequency-domain data. Target frequency-domain data having a maximum peak value is identified from the frequency-domain data. A direction, an intensity, and a frequency of the ELA Mura are obtained from the target frequency-domain data. A filter is determined based on the obtained information. The filter is applied to image data.

First claim

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What is claimed is: 1. A method of compensating for Mura in a display panel, the method comprising: displaying a high gray-scale image and a low gray-scale image on a display panel; photographing the high gray-scale image and the low gray-scale image using a luminance measuring equipment to generate a high gray-scale luminance image and a low gray-scale luminance image, respectively; generating an ELA Mura for-measurement image having moire-removed luminance values by dividing luminance values of the low gray-scale luminance image by luminance values of the high gray-scale luminance image; obtaining, at predetermined rotation angles while rotating the ELA Mura for-measurement image, one-dimensional average data by sequentially listing average luminance values, each of which is calculated by averaging luminance values in a predetermined direction on the ELA Mura for-measurement image; transforming the obtained one-dimensional average data into frequency-domain data using a Fast Fourier Transform algorithm; identifying target frequency-domain data having a maximum peak value from among the frequency-domain data; obtaining a direction, an intensity, and a frequency of the ELA Mura from the target frequency-domain data; determining an ELA Mura for-compensation band-reject filter based on the obtained direction, intensity, and frequency of the ELA Mura; and applying the ELA Mura for-compensation band-reject filter to initial image data to generate corrected image data. 2. The method of claim 1 , wherein the moire-removed luminance values are normalized to be less than or equal to 1. 3. The method of claim 1 , wherein the ELA Mura for-measurement image is rotated from 0° to 180°, an interval of the rotation angles is 0.1°, and a number of the one-dimensional average data is 1800. 4. The method of claim 1 , wherein the direction of the ELA Mura is determined based on the rotation angle at which the target frequency-domain data is obtained, the intensity of the ELA Mura is determined based on the maximum peak value of the target frequency-domain data, and the frequency of the ELA Mura is determined based on a frequency at which the maximum peak value of the target frequency-domain data is located. 5. The method of claim 4 , wherein the ELA Mura for-compensation band-reject filter has no band-reject frequency band when the maximum peak value of the target frequency-domain data is less than a predetermined reference value. 6. The method of claim 4 , wherein a band-reject frequency band of the ELA Mura for-compensation band-reject filter includes the frequency at which the maximum peak value of the target frequency-domain data is located. 7. The method of claim 6 , wherein a degree of band-reject filtering of the ELA Mura for-compensation band-reject filter decreases as luminance of the image data increases. 8. The method of claim 6 , wherein the ELA Mura for-compensation band-reject filter performs no band-reject filtering when luminance of the image data is higher than predetermined reference luminance. 9. The method of claim 1 , further comprising: correcting the ELA Mura for-compensation band-reject filter based on a re-measured ELA Mura that is generated by measuring the ELA Mura based on a for-correction image displayed on the display panel. 10. A display device comprising: a display panel including a plurality of pixels; a scan driver configured to provide a scan signal to the display panel; a data driver configured to provide a data signal to the display panel; a timing controller configured to control the scan driver and the data driver; and an excimer laser annealing (ELA) Mura compensator configured to determine an ELA Mura for-compensation band-reject filter based on a direction, an intensity, and a frequency of an ELA Mura of the display panel and generate ELA Mura compensated image data corresponding to the data signal by applying the determined Mura for-compensation band-reject filter to image data. 11. The device of claim 10 , wherein the ELA Mura compensator is included within the timing controller or the data driver. 12. The device of claim 10 , wherein the ELA Mura compensator is external to the timing controller and the data driver. 13. A display device comprising: a display panel including a plurality of pixels; a scan driver configured to provide a scan signal to the display panel; a data driver configured to provide a data signal to the display panel; a timing controller configured to control the scan driver and the data driver; and an excimer laser annealing (ELA) Mura compensator configured to generate ELA Mura compensated image data corresponding to the data signal by applying an Mura for-compensation band-reject filter to image data, wherein the ELA Mura for-compensation band-reject filter is determined by: displaying a high gray-scale image arid a low gray-scale image on a display panel; photographing the high gray-scale image and the low gray-scale image using a luminance measuring equipment to generate a high gray-scale luminance image and a low gray-scale luminance image, respectively generating an ELA Mura for-measurement image having moire-removed luminance values by dividing luminance values of the low gray-scale luminance image by luminance values of the high gray-scale luminance image; obtaining, at predetermined rotation angles while rotating the ELA Mura for-measurement image, one-dimensional average data by sequentially listing average luminance values each of which is calculated by averaging luminance values in a predetermined direction on the ELA Mura for-measurement image; transforming the obtained one-dimensional average data into frequency-domain data using a Fast Fourier Transform algorithm; identifying target frequency-domain data having a maximum peak value from among the frequency-domain data; and obtaining a direction, an intensity, and a frequency of an ELA Mura that exists in the display panel from the target frequency-domain data having a maximum peak value among the frequency-domain data. 14. The device of claim 13 , wherein the moire-removed luminance values are normalized to be less than or equal to 1. 15. The device of claim 13 , wherein the ELA Mura for-measurement image is rotated from 0° to 180°, an interval of the rotation angles is 0.1°, and a number of the one-dimensional average data is 1800. 16. The device of claim 13 , wherein the direction of the ELA Mura is determined based on the rotation angle at which the target frequency-domain data is obtained, the intensity of the ELA Mura is determined based on the maximum peak value of the target frequency-domain data, and the frequency of the ELA Mura is determined based on a frequency at which the maximum peak value of the target frequency-domain data is located. 17. The device of claim 16 , wherein a band-reject frequency band of the ELA Mura for-compensation band-reject filter includes the frequency at which the maximum peak value of the target frequency-domain data is located. 18. The device of claim 17 , wherein a degree of band-reject filtering of the ELA Mura for-compensation band-reject filter decreases as luminance of the image data increases. 19. The device of claim 17 , wherein the ELA Mura for-compensation band-reject filter performs no band-reject filtering when luminance of the image data is higher than predetermined reference luminance. 20. The device of claim 13 , wherein the ELA Mura for-compensation band-reject filter is corrected based on a re-measured ELA Mura that is genera

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Classifications

  • Pulsed laser beam · CPC title

  • Beam shaping, e.g. using a mask · CPC title

  • the light originating from the display screen · CPC title

  • Control of matrices with row and column drivers · CPC title

  • Details of drivers for data electrodes · CPC title

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What does patent US10127853B2 cover?
A method of compensating for Mura in a display panel includes displaying a high gray-scale image and a low gray-scale image on a display panel. The displayed images are photographed to generate a high gray-scale luminance image and a low gray-scale luminance image. An ELA Mura for-measurement image having moiré-removed luminance values is generated by dividing luminance values of the low gray-s…
Who is the assignee on this patent?
Samsung Display Co Ltd
What technology area does this patent fall under?
Primary CPC classification B62B15/004. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Nov 13 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).