Joint estimation of coefficients for skew, gain imbalance and channel response for signal sources

US10057020B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10057020-B2
Application numberUS-201615268981-A
CountryUS
Kind codeB2
Filing dateSep 19, 2016
Priority dateNov 19, 2015
Publication dateAug 21, 2018
Grant dateAug 21, 2018

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Abstract

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A method of characterizing a test system includes generating a multi-tone stimulus signal, producing at least one pair of baseband signals form the multi-tone stimulus signal, capturing the at least one pair of baseband signals with a test instrument, characterizing the at least one pair of baseband signals to generate pre-compensation coefficients, and applying the pre-compensation coefficients to signals applied to a device under test.

First claim

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What is claimed is: 1. A test and measurement system, comprising: a signal creation tool to generate a complex-valued stimulus signal; at least one waveform generator to receive the stimulus signal and produce at least one pair of baseband signals; a test instrument to capture the at least one pair of baseband signals and produce captured baseband signals; a pre-compensation coefficients estimation block to receive the at least one pair of captured baseband signals, characterize the at least one pair of captured baseband signals and generate pre-compensation coefficients, wherein to characterize the at least one pair of captured baseband signals comprises estimating a skew between each of the signals in each of the at least one pair of baseband signals by cross correlating a pair of reference signals with the at least one pair of baseband signals; and a pre-compensation block to apply the pre-compensation coefficients to the complex-valued stimulus signal to be applied to a device under test. 2. The test and measurement system of claim 1 , wherein the pre-compensation block resides in one of either the waveform generator or the test instrument. 3. The test and measurement system of claim 1 , wherein the signal creation tool resides in one of either the waveform generator or the test instrument. 4. The test and measurement system of claim 1 , wherein the pre-compensation coefficients estimation block resides in one of either the waveform generator or the test instrument. 5. The test and measurement system of claim 1 , wherein the test instrument is structured to re-sample the baseband signals to obtain integer samples. 6. The test and measurement system of claim 1 , wherein the at least one waveform generator comprises one waveform generator with two channels for each pair of baseband signals present in the system. 7. The test and measurement system of claim 1 , wherein the at least one waveform generator comprises one waveform generator for each baseband signal in each pair of baseband signals. 8. A method of characterizing a test system, comprising: generating a multi-tone stimulus signal; producing at least one pair of baseband signals form the multi-tone stimulus signal; capturing the at least one pair of baseband signals with a test instrument; characterizing the at least one pair of baseband signals to generate pre-compensation coefficients, wherein characterizing the at least one pair of baseband signals comprises estimating a skew between each of the signals in each of the at least one pair of baseband signals by cross correlating a pair of reference signals with the at least one pair of baseband signals; and applying the pre-compensation coefficients to signals applied to a device under test. 9. The method of claim 8 , wherein capturing the at least one pair of baseband signals comprises sampling the pair of baseband signals. 10. The method of claim 9 , further comprising adjusting a sampling rate to capture the at least one pair of baseband signals to obtain integer samples. 11. The method of claim 8 , wherein characterizing the at least one pair of baseband signals also comprises estimating a gain imbalance between each of the signals in each of the at least one pair of baseband of baseband signals. 12. The method of claim 11 , wherein estimating a gain imbalance between each of the signals comprises comparing a gain ratio of a pair of reference signals to the at least one pair of baseband signals. 13. The method of claim 8 , wherein characterizing the at least one pair of baseband signals also comprises determining a frequency response of the signals. 14. The method of claim of 13 , wherein determining a frequency response of the signals comprises: applying a time domain window to a skew adjusted, gain balanced, input signal to produce a time-windowed version of the input signal; performing a Fast Fourier Transform on the time-windowed version of the input signal to generate a frequency response; and taking an inverse of the frequency response to obtain pre-compensation coefficients.

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Classifications

  • Allocation of pilot signals, i.e. of signals known to the receiver (allocation of control signalling H04L5/0053; use of control signalling H04L5/0091) · CPC title

  • H04L1/205Primary

    jitter monitoring · CPC title

  • test sequence generators · CPC title

  • using code conversion at the transmitter; using predistortion; using insertion of idle bits for obtaining a desired frequency spectrum; using three or more amplitude levels {; Baseband coding techniques specific to data transmission systems (spectral shaping H04L25/03828)} · CPC title

  • Fourier transform demodulators, e.g. fast Fourier transform [FFT] or discrete Fourier transform [DFT] demodulators (H04L27/26524 takes precedence) · CPC title

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What does patent US10057020B2 cover?
A method of characterizing a test system includes generating a multi-tone stimulus signal, producing at least one pair of baseband signals form the multi-tone stimulus signal, capturing the at least one pair of baseband signals with a test instrument, characterizing the at least one pair of baseband signals to generate pre-compensation coefficients, and applying the pre-compensation coefficient…
Who is the assignee on this patent?
Tektronix Inc
What technology area does this patent fall under?
Primary CPC classification H04L1/205. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Aug 21 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).