Metal oxide field effect transistors on a mechanically flexible polymer substrate having a die-lectric that can be processed from solution at low temperatures
US-9263591-B2 · Feb 16, 2016 · US
US10060033B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10060033-B2 |
| Application number | US-201414915330-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 4, 2014 |
| Priority date | Sep 3, 2013 |
| Publication date | Aug 28, 2018 |
| Grant date | Aug 28, 2018 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
The present invention relates to novel precursors in the form of metal complexes with 2-substituted 1,3-diketones and to a process for the preparation thereof. The invention furthermore relates to the use thereof for the production of thin metal-oxide layers. The latter are constituents in a very wide variety of electronic components and devices having various functions.
Opening claim text (preview).
The invention claimed is: 1. A process for preparing a thin metal-oxide layer, dissolving or dispersing one or more metal complex(es) according to formula (I) or a metal-complex cluster thereof in a solvent or solvent mixture M l [R 1 —CO—C(H) m X—CO—R 2 ] n , (I) in which M denotes a metal atom selected from zinc, indium, gallium, tin, aluminum, zirconium, titanium and hafnium, l denotes 1 or 2, m denotes 0 or 1, n denotes 1, 2, 3 or 4, R 1 and R 2 , independently of one another, denote alkyl having 1 to 8 C atoms, cycloalkyl having 3 to 7 C atoms, alkoxy having 1 to 8 C atoms and/or amino, NHR 3 or NR 3 R 4 , where R 3 and R 4 , independently of one another, denote alkyl having 1 to 8 C atoms or cycloalkyl having 3 to 7 C atoms, and X denotes hydroxyimino, nitro, sulfo, —SO 2 -alkyl having 1 to 8 C atoms, phosphato, —PO(O—R*) 2 where R* is alkyl having 1 to 8 C atoms or alkoxy having 1 to 8 C atoms, —SnR** 3 where R** is alkyl having 1 to 8 C atoms; —SR*** where R*** is H, alkyl having 1 to 8 C atoms or cycloalkyl having 3 to 7 C atoms, halide, or pseudohalide; optionally adding to the solution or dispersion obtained liquefiers, stabilizers, binders and/or antifoams, applying the solution or dispersion obtained by wet coating to a substrate surface to be coated to form a layer, drying the applied layer and converting the applied layer into a metal oxide in the form of a thin layer by heating and calcination at a temperature in the range of 150-350° C. 2. The process according to claim 1 , wherein said solution or dispersion comprises a solvent selected from methoxyethanol, dimethylformamide and dimethoxyethane, in pure form or in a mixture, optionally in the presence of water. 3. The process according to claim 1 , wherein said solution or dispersion is applied to the substrate surface by spin coating, dip coating, spray coating, ink-jet printing, flexographic printing or gravure printing. 4. The process according to claim 1 , wherein thin oxide layers of the metals zinc, indium, gallium, tin, aluminum, zirconium, titanium and/or hafnium are produced in which oxides are present in pure form or in a mixture, or as mixed oxides. 5. The process according to claim 1 , wherein said solution or dispersion is applied a plurality of times to the substrate surface before the heating and calcination, with each layer is dried and heated individually. 6. A process according to claim 1 , wherein the conversion of the applied layer into a metal oxide in the form of a thin layer is performed in by UV or IR irradiation. 7. A process according to claim 1 , wherein the conversion of the applied layer into a metal oxide in the form of a thin layer is performed in by laser irradiation. 8. A process according to claim 1 , wherein X is —SO 2 -alkyl having 1 to 8 C atoms, —PO(O—R*) 2 where R* is alkyl having 1 to 8 C atoms or alkoxy having 1 to 8 C atoms, —SnR** 3 where R** is alkyl having 1 to 8 C atoms, —SR*** where R*** is H, alkyl having 1 to 8 C atoms or cycloalkyl having 3 to 7 C atoms, F, Cl, Br, I, —CN, —N 3 , —OCN, —NCO, —CNO, —SCN or —SeCN. 9. The process according to claim 1 , wherein conversion of the applied, dried metal-complex layer is carried out by heating and calcination at temperatures in the range from 250-350° C. 10. A process according to claim 1 , wherein the conversion of the applied layer into a metal oxide in the form of a thin layer is performed in by heating in an oven or on a hotplate. 11. The process according to claim 1 , wherein the metal complex of formula (I) is a zinc complex with nitrodimethyl malonate, a zinc complex with hydroxyiminodimethyl malonate, a zinc complex with nitromalonic acid diamide, a tin(II) complex with nitrodimethyl malonate, an indium complex with nitrodimethyl malonate, a zirconium complex with hydroxyiminodimethyl malonate, or a zirconium complex with nitrodimethyl malonate.
being oxide semiconductor materials (Group IIB-VIA semiconductor materials H10P14/3424) · CPC title
Oxides · CPC title
using solutions · CPC title
Electrolytic deposition, i.e. electroplating; Electroless plating · CPC title
characterised by treatments done after the formation of the materials · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.