Variable capacitance non-contact AC voltage measurement system

Patent metadata

Field	Value
Publication number	US-10119998-B2
Application number	US-201615345256-A
Country	US
Kind code	B2
Filing date	Nov 7, 2016
Priority date	Nov 7, 2016
Publication date	Nov 6, 2018
Grant date	Nov 6, 2018

Abstract

Systems and methods for measuring alternating current (AC) voltage of an insulated conductor (e.g., insulated wire) are provided, without requiring a galvanic connection between the conductor and a test electrode or probe. A non-galvanic contact (or “non-contact”) voltage measurement system includes a variable capacitance subsystem which operates to generate a variable capacitive voltage between an insulated conductor under test and earth ground. During measurement, the non-contact voltage measurement system varies the capacitance of the variable capacitance subsystem to change the impedance of a capacitive divider circuit between the insulated conductor under test and earth ground. By sequentially making two (or three) measurements across the variable capacitance subsystem, the AC voltage of the insulated conductor can be determined without requiring any galvanic connection to the insulated conductor. The determined AC voltage of the insulated conductor may then be presented to an operator and/or communicated to an external device.

First claim

The invention claimed is:

1. A system to measure alternating current (AC) voltage in an insulated conductor, the system comprising:
a conductive sensor positionable adjacent the insulated conductor without galvanically contacting the conductor, wherein the conductive sensor capacitively couples with the insulated conductor;
a variable capacitance subsystem which includes a first capacitance subsystem node and a second capacitance subsystem node, the first capacitance subsystem node electrically coupled to the conductive sensor, and the first capacitance subsystem node and the second capacitance subsystem node having a capacitance therebetween which is selectively variable between at least a first capacitance value (C 1 ) and a second capacitance value (C 2 ), the second capacitance value (C 2 ) being different from the first capacitance value (C 1 );
a voltage measurement subsystem which in operation detects a voltage between the first capacitance subsystem node and the second capacitance subsystem node;
at least one nontransitory processor-readable storage medium that stores at least one of processor-executable instructions or data; and
at least one processor communicatively coupled to the at least one nontransitory processor-readable storage medium, and in operation, in response to execution of the processor-executable instructions or data, the at least one processor:
causes the variable capacitance subsystem to have the first capacitance value (C 1 ) between the first capacitance subsystem node and the second capacitance subsystem node;
causes the voltage measurement subsystem to detect a first voltage (V M1 ) between the first capacitance subsystem node and the second capacitance subsystem node;
causes the variable capacitance subsystem to have the second capacitance value (C 2 ) between the first capacitance subsystem node and the second capacitance subsystem node;
causes the voltage measurement subsystem to detect a second voltage (V M2 ) between the first capacitance subsystem node and the second capacitance subsystem node; and
determines the AC voltage (V AC ) in the insulated conductor based at least in part on the detected first voltage (V M1 ) and the detected second voltage (V M2 ).

2. The system of claim 1 wherein the at least one processor:
determines the AC voltage (V AC ) in the insulated conductor according to the formula: V AC =V M1 ×[(C 1 /C 2 )−1]/[(C 1 V M1 /C 2 V M2 )−1].

3. The system of claim 1 wherein the voltage measurement subsystem comprises at least one analog-to-digital converter (ADC).

4. The system of claim 1 wherein the measurement subsystem has an effective resolution of at least 20 bits.

5. The system of claim 1 wherein the variable capacitance subsystem comprises at least a first capacitor and a second capacitor which are each selectively electrically coupled between the first capacitance subsystem node and the second capacitance subsystem node.

6. The system of claim 1 wherein the variable capacitance subsystem comprises a first capacitor electrically coupled between the first capacitance subsystem node and the second capacitance subsystem node, and a second capacitor which is selectively electrically coupled between the first capacitance subsystem node and the second capacitance subsystem node.

7. The system of claim 1 wherein a ratio (C 1 :C 2 ) of the first capacitance value (C 1 ) to the second capacitance value (C 2 ) is between 2:5 and 1:10 inclusive.

8. The system of claim 1 wherein the first capacitance value (C 1 ) is selectively variable to accommodate different values of input signals and input capacitance.

