Capacitively coupled electrodeless plasma apparatus and a method using capacitively coupled electrodeless plasma for processing a silicon substrate
US-2015372167-A1 · Dec 24, 2015 · US
US10056510B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10056510-B2 |
| Application number | US-201514728658-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 2, 2015 |
| Priority date | May 10, 2012 |
| Publication date | Aug 21, 2018 |
| Grant date | Aug 21, 2018 |
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A photovoltaic device includes a substrate having a plurality of hole shapes formed therein. The plurality of hole shapes each have a hole opening extending from a first surface and narrowing with depth into the substrate. The plurality of hole shapes form a hole pattern on the first surface, and the hole pattern includes flat areas separating the hole shapes on the first surface. A photovoltaic device stack is formed on the first surface and extends into the hole shapes. Methods are also provided.
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What is claimed is: 1. A method for fabricating a substrate for photovoltaic device applications, comprising: applying a resist on a first surface of the substrate of a photovoltaic device; lithographically exposing and developing the resist to create a pattern of cross-linked areas in the resist; depositing a metal on the pattern and on exposed portions of the substrate; removing the pattern of cross-linked areas in the resist by a lift-off process to leave the metal on the substrate in the exposed portions of the substrate; dry etching the substrate using the metal on the substrate as an etch mask to form a plurality of hole shapes in the substrate, the plurality of hole shapes each having a hole opening extending from a first surface of the substrate and narrowing with depth into the substrate, wherein each of the hole openings has a pitch which changes depending on a position of the hole opening on the substrate; removing the metal to expose flat areas separating the hole shapes on the first surface; and depositing a photovoltaic device stack on the substrate. 2. The method as recited in claim 1 , wherein dry etching includes tuning a reactive ion etch (RIE) to form a tapered structure in the hole openings. 3. The method as recited in claim 2 , wherein tuning includes regulating pressure between about 100 mTorr and about 300 mTorr and power between about 200 Watts to about 400 Watts. 4. The method as recited in claim 1 , wherein the plurality of hole shapes includes an opening dimension of 500 nm or greater. 5. The method as recited in claim 1 , wherein depositing a metal includes evaporative deposition of at least one of Aluminum or Chromium. 6. The method as recited in claim 1 , further comprising: forming a photovoltaic device stack on the substrate. 7. The method as recited in claim 6 , wherein forming the photovoltaic device stack on the substrate includes: forming a first conductive layer disposed on the substrate; forming a p-i-n or n-i-p stack disposed on the first conductive layer; and forming a second conductive layer formed on the p-i-n or n-i-p stack. 8. The method as recited in claim 1 , wherein the pitch increases as position from an origin point increases. 9. The method as recited in claim 1 , wherein the pitch alternately changes across the substrate between at least two pitch sizes. 10. A method for fabricating a photovoltaic device, comprising: applying a resist on a first surface of a substrate for the photovoltaic device; lithographically exposing and developing the resist to create a pattern of cross-linked areas in the resist; depositing a metal on the pattern and on exposed portions of the substrate; removing the pattern of cross-linked areas in the resist by a lift-off process to leave the metal on the substrate in the exposed portions of the substrate; dry etching the substrate using the metal on the substrate as an etch mask to form a plurality of hole shapes in the substrate, the plurality of hole shapes each having a hole opening extending from a first surface of the substrate and narrowing with depth into the substrate, wherein each of the hole openings has a pitch which changes depending on a position of the hole opening on the substrate; removing the metal to expose flat areas separating the hole shapes on the first surface; and depositing a photovoltaic device stack on the substrate. 11. The method as recited in claim 10 , wherein dry etching includes tuning a reactive ion etch (RIE) to form a tapered structure in the hole openings, and the tuning includes regulating pressure between about 100 mTorr and about 300 mTorr and power between about 200 Watts to about 400 Watts. 12. The method as recited in claim 10 , wherein the plurality of hole shapes include an opening dimension of 500 nm or greater. 13. The method as recited in claim 10 , wherein forming the photovoltaic device stack on the substrate includes: forming a first conductive layer disposed on the substrate; forming a p-i-n or n-i-p stack disposed on the first conductive layer; and forming a second conductive layer formed on the p-i-n or n-i-p stack. 14. The method as recited in claim 10 , wherein the pitch increases as position from an origin point increases. 15. The method as recited in claim 10 , wherein the pitch alternately changes across the substrate between at least two pitch sizes.
Photovoltaic [PV] energy · CPC title
including variation in thickness · CPC title
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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