Three-dimensional coordinate scanner and method of operation

Patent metadata

Field	Value
Publication number	US-10089415-B2
Application number	US-201414538840-A
Country	US
Kind code	B2
Filing date	Nov 12, 2014
Priority date	Dec 19, 2013
Publication date	Oct 2, 2018
Grant date	Oct 2, 2018

Abstract

A system and method of determining 3D coordinates of an object is provided. The method includes determining a first set of 3D coordinates for a plurality of points on the object with a structured light scanner. An inspection plan is determined for the object, which includes features to be inspected with a remote probe. The points are mapped onto a CAD model. The features are identified on the plurality of points mapped onto a CAD model. A visible light is projected with the scanner proximate a first feature of the features. A sensor is contacted on the remote probe to at least one first point on the first feature on the object. A first position and orientation of the remote probe are determined with the scanner. A second set of 3D coordinates of the at least one first point are determined on the first feature on the object.

First claim

The invention claimed is:

1. A method of determining three dimensional coordinates of an object, the method comprising: determining a first set of three dimensional coordinates for a plurality of points on the object with a scanner device, the scanner device being configured to emit and receive a structured light for determining the first set of three dimensional coordinates of points on a surface; accessing with a processor an inspection plan for the object, the inspection plan including a plurality of features to be inspected with a remote probe; mapping with the processor the plurality of points onto a computer aided design model; associating with the processor the plurality of features with the plurality of points mapped onto a computer aided design model; projecting a visible light with the scanner device proximate a first feature of the plurality of features; directly contacting a probe tip on the remote probe to at least one first point on the first feature on the object; determining a first position and orientation of the remote probe with the scanner device, the remote probe having a plurality of illuminated lights, the plurality of illuminated lights haring at least three non-collinear and non-coplanar illuminated lights; and determining with the scanner device a second set of three dimensional coordinates of the at least one first point on the first feature on the object;
scanning a machine readable symbol with the scanner device and automatically retrieving the inspection plan from memory based at least in part on the machine readable symbol.

2. The method of claim 1 wherein the inspection plan includes an order to inspect the plurality of features, the first feature of the plurality of features corresponding to a first feature to be inspected, a second feature of the plurality of features corresponding to a second feature to be inspected.

3. The method of claim 2 further comprising moving the projected light from the first feature to the second feature in response to determining the second set of three dimensional coordinates.

4. The method of claim 3 further comprising: contacting the sensor on the remote probe to at least on second point on the second feature on the object; determining with the scanner device a second position and orientation of the remote probe with the scanner device; and determining with the scanner device a third set of three dimensional coordinates of the at least one second point on the second feature on the object.

5. The method of claim 4 wherein the scanner device includes a projector having a light source, the projector configured to emit the structured light, the structured light including at least three non-collinear pattern elements, the scanning device further having an image sensor arranged to receive the structured light reflected from the surface.

6. The method of claim 5 wherein the step of determining the first set of three dimensional coordinates includes emitting a first structured light with the projector onto the object and receiving reflected first structured light from the object with the image sensor.

7. The method of claim 6 wherein the step of determining a first position and orientation of the remote probe includes emitting a second structured light onto the plurality of illuminated lights and receiving the second structured light reflected off of the plurality of illuminated lights with the image sensor.

8. The method of claim 1 wherein the plurality of illuminated lights are retroreflective targets.

9. A method of determining three dimensional coordinates of an object, the method comprising: providing a scanning device having a projector having a light source, the projector configured to emit a structured light onto the object, the structured light including at least three non-collinear pattern elements, the scanning device further having an image sensor arranged to receive the structured light reflected from the object; providing a movable remote probe having a touch sensor on one end and a plurality of illuminated lights disposed thereon, the plurality of illuminated lights having at least three non-collinear and non-coplanar illuminated lights, the remote probe being configured to transmit a signal in response to the touch sensor directly contacting the object; projecting a first structured light onto the object with the projector; receiving the first structured light reflected from the object with the image sensor; determining with the scanning device a first set of three dimensional coordinates from the first structured light reflected from the object; mapping with a processor the first set of three dimensional coordinates onto a computer aided design model of the object; associating at least one feature of the object with the first set of three dimensional coordinates mapped onto the computer aided design model of the object; retrieving with the processor an inspection plan for the object, the inspection plan including the at least one feature, wherein the step of associating the at least one feature includes determining the feature from the inspection plan; and projecting the visible light onto the object proximate a location of the at least one feature with the projector;
scanning a machine readable symbol with the scanner device and automatically retrieving the inspection plan from memory based at least in part on the machine readable symbol.

10. The method of claim 9 further comprising: contacting, the touch sensor to at least one point on the at least one feature; determining a position and orientation of the remote probe in response to receiving a second light with the image sensor that is projected by the projector and reflected from the plurality of illuminated lights; determining a second set of three dimensional coordinates for the at least one point from the position and orientation of the remote probe.

11. The method of claim 10 wherein the inspection plan includes a plurality of features and an order of inspection.

12. The method of claim 11 wherein the step of associating with the processor the at least one feature includes associating the plurality of features with the first set of three dimensional coordinates mapped onto the computer aided design model of the object.

13. The method of claim 12 further comprising projecting the light onto the object proximate each of the plurality of features, the visible light being projected to each of the plurality of features in the order of the inspection plan.

14. The method of claim 13 further comprising: contacting the touch sensor to at least one second point on each of the plurality of features; determining a second position and orientation of the remote probe in response to the touch sensor contacting the at least one second point and receiving a third structured light with the image sensor that is projected by the projector and reflected from the plurality of illuminated lights; and determining a third set of three dimensional coordinates for the at least one second point from the second position and orientation of the remote probe.

15. The method of claim 14 wherein the light moves to a next one of the plurality of features in response to determining the third set of three dimensional coordinates.

16. The method of claim 14 wherein the plurality of illuminated lights are retroreflective targets.

17. A noncontact optical three-dimensional measuring device comprising:
a projector having a light source, the projector configured to emit a structured light onto an object, the structured light including at least three non-collinear pattern elements;
an image se

Assignees

• Faro Tech Inc

Inventors

• Grau Markus

Classifications

• G01B5/004

  for measuring coordinates of points · CPC title

• G01B11/002

  for measuring two or more coordinates · CPC title

• G01B21/047

  Accessories, e.g. for positioning, for tool-setting, for measuring probes · CPC title

• G06F30/00 Primary

  Computer-aided design [CAD] · CPC title

• G06F17/50 Primary

  Physics · mapped topic