Terahertz device module

US10066984B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10066984-B2
Application numberUS-201715808051-A
CountryUS
Kind codeB2
Filing dateNov 9, 2017
Priority dateMay 12, 2015
Publication dateSep 4, 2018
Grant dateSep 4, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

The THz device module includes: a substrate; a THz device disposed on a front side surface of the substrate, and configured to oscillate or detect THz waves; a cap covering the THz device being separated from the THz device, and comprising an opening formed at a position opposite to the THz device in a vertical direction of the front side surface of the substrate; and a sealing member covering the opening of the cap so as to seal the THz device in conjunction with the substrate and the cap. A distance from the THz device to the sealing member is within a near-field pattern to which an electric field of the THz waves can be reached without interruption from a surface of the THz device to the sealing member. The THz device module efficiently emits or detects THz waves from the opening, thereby suppressing upsizing of the cap.

First claim

Opening claim text (preview).

What is claimed is: 1. A terahertz device module comprising: a substrate; a terahertz device disposed on a front side surface of the substrate, the terahertz device configured to oscillate or detect terahertz waves; a cap configured to cover the terahertz device so as to be separated from the terahertz device, the cap comprising an opening formed at a position opposite to the terahertz device in a vertical direction of the front side surface of the substrate; and a sealing member configured to cover the opening of the cap so as to seal the terahertz device in conjunction with the substrate and the cap, wherein a distance from the terahertz device to the sealing member is within a near-field pattern to which an electric field of the terahertz waves can be reached without interruption from a surface of the terahertz device to the sealing member. 2. The terahertz device module according to claim 1 , wherein a width of the opening is formed so as to be equal to 1 wavelength of the terahertz waves. 3. The terahertz device module according to claim 1 , wherein the distance from the terahertz device to the sealing member is shorter than a half wavelength of the terahertz waves. 4. The terahertz device module according to claim 1 , wherein a diameter of the opening is within a range of 0.1 time to several times as long as a wavelength of the terahertz waves emitted or detected from the opening. 5. The terahertz device module according to claim 1 , further comprising: a submount disposed on the substrate, the submount configured to mount the terahertz device, wherein a height of the submount is within a range of 0.2 time to 1.5 times as long as a wavelength of the terahertz waves emitted or detected from the opening. 6. The terahertz device module according to claim 1 , wherein the sealing member comprises a substrate selected from the group of consisting of a glass substrate and a silicon substrate. 7. The terahertz device module according to claim 1 , wherein the electric field resonates in a plane of the cap including the opening. 8. The terahertz device module according to claim 1 , wherein the terahertz device has a surface light-emission radiating pattern or a surface light-receiving pattern. 9. The terahertz device module according to claim 1 , wherein the terahertz device comprises: a semiconductor substrate; a first semiconductor layer disposed on the semiconductor substrate; an active element formed by being laminated on the first semiconductor layer; a second electrode connected to the first semiconductor layer so as to be connected to one side of a main electrode of the active element, the second electrode disposed on the semiconductor substrate; and a first electrode connected to another side of the main electrode of the active element, the first electrode disposed on the semiconductor substrate so as to be opposite to the second electrode, wherein the active element forms a resonator between the second electrode and the first electrode, wherein electromagnetic waves are reflected on the substrate, and the electromagnetic waves have a surface light-emission radiating pattern or surface light-receiving pattern in a vertical direction with respect to the semiconductor substrate. 10. The terahertz device module according to claim 9 , wherein the first electrode and the second electrode comprise a dipole antenna. 11. The terahertz device module according to claim 10 , further comprising: a first feed electrode line and a second feed electrode line each which is connected to the dipole antenna; and a first pad electrode and a second pad electrode respectively connected to the first feed electrode line and the second feed electrode line. 12. The terahertz device module according to claim 11 , further comprising an MIM reflector connected between the first pad electrode and the second pad electrode. 13. The terahertz device module according to claim 9 , further comprising a resistance element connected between the first electrode and the second electrode. 14. The terahertz device module according to claim 13 , wherein the resistance element comprises metallic wiring. 15. The terahertz device module according to claim 14 , wherein the metallic wiring comprises one selected from the group consisting of Bi, Ni, Ti, and Pt. 16. The terahertz device module according to claim 9 , wherein the active element is arranged as multichip implementation. 17. The terahertz device module according to claim 16 , wherein the active element is arranged as cell array implementation. 18. The terahertz device module according to claim 9 , wherein the active element comprises one selected from the group consisting of a resonant tunneling diode, a TUNNETT diode, an IMPATT diode, a GaAs based field-effect transistor, a GaN based FET, a high electron mobility transistor, a hetero-junction bipolar transistor, and CMOSFET.

Assignees

Inventors

Classifications

  • Restricting the angle of incident light · CPC title

  • G01J1/0271Primary

    Housings; Attachments or accessories for photometers · CPC title

  • dedicated to Terahertz frequencies · CPC title

  • Monolithic · CPC title

  • Sealings; Vacuum enclosures; Encapsulated packages; Wafer bonding structures; Getter arrangements (getter arrangements per se H10W76/48, H10P36/03) · CPC title

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What does patent US10066984B2 cover?
The THz device module includes: a substrate; a THz device disposed on a front side surface of the substrate, and configured to oscillate or detect THz waves; a cap covering the THz device being separated from the THz device, and comprising an opening formed at a position opposite to the THz device in a vertical direction of the front side surface of the substrate; and a sealing member covering …
Who is the assignee on this patent?
Rohm Co Ltd
What technology area does this patent fall under?
Primary CPC classification G01J1/0271. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Sep 04 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).