Silicon-on-insulator substrate including trap-rich layer and methods for making thereof
US-2024297070-A1 · Sep 5, 2024 · US
US10094024B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10094024-B2 |
| Application number | US-201214127315-A |
| Country | US |
| Kind code | B2 |
| Filing date | May 31, 2012 |
| Priority date | Jun 24, 2011 |
| Publication date | Oct 9, 2018 |
| Grant date | Oct 9, 2018 |
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A method for forming a release layer which lies between a substrate and a supporting member and has a property that changes when the release layer absorbs light coming through the supporting member, by carrying out plasma CVD with a high-frequency power that is set so as to be higher than a power at which a mode jump occurs.
Opening claim text (preview).
What invention claimed is: 1. A method for producing a laminate, the laminate including (i) a substrate, (ii) a light-transmitting supporting member which supports the substrate and (iii) a release layer which lies between the substrate and the supporting member and has a property that changes when the release layer absorbs light coming through the supporting member, wherein the release layer absorbs 80% or more of light having a wavelength of 600 nm or less, wherein said method comprises forming the release layer by plasma CVD using a reactive gas containing a fluorocarbon gas as a main component; and wherein forming the release layer comprises carrying out the plasma CVD with a high-frequency power that is higher than a power at which a mode jump from E-mode plasma to H-mode plasma occurs. 2. The method according to claim 1 , wherein, in forming the release layer, the plasma CVD is carried out at a layer formation temperature of 300° C. or lower. 3. The method according to claim 1 , wherein, in forming the release layer, the plasma CVD is carried out in a reaction chamber made of ceramics. 4. A method for processing a substrate, comprising: producing the laminate by the method recited in claim 1 and thereafter; irradiating the supporting member-side of the release layer with light to thereby change the property of the release layer and thereafter; separating the supporting member from the substrate. 5. The method according to claim 1 , wherein the reactive gas contains a hydrocarbon gas as an additive gas. 6. A method for processing a substrate, comprising: producing the laminate by a method recited in claim 2 and thereafter; irradiating the supporting member-side of the release layer with light to thereby change the property of the release layer and thereafter; separating the supporting member from the substrate. 7. A method for processing a substrate, comprising: producing the laminate by a method recited in claim 3 and thereafter; irradiating the supporting member-side of the release layer with light to thereby change the property of the release layer and thereafter; separating the supporting member from the substrate.
the bond interface between the auxiliary support and the wafer comprising two or more, e.g. multilayer adhesive or adhesive and release layer · CPC title
used to protect an active side of a device or wafer · CPC title
of passive members, e.g. a chip mounting substrate · CPC title
used during dicing or grinding · CPC title
the auxiliary support including means facilitating the separation of a device or wafer from the auxiliary support · CPC title
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