Time-based delay line analog-to-digital converter with variable resolution

Patent metadata

Field	Value
Publication number	US-10122375-B2
Application number	US-201815915796-A
Country	US
Kind code	B2
Filing date	Mar 8, 2018
Priority date	Apr 12, 2016
Publication date	Nov 6, 2018
Grant date	Nov 6, 2018

Abstract

Embodiments of the present disclosure include a differential digital delay line analog-to-digital converter (ADC), comprising differential digital delay lines including series coupled delay cells, wherein a delay time of a first delay line is controlled by a first input of the ADC and a delay time of a second delay line is controlled by a second input of the ADC. The ADC includes a pair of bypass multiplexers coupled at a predefined node location in the series coupled delay cells, latches each coupled with the series coupled delay cells, a converter circuit coupled with the plurality of latches configured to convert data from the latches into an output value of the ADC, and logic circuits configured to select data from the series coupled delay cells to the latches depending on a selected resolution of the differential digital delay line analog-to-digital converter.

First claim

The invention claimed is:

1. A differential digital delay line analog-to-digital converter (ADC), comprising:
differential digital delay lines comprising a plurality of series coupled delay cells, wherein a delay time of a first delay line is related to a first voltage at an input of the ADC and a delay time of a second delay line is related to a second voltage at the input of the ADC;
a first bypass circuit communicatively coupled at a predefined node location in the series coupled delay cells;
a plurality of storage circuits each coupled with the series coupled delay cells;
a converter circuit coupled with the plurality of storage circuits configured to convert data from the storage circuits into an output value of the ADC; and
a plurality of logic circuits configured to select data from the storage circuits depending on a selected resolution of the differential digital delay line analog-to-digital converter.

2. The ADC of claim 1 , wherein the first bypass circuit includes a multiplexer.

3. The ADC of claim 1 , wherein the first bypass circuit is placed at a 50% point of the series coupled delay cells.

4. The ADC of claim 1 , further comprising a second bypass circuit located at a 50% point between the first bypass circuit and a delay line end.

5. The ADC of claim 4 , wherein the second bypass circuit is configured to reduce a resolution of the ADC.

6. The ADC of claim 1 , wherein the first bypass circuit is configured to selectively bypass part of the differential digital delay lines according to the selected resolution.

7. The ADC of claim 1 , further comprising additional bypass circuits, wherein each of the first bypass circuit and the additional bypass circuits is associated with a bit of resolution of the ADC.

8. A microcontroller comprising:
a processor core;
a memory; and
a differential digital delay line analog-to-digital converter (ADC), comprising:
differential digital delay lines comprising a plurality of series coupled delay cells, wherein a delay time of a first delay line is related to a first voltage at an input of the ADC and a delay time of a second delay line is related to a second voltage at the input of the ADC;
a first bypass circuit communicatively coupled at a predefined node location in the series coupled delay cells;
a plurality of storage circuits each coupled with the series coupled delay cells;
a converter circuit coupled with the plurality of storage circuits configured to convert data from the storage circuits into an output value of the ADC; and
a plurality of logic circuits configured to select data from the storage circuits depending on a selected resolution of the differential digital delay line analog-to-digital converter.

9. The processor of claim 8 , wherein the first bypass circuit includes a multiplexer.

10. The processor of claim 8 , wherein the first bypass circuit is placed at a 50% point of the series coupled delay cells.

11. The processor of claim 8 , further comprising a second bypass circuit located at a 50% point between the first bypass circuit and a delay line end.

12. The processor of claim 11 , wherein the second bypass circuit is configured to reduce a resolution of the ADC.

13. The processor of claim 8 , wherein the first bypass circuit is configured to selectively bypass part of the differential digital delay lines according to the selected resolution.

14. The processor of claim 8 , further comprising additional bypass circuits, wherein each of the first bypass circuit and the additional bypass circuits is associated with a bit of resolution of the ADC.

15. A method of converting an analog signal to a digital value, comprising:
applying a first voltage to a differential digital delay line analog-to-digital converter (ADC);
applying a second voltage to the ADC;
passing signals through a plurality of series coupled delay cells in the ADC, wherein a delay time of a first delay line is related to the first voltage and a delay time of a second delay line is related to the second voltage;
storing values from the series coupled delay cells in a plurality of storage circuits;
converting, with a converter circuit, data from the storage circuits into an output value of the ADC;
passing the signals through a first bypass circuit communicatively coupled at a predefined node location in the series coupled delay cells; and
selecting data from the storage circuits depending on a selected resolution of the ADC.

16. The method of claim 15 , wherein the first bypass circuit is placed at a 50% point of the series coupled delay cells.

17. The method of claim 15 , further comprising passing the signals through a second bypass circuit located at a 50% point between the first bypass circuit and a delay line end.

18. The method of claim 17 , further comprising reducing resolution of the ADC by passing the signals through the second bypass circuit located at the 50% point between the first bypass circuit and a delay line end.

19. The method of claim 18 , further comprising selectively bypassing part of the differential digital delay lines according to the selected resolution.

20. The method of claim 19 , further comprising passing the signals through additional bypass circuits, wherein each of the first bypass circuit and the additional bypass circuits is associated with a bit of resolution of the ADC.

Assignees

• Microchip Tech Inc

Inventors

• Kris Bryan
• Deutscher Neil
• Spohrer Thomas S

Classifications

• H03M1/1071

  Measuring or testing · CPC title

• H03K5/14

  by the use of delay lines (H03K5/133 takes precedence) · CPC title

• H03M1/502 Primary

  using tapped delay lines · CPC title

• H03K5/131

  Digitally controlled · CPC title

• H03M1/34 Primary

  Analogue value compared with reference values (H03M1/48 takes precedence) · CPC title