Method and device for non-contact detection of thin medium

Patent metadata

Field	Value
Publication number	US-10113976-B2
Application number	US-201515523203-A
Country	US
Kind code	B2
Filing date	Jul 8, 2015
Priority date	Nov 4, 2014
Publication date	Oct 30, 2018
Grant date	Oct 30, 2018

Abstract

A method and device for non-contact detection of a thin medium ( 5 ) is disclosed. The device comprises a light source ( 1 ), an optical splitter ( 2 ), a reference plane ( 3 ), a linearly arrayed photoelectric detector ( 6 ), a signal processing module ( 4 ) and the thin medium ( 5 ). The method involves the following steps: acquiring time for targeted light which is emitted by the light source ( 1 ) and reflected by the thin medium ( 5 ) to the linearly arrayed photoelectric detector ( 6 ), and acquiring time for reference light which is emitted by the light source ( 1 ) and reflected by the reference plane ( 3 ) to the linearly arrayed photoelectric detector ( 6 ); according to the acquired time that the targeted light and the reference light arrive at the linearly arrayed photoelectric detector ( 6 ), computing a first optical path and a second optical path corresponding to the targeted light and the reference light respectively, and acquiring quantity of bright fringes and dark fringes of interference fringes according to a predetermined computing manner by the signal processing module ( 4 ); conducting difference comparison between the quantity of the bright fringes and dark fringes of the interference fringes and the quantity of the bright fringes and dark fringes of standard interference fringes according to the predetermined manner, and if the value of the comparison result is larger than the predetermined threshold value, determining that the foreign matters are positioned on the thin medium ( 5 ). The detection method and device solves the technical problems that precision is low and measuring wavelength is long caused by an existing mechanical thickness measuring device, an infrared detector and an ultrasonic detector used to detect the foreign substance on the surface of the thin medium.

First claim

The invention claimed is:

1. A method for non-contact detection of a thin medium, comprising:
step S 1 , obtaining time instants when target light, which is generated by reflecting light emitted by a light source via the thin medium, reaches a linear array photoelectric detector;
step S 2 , obtaining time instants when reference light, which is generated by reflecting the light emitted by the light source via a reference plane, reaches the linear array photoelectric detector;
step S 3 , calculating first optical distances of the target light according to a first formula Δ 1 =ct 1 ;
calculating second optical distances of the reference light according to a second formula Δ 2 =ct 2 ; and
calculating number of changes between the bright and dark fringes in the interference fringes according to a third formula

⁢

K
⁡

(

M
,
N

)

=

Δ
2

-

Δ
1

λ
0

;

wherein, Δ 1 indicates the first optical distances of the target light, t 1 indicates a time period from a time instant of turning on the light source to the time instant when the target light reaches the linear array photoelectric detector, Δ 2 indicates the second optical distances of the target light, t 2 indicates a time period from the time instant of turning on the light source to the time instant when the reference light reaches the linear array photoelectric detector, K indicates the number of changes between the bright and dark fringes in the interference fringes, M indicates the total number of rows scanned by a light signal from the light source, N indicates the number of photosensitive units in the linear array photoelectrical detector, and λ 0 indicates a wavelength of the light source;
step S 4 , calculating a difference between the number of changes between the bright and dark fringes in the interference fringes and a standard number of changes between bright fringes and dark fringes in interference fringes by using a predetermined method, and determining that there is a foreign body on a surface of the thin medium in a case that the difference is greater than a predetermined threshold;
step S 5 , picking out the thin medium which has the foreign body on the surface.

2. The method for non-contact detection of a thin medium according to claim 1 , before step S 1 , further comprising:
turning on the light source, wherein the light emitted by the light source is divided, by an optical splitter, into first light reflected to the thin medium and second light transmitted to the reference plane, wherein,
the first light is reflected by the thin medium to generate the target light; and
the second light is reflected back to the optical splitter by the reference plane and is reflected by the optical splitter to generate the reference light.

3. A device for non-contact detection of a thin medium, comprising a light source, an optical splitter, a reference plane, a linear array photoelectric detector, a signal processing module and the thin medium, wherein
the light source, the optical splitter and the reference plane are located at a same horizontal line;
the signal processing module, the linear array photoelectric detector, the optical splitter and the thin medium are located at a same vertical line;
the linear array photoelectric detector is located between the signal processing module and the optical splitter; and
the optical splitter is sloped;
wherein, the light source is configured to emit light to the optical splitter, wherein the optical splitter divides the light into first light reflected to the thin medium and second light transmitted to the reference plane;
the thin medium is configured to reflect the first light to the signal processing module to extract a signal;
the reference plane is configured to reflect the second light to the optical splitter, wherein the optical splitter guides the second light to the signal processing module to extract a signal;
the signal processing module is configured to calculate first optical distances of the target light, to calculate second optical distances of the reference light, to calculate number of changes between the bright and dark fringes of the interference fringes, and to determine that there is a foreign body on the surface of the thin medium; and
the linear array photoelectrical detector is installed above the signal processing module and configured to record time instants when target light and reference light reach the linear array photoelectric detector respectively after the light source is turned on.

4. The device for non-contact detection of a thin medium according to claim 3 , further comprising:
a transparent component placed below the thin medium; and
a lens array installed between the linear array photoelectric detector and the optical splitter.

5. The device for non-contact detection of a thin medium according to claim 3 , further comprising:
an external frame, wherein the light source and the reference plane are installed on two inner walls of the external frame respectively, the transparent component placed below the thin medium is arranged on top of the external frame, an inner groove is provided at inner bottom of the external frame, and the linear array photoelectric detector is arranged in the inner groove; and
the signal processing module is arranged at bottom of the external frame.

6. The device for non-contact detection of a thin medium according to claim 4 , further comprising:
an external frame, wherein the light source and the reference plane are installed on two inner walls of the external frame respectively, the transparent component placed below the thin medium is arranged on top of the external frame, an inner groove is provided at inner bottom of the external frame, and the linear array photoelectric detector is arranged in the inner groove; and
the signal processing module is arranged at bottom of the external frame.

7. A method for non-contact detection of a thin medium, comprising:
step S 1 , obtaining time instants when target light, which is generated by reflecting light emitted by a light source via the thin medium, reaches a linear array photoelectric detector;
step S 2 , obtaining time instants when reference light, which is generated by reflecting the light emitted by the light source via a reference plane, reaches the linear array photoelectric detector;
step S 3 , calculating first optical distances of the target light according to a first formula Δ 1 =ct 1 ;
calculating second optical distances of the reference light according to a second formula Δ 2 =ct 2 ;
calculating a plurality of numbers of changes between the bright and dark fringes in the interference fringes according to a third formula

K
⁡

Assignees

• Grg Banking Equipment Co Ltd

Inventors

• Jin Xiaofeng
• Liu Jianping
• Liang Tiancai
• Gong Wenchuan

Classifications

• G07D7/12 Primary

  Visible light, infrared or ultraviolet radiation · CPC title

• G01N21/892 Primary

  characterised by the flaw, defect or object feature examined · CPC title

• G07D7/164

  Thickness · CPC title

• G01N21/94

  Investigating contamination, e.g. dust (G01N21/85 takes precedence) · CPC title

• G01N21/8806

  Specially adapted optical and illumination features · CPC title