Linear noise reduction for a test and measurement system
US-2017292977-A1 · Oct 12, 2017 · US
US10075286B1 · US · B1
| Field | Value |
|---|---|
| Publication number | US-10075286-B1 |
| Application number | US-201715687364-A |
| Country | US |
| Kind code | B1 |
| Filing date | Aug 25, 2017 |
| Priority date | Mar 13, 2017 |
| Publication date | Sep 11, 2018 |
| Grant date | Sep 11, 2018 |
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Disclosed is a mechanism for limiting Intersymbol Interference (ISI) when measuring uncorrelated jitter in a test and measurement system. A waveform is obtained that describes a signal. Such waveform may be obtained from memory. A processor then extracts a signal pulse from the waveform. The processor selects a window function based on a shape of the signal pulse. Further, the processor applies the window function to the signal pulse to remove ISI outside a window of the window function while measuring waveform jitter. The window function may be applied by applying the window function to the signal pulse to obtain a target pulse. A linear equalizer is then generated that results in the target pulse when convolved with the signal pulse. The linear equalizer is then applied to the waveform to limit ISI for jitter measurement.
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I claim: 1. A test and measurement system comprising: an input port for receiving an input signal; a waveform memory for a waveform describing the input signal; and a processor coupled to the waveform memory, the processor configured to: extract a signal pulse from the waveform; select a window function based on a shape of the signal pulse; and apply the window function to the signal pulse to remove Intersymbol Interference (ISI) outside a window of the window function. 2. The test and measurement system of claim 1 , wherein the processor applies the window function to the signal pulse by: applying the window function to the signal pulse to obtain a target pulse; generating a linear equalizer that, when convolved with the signal pulse, results in the target pulse; and applying the linear equalizer to the waveform. 3. The test and measurement system of claim 2 , wherein the window function is applied to the signal pulse by employing point by point multiplication. 4. The test and measurement system of claim 2 , wherein the linear equalizer is generated according to: h original *h equalizer =h target , where h original denotes the signal pulse, h equalizer denotes the linear equalizer and h target denotes the target pulse. 5. The test and measurement system of claim 1 , wherein the signal pulse is extracted from the waveform by linear pulse extraction. 6. The test and measurement system of claim 1 , wherein the window function is assigned a length of three bit periods. 7. The test and measurement system of claim 1 , wherein the window function is selected as a Tukey window. 8. A method comprising: obtaining a waveform describing a signal from a memory; extracting, via a processor, a signal pulse from the waveform; selecting, by the processor, a window function based on a shape of the signal pulse; and applying, by the processor, the window function to the signal pulse to remove Intersymbol Interference (ISI) outside a window of the window function. 9. The method of claim 8 , wherein the window function is applied to the signal pulse by: applying the window function to the signal pulse to obtain a target pulse; generating a linear equalizer that, when convolved with the signal pulse, results in the target pulse; and applying the linear equalizer to the waveform. 10. The method of claim 9 , wherein the window function is applied to the signal pulse by employing point by point multiplication. 11. The method of claim 9 , wherein the linear equalizer is generated according to: h original *h equalizer =h target , where h original denotes the signal pulse, h equalizer denotes the linear equalizer and h target denotes the target pulse. 12. The method of claim 8 , wherein the signal pulse is extracted from the waveform by linear pulse extraction. 13. The method of claim 8 , wherein the window function is assigned a length of three bit periods. 14. The method of claim 8 , wherein the window function is selected as a Tukey window. 15. A non-transitory computer readable medium for storing a computer program product comprising instructions that, when executed by a processor of a test and measurement system, cause the test and measurement system to: obtain a waveform describing a signal from a memory; extract a signal pulse from the waveform; select a window function based on a shape of the signal pulse; and apply the window function to the signal pulse to remove Intersymbol Interference (ISI) outside a window of the window function. 16. The non-transitory computer readable medium of claim 15 , wherein the window function is applied to the signal pulse by: applying the window function to the signal pulse to obtain a target pulse; generating a linear equalizer that, when convolved with the signal pulse, results in the target pulse; and applying the linear equalizer to the waveform. 17. The non-transitory computer readable medium of claim 16 , wherein the window function is applied to the signal pulse by employing point by point multiplication. 18. The non-transitory computer readable medium of claim 16 , wherein the linear equalizer is generated according to: h original *h equalizer =h target , where h original denotes the signal pulse, h equalizer denotes the linear equalizer and h target denotes the target pulse. 19. The non-transitory computer readable medium of claim 15 , wherein the window function is assigned a length of three bit periods. 20. The non-transitory computer readable medium of claim 15 , wherein the window function is selected as a Tukey window.
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