Transmitter noise in system budget

Patent metadata

Field	Value
Publication number	US-10069606-B2
Application number	US-201715820183-A
Country	US
Kind code	B2
Filing date	Nov 21, 2017
Priority date	Jul 12, 2013
Publication date	Sep 4, 2018
Grant date	Sep 4, 2018

Abstract

One embodiment provides an apparatus. The example apparatus includes a root mean square (RMS) distortion determination module configured to determine an RMS distortion error and a signal to noise and distortion ratio (SNDR), the RMS distortion error determined based, at least in part, on a portion of a transmitted pulse centered at or near a transmitted pulse maximum amplitude and the SNDR determined based, at least in part, on the RMS distortion error.

First claim

What is claimed is:

1. A system to determine transmitter noise, the system comprising:
network interface circuitry to transmit at least one signal; and
measurement circuitry coupled to the network interface circuitry, the measurement circuitry to:
capture at least a portion of the transmitted at least one signal;
determine a linear fit to a pulse response based on the portion of the signal;
determine a standard deviation of an error between the pulse response and the linear fit to the pulse response; and
determine at least one value indicative of a signal to noise and distortion ratio (SNDR) based, at least in part, on the determined standard deviation of the error.

2. The system of claim 1 , wherein the at least one signal comprises at least one defined test signal.

3. The system of claim 2 , wherein the at least one defined test signal includes at least one pulse.

4. The system of claim 3 , wherein the at least one defined test signal includes at least a four-level pulse amplitude modulated (PAM-4) test signal.

5. The system of claim 4 , wherein the pulse amplitude modulated test signal consists of four different voltage amplitudes (V A , V B , V C , V D ).

6. The system of claim 5 , wherein the pulse amplitude modulated test signal consists of a repeated two-bit sequence.

7. The system of claim 5 , wherein the measurement circuitry includes static determination circuitry to determine a DC offset according to the following:

V
avg

=

V
A

+

V
B

+

V
C

+

V
D

4

.

8. The system of claim 7 , wherein the static determination circuitry is further to determine a first normalized effective mid-level voltage according to the following:

V
1

=

V
B

-

V
avg

V
A

-

V
avg

.

9. The system of claim 7 , wherein the static determination circuitry is further to determine a second normalized effective mid-level voltage according to the following:

V
2

=

V
C

-

V
avg

V
D

-

V
avg

.

10. The system of claim 5 , wherein the measurement circuitry includes static determination circuitry to determine a minimum static level differential according to the following:

S
min

=

min
⁡

(

V
D

-

V
C

,

V
C

-

V
B

,

V
B

-

V
A

)

2

.

11. The system of claim 10 , wherein the static determination circuitry is further to determine a level mismatch ratio according to the following:

R
LM

=

6
*

S
min

V
D

-

V
A

.

12. The system of claim 10 , wherein the at least one value indicative of the SNDR is based, at least in part, on the minimum static level differential.

13. An apparatus, comprising:
a system budget module to:
select at least one test signal that includes a pulse amplitude modulated test signal that includes a plurality of pulse amplitudes (PAM-x); and
capture at least a portion of the test signal; and

a root-mean-square (RMS) distortion determination module to:
determine a linear fit to a pulse response based on the portion of the test signal;
determine a standard deviation of an error between the pulse response and the linear fit to the pulse response; and
determine at least one value indicative of a signal to noise and distortion ratio (SNDR) based, at least in part, on the determined standard deviation of the error.

14. The apparatus of claim 13 , wherein the PAM-x test signal includes a plurality of pulse amplitudes that produce a defined bit s

Assignees

• Intel Corp

Inventors

• Ran Adee O
• Lusted Kent C

Classifications

• H04L1/248 Primary

  Distortion measuring systems (measurement of non-linear distortion G01R23/20; measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time, duration G01R29/02) · CPC title

• H04L1/244

  test sequence generators · CPC title

• H04L1/203 Primary

  Details of error rate determination, e.g. BER, FER or WER · CPC title