On-chip terahertz thin-film devices
US-2024429627-A1 · Dec 26, 2024 · US
US10075207B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10075207-B2 |
| Application number | US-201615144193-A |
| Country | US |
| Kind code | B2 |
| Filing date | May 2, 2016 |
| Priority date | Apr 30, 2015 |
| Publication date | Sep 11, 2018 |
| Grant date | Sep 11, 2018 |
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An e-band transceiver includes a transmitter circuit and a receiver circuit. The transmitter circuit includes a surface mounted technology (SMT) module on which is mounted a silicon-germanium (SiGe) bipolar plus CMOS (BiCMOS) converter, a gallium arsenide (GaAs) pseudomorphic high-electron-mobility transistor (pHEMT) output amplifier coupled to the SiGe BiCMOS converter, and a microstrip/waveguide interface coupled to the GaAs pHEMT output amplifier. The receiver circuit of the e-band transceiver includes a receiver-side SMT module on which is mounted a receiver-side SiGe BiCMOS converter, a GaAs pHEMT low noise amplifier coupled to the receiver-side SiGe BiCMOS converter, and a receiver-side microstrip/waveguide interface coupled to the receiver-side GaAs pHEMT low noise amplifier.
Opening claim text (preview).
What is claimed is: 1. An e-band transceiver comprising a transmitter circuit and a receiver circuit, wherein the transmitter circuit comprises: a surface mounted technology (SMT) module including: a silicon-germanium (SiGe) bipolar plus CMOS (BiCMOS) converter, a gallium arsenide (GaAs) pseudomorphic high-electron-mobility transistor (pHEMT) output amplifier coupled to the SiGe BiCMOS converter, and a microstrip/waveguide interface coupled to the GaAs pHEMT output amplifier; and a non-volatile memory configured to store calibration data, wherein said calibration data (i) allows a chip by chip calibration and (ii) avoids a calibration rejection procedure. 2. The e-band transceiver of claim 1 , wherein the SiGe BiCMOS converter further comprises a digital interface. 3. The e-band transceiver of claim 2 , wherein the digital interface is configured as a digital control interface for controlling one of bias, type of channel filters and output power levels of the SMT module. 4. The e-band transceiver of claim 3 , wherein the digital control interface is configured as one of an I 2 C or SPI interface. 5. The e-band transceiver of claim 2 , wherein the digital interface is coupled to a non-volatile memory. 6. The e-band transceiver of claim 1 , wherein the SMT module is a system-in-package chip. 7. The e-band transceiver of claim 1 , wherein the receiver circuit comprises: a receiver-side SMT module including: a receiver-side SiGe BiCMOS converter, a GaAs pHEMT low noise amplifier coupled to the receiver-side SiGe BiCMOS converter, and a receiver-side microstrip/waveguide interface coupled to the receiver-side GaAs pHEMT low noise amplifier. 8. The e-band transceiver according to claim 1 , wherein said calibration comprises accounting for mixer bias for full rejection of local oscillator leakage. 9. The e-band transceiver according to claim 1 , wherein said calibration is performed during a package production test phase. 10. The e-band transceiver according to claim 1 , wherein said calibration compensates for process variations of the GaAs output amplifier. 11. The apparatus according to claim 1 , wherein said amplifier is configured to provide higher power levels and higher linearity on a transmitter side.
Combinations of FETs or IGBTs with BJTs · CPC title
for HF amplifiers · CPC title
Waveguides, e.g. strip lines · CPC title
Package configurations · CPC title
at high-frequency [HF] or radio frequency [RF] · CPC title
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