9. The system of claim 1 , further comprising:
a user interface communicatively coupled to the at least one processor, wherein the at least one processor presents the determined AC voltage (V AC ) via the user interface.

10. The system of claim 9 wherein the user interface comprises at least one of a display or a plurality of light emitters.

11. The system of claim 1 wherein, in operation, the second capacitance subsystem node is electrically coupled to a reference node via the body of a user operating the system.

12. The system of claim 1 , further comprising:
a reference connection which electrically couples the second capacitance subsystem node to earth ground.

13. The system of claim 1 wherein the first capacitance subsystem node and the second capacitance subsystem node have a capacitance therebetween which is further selectively variable between at least the first capacitance value (C 1 ), the second capacitance value (C 2 ) and a third capacitance value (C 3 ), and in response to execution of the processor-executable instructions or data in the nontransitory processor-readable storage medium, the at least one processor:
causes the variable capacitance subsystem to have the third capacitance value (C 3 ) between the first capacitance subsystem node and the second capacitance subsystem node;
causes the voltage measurement subsystem to detect a third voltage (V M3 ) between the first capacitance subsystem node and the second capacitance subsystem node; and
determines the AC voltage (V AC ) in the insulated conductor based at least in part on the detected first voltage (V M1 ), second voltage (V M2 ), and third voltage (V M3 ).

14. The system of claim 13 wherein the at least one processor:
determines the AC voltage (V AC ) in the insulated conductor according to the formula: V AC =C 3 V M3 ×[(V M2 −V M1 )/(C 1 V M1 −C 2 V M2 )]+V M3 .

15. A system to measure alternating current (AC) voltage in an insulated conductor, the system comprising:
a conductive sensor positionable adjacent an insulated conductor without galvanically contacting the conductor, wherein the conductive sensor capacitively couples with the insulated conductor;
a variable capacitance subsystem electrically coupled to the conductive sensor;
a voltage measurement subsystem which in operation detects a voltage across the variable capacitance subsystem;
at least one nontransitory processor-readable storage medium that stores at least one of processor-executable instructions or data; and
at least one processor communicatively coupled to the at least one nontransitory processor-readable storage medium, and in operation, in response to execution of the processor-executable instructions or data, the at least one processor:
causes the variable capacitance subsystem to have a first capacitance value (C 1 );
detects, via the voltage measurement subsystem, a first voltage (V M1 ) across the variable capacitance subsystem when the conductive sensor is positioned adjacent the insulated conductor;
causes the variable capacitance subsystem to have a second capacitance value (C 2 );
detects, via the voltage measurement subsystem, a second voltage (V M2 ) across the variable capacitance subsystem when the conductive sensor is positioned adjacent the insulated conductor; and
determines the AC voltage (V AC ) in the insulated conductor based at least in part on the detected first voltage (V M1 ) and the detected second voltage (V M2 ).

16. The system of claim 15 wherein the at least one processor:
determines the AC voltage (V AC ) in the insulated conductor according to the formula: V AC =V M1 ×[(C 1 /C 2 )−1]/[(C 1 V M1 /C 2 V M2 )−1].

17. The system of claim 15 wherein the voltage measurement subsystem has an effective resolution of at least 20 bits.

18. The system of claim 15 wherein the variable capacitance subsystem comprises at least a first capacitor, a second capacitor, and a switch coupled to at l

Assignees

• Fluke Corp

Inventors

• Ringsrud Paul Andrew
• Huber Clark N
• Gallavan Michael F

Classifications

• G01R15/16 Primary

  using capacitive devices · CPC title

• G01R19/2503

  for measuring voltage only, e.g. digital volt meters (DVM's) (G01R19/2506 - G01R19/257 take precedence) · CPC title

• G01R15/14

  Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks · CPC title

• G01R1/22

  Tong testers acting as secondary windings of current transformers · CPC title

• G01R19/00

  Arrangements for measuring currents or voltages or for indicating presence or sign thereof (G01R5/00 takes precedence; for measuring bioelectric currents or voltages A61B5/24) · CPC title