Methods to control adhesiveness using topography

Patent metadata

Field	Value
Publication number	US-10101149-B1
Application number	US-201715485408-A
Country	US
Kind code	B1
Filing date	Apr 12, 2017
Priority date	Apr 12, 2017
Publication date	Oct 16, 2018
Grant date	Oct 16, 2018

Abstract

Methods and systems are disclosed for analyzing the adhesiveness of enamel frits using topography. One method includes analyzing a topography of a defined area of an enamel frit surface having a plurality of peaks and determining a topographical parameter of the defined area based on peak shape and/or density. The determined topographical parameter may be compared to a threshold value. The method may then include applying an adhesive to the enamel frit and bonding the enamel frit to a substrate if the determined topographical parameter is below the threshold value. The analysis of the topography may be performed using a non-contact profilometer, such as an optical profilometer. In one embodiment, the topographical parameter may be developed interfacial roughness (Sdr). The method may be integrated into a manufacturing/assembly line for vehicle glass components, such as windshields or side windows.

First claim

What is claimed is:

1. A method, comprising:
analyzing a topography of a defined area of an enamel fit surface having a plurality of peaks;
determining a topographical parameter of the defined area based on peak shape and/or density;
comparing the determined topographical parameter to a threshold value; and
applying an adhesive to the enamel frit and bonding the enamel frit to a substrate if the determined topographical parameter is below the threshold value.

2. The method of claim 1 , wherein the enamel fit surface has a primer coating thereon prior to determining the topographical parameter.

3. The method of claim 1 , wherein if the determined topographical parameter is below the threshold value, a primer is applied to the enamel fit prior to applying the adhesive.

4. The method of claim 1 , wherein the determined topographical parameter is developed interfacial roughness (S dr ).

5. The method of claim 4 , wherein the threshold value is 7% S dr .

6. The method of claim 4 , wherein the threshold value is 5% S dr .

7. The method of claim 1 , wherein analyzing the topography includes non-contact profilometry.

8. The method of claim 7 , wherein the non-contact profilometry includes optical profilometry.

9. The method of claim 1 , further comprising analyzing a topography of a plurality of defined areas, determining a topographical parameter of the defined areas, and comparing the determined topographical parameters of each defined area to a threshold value; and
applying an adhesive to the enamel frit and bonding the enamel frit to a substrate if the determined topographical parameter is below the threshold value for one or more of the defined areas.

10. The method of claim 9 , wherein the adhesive is applied if the determined topographical parameter is below the threshold value for a pre-determined percentage of the defined areas.

11. A system comprising:
a profilometer configured to analyze an enamel frit surface area having a plurality of peaks and generate topography data corresponding thereto;
a controller configured to analyze the topography data to determine a topographical parameter of the surface area based on peak shape and/or density; and
a robot configured to apply an adhesive to the enamel frit if the determined topographical parameter is below a threshold value.

12. The system of claim 11 , wherein the controller is further-configured to compare the determined topographical parameter to the threshold value.

13. The system of claim 11 , wherein the profilometer is a non-contact profilometer.

14. The system of claim 13 , wherein the profilometer is an optical profilometer.

15. The system of claim 11 , wherein the robot is further configured to bond a glass component having the enamel fit coated thereon to a vehicle frame via the adhesive.

16. The system of claim 11 , wherein the profilometer is configured to analyze a plurality of surface areas of the enamel frit and generate topography data corresponding thereto and the controller is configured to analyze the topography data to determine a topographical parameter of the surface areas based on peak shape and/or density and compare the determined topographical parameter of each surface area to a threshold value.

17. A method, comprising:
analyzing a topography of a defined area of an enamel frit surface having a plurality of peaks;
determining a topographical parameter of the defined area based on peak shape and/or density;
comparing the determined topographical parameter to a threshold value; and
applying a material to the enamel fit if the determined topographical parameter is below the threshold value.

18. The method of claim 17 , wherein the material applied to the enamel frit is an adhesive.

19. The method of claim 17 , wherein the material applied to the enamel frit is a polymer over-molding or encapsulation.

20. The method of claim 17 , wherein the determined topographical parameter is developed interfacial roughness (S dr ) and the threshold value is 7% S dr .

Assignees

• Ford Global Tech Llc

Inventors

• Haack Larry Paul
• Bollin Shannon Christine
• Straccia Ann Marie
• Peczonczyk Sabrina Louise
• Simko Steven J
• Konopka Patricia Karen

Classifications

• G01B11/30 Primary

  for measuring roughness or irregularity of surfaces · CPC title

• G01B5/0025

  Measuring of vehicle parts (G01B5/003 takes precedence) · CPC title

• C09J5/00

  Adhesive processes in general; Adhesive processes not provided for elsewhere, e.g. relating to primers · CPC title

• C03C27/00 Primary

  Joining pieces of glass to pieces of other inorganic material; Joining glass to glass other than by fusing (C03C17/00 takes precedence; layered structures comprising at least one glass sheet B32B17/00; wired glass C03B; joining glass to ceramics C04) · CPC title