Detecting deterioration of an electrical circuit in an aggressive environment

Patent metadata

Field	Value
Publication number	US-10067179-B2
Application number	US-201615251133-A
Country	US
Kind code	B2
Filing date	Aug 30, 2016
Priority date	Aug 30, 2016
Publication date	Sep 4, 2018
Grant date	Sep 4, 2018

Abstract

We disclose a circuit board that hosts at least first and second types of resistance sensors. The resistance of each sensor of the first type tends to increase, and the resistance of each sensor of the second type tends to decrease if the sensor is exposed to an aggressive environment. The circuit board also hosts a control circuit that operates to monitor respective resistances of the various resistance sensors and to process the digital values representing the resistances to estimate the working condition of one or more other electrical circuits located on the circuit board and/or in relatively close proximity to the circuit board in the corresponding equipment cabinet. The control circuit further operates to transmit out an appropriate alarm message if the estimated working condition is deemed unsatisfactory.

First claim

What is claimed is:

1. An apparatus comprising:
a substrate;
a first resistive sensor having an electrically conductive trace that comprises a first metal or metallic alloy, the electrically conductive trace being disposed on the substrate to electrically connect a first terminal and a second terminal and having an electrical resistance that changes in response to damage caused by environmental exposure;
a second resistive sensor having an electrically conductive trace that comprises a second metal or metallic alloy, the second metal or metallic alloy being different from the first metal or metallic alloy, the electrically conductive trace of the second sensor being disposed on the substrate to electrically connect a third terminal and a fourth terminal and having an electrical resistance that changes in response to damage caused by the environmental exposure;
a third resistive sensor having a first resistive element in electrical contact with a fifth terminal and a second resistive element in electrical contact with a sixth terminal, the first and second resistive elements being arranged on the substrate such that insulation resistance between the first and second resistive elements changes in response to damage caused by the envrionmental exposure; and
a control circuit supported on the substrate and being configured to measure electrical resistances between the first and second terminals, the third and fourth terminals, and the fifth and sixth terminals, respectively.

2. The apparatus of claim 1 , wherein the control circuit is configured to predict whether a different circuit device on the substrate is likely to break down or be broken based on the measured electrical resistances.

3. The apparatus of claim 1 , further comprising a fourth resistive sensor having a third resistive element in electrical contact with a seventh terminal and a fourth resistive element in electrical contact with an eighth terminal, the third and fourth resistive elements being arranged on the substrate such that insulation resistance between the third and fourth resistive elements changes in response to damage caused by the environmental exposure; and
wherein the control circuit is further configured to measure electrical resistance between the seventh and eighth terminals.

4. The apparatus of claim 3 , wherein:
at least one of the first and second resistive elements comprises the first metal or metallic alloy; and
at least one of the third and fourth resistive elements comprises the second metal or metallic alloy.

5. The apparatus of claim 1 , wherein at least one of the first and second resistive elements comprises the third metal or metallic alloy that is different from the first metal or metallic alloy and the second metal or metallic alloy.

6. The apparatus of claim 1 , wherein the control circuit is configured to:
process digital values representing the electrical resistances to determine whether or not any of a plurality of fixed conditions is satisfied; and
generate an alarm message if one or more of the plurality of fixed conditions are satisfied.

7. The apparatus of claim 6 , wherein the control circuit is further configured to transmit the alarm message to an external electronic controller.

8. The apparatus of claim 7 , wherein the control circuit is further configured to generate the alarm message in a manner that causes the alarm message to specify which one or more of the plurality of fixed conditions are satisfied.

9. The apparatus of claim 7 , wherein the control circuit is further configured to generate the alarm message if one or more of the following fixed conditions are satisfied:
(i) at least one of the electrical resistances falls into a range bounded by one or more respective threshold resistance values;
(ii) a rate of resistance change for any sensor is greater than a respective threshold rate; and
(iii) a circuit-health indicator computed using the electrical resistances is smaller than a threshold indicator value.

10. The apparatus of claim 6 , further comprising an integrated-circuit package supported on the substrate; and
wherein the control circuit is further configured to generate the alarm message using the plurality of fixed conditions that include at least one condition designed to provide an estimate of a degree of damage to the integrated-circuit package caused by the environmental exposure.

11. The apparatus of claim 1 , wherein:
the first metal or metallic alloy comprises one or both of copper and silver; and
the second metal or metallic alloy comprises one or both of copper and tin.

12. The apparatus of claim 1 , wherein:
the electrical resistance between the first and second terminals is in the range between 0.1Ω and 10 Ω;
the electrical resistance between the third and fourth terminals is in the range between 0.1Ω and 10Ω; and
the electrical resistance between the fifth and sixth terminals is greater than 10 MΩ.

13. The apparatus of claim 1 , wherein:
the electrical resistance between the first and second terminals increases in response to the damage;
the electrical resistance between the third and fourth terminals increases in response to the damage; and
the electrical resistance between the fifth and sixth terminals decreases in response to the damage.

14. An apparatus comprising:
a substrate;
a first plurality of sensors supported on the substrate, each sensor of the first plurality characterized by a respective resistance that increases in response to the sensor being damaged by environmental exposure;
a second plurality of sensors supported on the substrate, each sensor of the second plurality characterized by a respective resistance decreases in response to the sensor being damaged by the environmental exposure; and
a control circuit supported on the substrate, electrically connected to each of the first plurality of sensors and each of the second plurality of sensors, and configured to determine the respective resistances of the first plurality of sensors and the second plurality of sensors.

15. The apparatus of claim 14 , wherein the first plurality comprises:
a first sensor comprising an electrically conductive trace that comprises a first metal or metallic alloy; and
a second sensor comprising an electrically conductive trace that comprises a different second metal or metallic alloy.

16. The apparatus of claim 15 , wherein the second plurality comprises:
a third sensor comprising an electrically conductive trace that comprises the first metal or metallic alloy; and
a fourth sensor comprising an electrically conductive trace that comprises the different second metal or metallic alloy.

17. The apparatus of claim 14 ,
wherein a sensor of the first plurality comprises a plurality of electrically conductive traces that are connected in parallel to one another between a first contact pad and a second contact pad; and
wherein the first contact pad and the second contact pad are electrically connected to the control circuit by way of respective conductive tracks supported on the substrate.

18. The apparatus of claim 14 ,
wherein a sensor of the second plurality comprises:
a first electrically conducting comb electrically connected to a first contact pad; and
a second electrically conducting comb electrically connected to a second contact pad;

wherein the first and second electrically conducting combs are configured to have teeth of the first electrically conducting comb interleaved with teeth of the second electrically conducting comb; and
wherein the first contact pad and the s

Assignees

• Alcatel Lucent Usa Inc
• Nokia America Corp

Inventors

• Xu Chen

Classifications

• G01R31/2836

  Fault-finding or characterising (G01R31/2822 - G01R31/2831 take precedence) · CPC title

• G01R31/2856 Primary

  Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM] · CPC title

• G01R31/2812 Primary

  Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance (of connections G01R31/66) · CPC title