Spectrometer, and spectrometer production method

US10060792B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10060792-B2
Application numberUS-201515116893-A
CountryUS
Kind codeB2
Filing dateFeb 3, 2015
Priority dateFeb 5, 2014
Publication dateAug 28, 2018
Grant dateAug 28, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A spectrometer includes a light detection element provided with a light passing part, a first light detection part, and a second light detection part, a support fixed to the light detection element such that a space is formed, a first reflection part provided in the support and configured to reflect light passing through the light passing part in the space, a second reflection part provided in the light detection element and configured to reflect the light reflected by the first reflection part in the space, and a dispersive part provided in the support and configured to disperse and reflect the light reflected by the second reflection part to the first light detection part in the space. A plurality of second light detection parts is disposed in a region surrounding the second reflection part.

First claim

Opening claim text (preview).

The invention claimed is: 1. A spectrometer comprising: a light detection element provided with a light passing part, a first light detection part, and a plurality of second light detection parts; a support fixed to the light detection element such that a space is formed among the light passing part, the first light detection part, and the plurality of second light detection parts; a first optical part provided in the support and configured to reflect light passing through the light passing part in the space; a second optical part provided in the light detection element and configured to reflect the light reflected by the first optical part in the space; and a third optical part provided in the support and configured to reflect the light reflected by the second optical part to the first light detection part in the space, the second optical part or the third optical part disperses and reflects entered light in the space, and the plurality of second light detection parts is disposed in a region surrounding the second optical part. 2. The spectrometer according to claim 1 , wherein the first optical pall is a first reflection part and configured to reflect the light passing through the light passing part in the space, the second optical part is a second reflection part and configured to reflect the light reflected by the first reflection part in the space, and the third optical part is a dispersive part and configured to disperse and reflect the light reflected by the second reflection part to the first light detection part in the space. 3. The spectrometer according to claim 1 , wherein the first optical part is a first reflection part and configured to reflect the light passing through the light passing part in the space, the second optical part is a dispersive part and configured to disperse and reflect the light reflected by the first reflection part in the space, and the third optical part is a second reflection part and configured to reflect the light dispersed and reflected by the dispersive part to the first light detection part in the space. 4. The spectrometer according to claim 1 , wherein the light passing part, the first optical part, the second optical part, the third optical part, and the first light detection part are arranged along a reference line when viewed in an optical axis direction of the light passing through the light passing part, and the plurality of second light detection parts opposes each other with the second optical part interposed therebetween in each of a direction parallel to the reference line and a direction perpendicular to the reference line when viewed in the optical axis direction. 5. The spectrometer according to claim 1 , wherein the plurality of second light detection parts is arranged along an outer edge of the second optical part to surround the second optical part. 6. The spectrometer according to claim 1 , wherein the plurality of second, light detection parts is arranged in a two-dimensional shape in the region surrounding the second optical part. 7. The spectrometer according to claim 1 , wherein the support is provided with a wiring electrically connected to the first light detection part and the plurality of second light detection parts, and an end part of the wiring on a side of the first light detection part and the plurality of second light detection parts is connected to a terminal provided in the light detection element in a fixed part of the light detection element and the support. 8. The spectrometer according to claim 1 , wherein a material of the support is ceramic. 9. The spectrometer according to claim 1 , wherein the space is airtightly scaled by a package including the light detection element and the support as components. 10. The spectrometer according to claim 1 , wherein the space is airtightly sealed by a package accommodating the light detection element and the support.

Assignees

Inventors

Classifications

  • G01J3/021Primary

    using plane or convex mirrors, parallel phase plates, or particular reflectors · CPC title

  • Field-of-view determination; Aiming or pointing of a spectrometer; Adjusting alignment; Encoding angular position; Size of measurement area; Position tracking · CPC title

  • Investigating two or more bands of a spectrum by separate detectors · CPC title

  • G01J3/0256Primary

    Compact construction · CPC title

  • Slit arrangements {slit adjustment} · CPC title

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Frequently asked questions

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What does patent US10060792B2 cover?
A spectrometer includes a light detection element provided with a light passing part, a first light detection part, and a second light detection part, a support fixed to the light detection element such that a space is formed, a first reflection part provided in the support and configured to reflect light passing through the light passing part in the space, a second reflection part provided in …
Who is the assignee on this patent?
Hamamatsu Photonics Kk
What technology area does this patent fall under?
Primary CPC classification G01J3/021. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Aug 28 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).