Tuning multipole RF amplitude for ions not present in calibrant

US10056244B1 · US · B1

Patent metadata
FieldValue
Publication numberUS-10056244-B1
Application numberUS-201715662811-A
CountryUS
Kind codeB1
Filing dateJul 28, 2017
Priority dateJul 28, 2017
Publication dateAug 21, 2018
Grant dateAug 21, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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Abstract

Official abstract text for this publication.

A mass spectrometry apparatus includes an ion source configured to generate ions; an ion guide configured to guide ions from the ion source towards a detector; the ion detector configured to detect ions; and a mass spectrometry controller. The mass spectrometry controller is configured to generate a tune curve for the ion guide; determine an observed low mass cutoff for the ion guide from the tune curve; calculate an effective r0 for the ion guide based on the observed low mass cutoff; determine an RF voltage based on the effective r0 and the RF frequency; apply the RF voltage to the ion guide; and perform a mass analysis of ions in a sample.

First claim

Opening claim text (preview).

What is claimed is: 1. A mass spectrometry apparatus comprising: an ion source configured to generate ions; an ion guide configured to guide ions from the ion source towards a detector; the ion detector configured to detect ions; and a mass spectrometry controller configured to: generate a tune curve for the ion guide; determine an observed low mass cutoff for the ion guide from the tune curve; calculate an effective r0 for the ion guide based on the observed low mass cutoff; determine an RF voltage based on the effective r0 and the RF frequency; apply the RF voltage to the ion guide; and perform a mass analysis of ions in a sample. 2. The mass spectrometry system of claim 1 wherein the ion guide is a quadrupole, a square quadrupole, a hexapole, an octopole, a stacked ring ion guide, an ion funnel, an ion carpet, or any combination thereof. 3. The mass spectrometry system of claim 1 wherein the processor is configured to calculate the effective r0 based on the observed low mass cutoff, a nominal r0, and an expected low mass cutoff. 4. The mass spectrometry system of claim 3 wherein the processor is configured to calculate the effective r0 according to r ⁢ ⁢ 0 effective = K observed * r ⁢ ⁢ 0 nominal 2 / K expected where K expected is the expected value for a parameter and K observed is the observed value for the parameter, the parameter selected from q, q*(m/z), q*(m/z)*ω 2 , q*(m/z)*f 2 , V, V/ω 2 , V/f 2 , or a combination thereof. 5. The mass spectrometry system of claim 3 wherein the processor is configured to calculate the effective r0 according to r ⁢ ⁢ 0 effective = cutoff observed * r ⁢ ⁢ 0 nominal 2 / cutoff expected . 6. The mass spectrometry system of claim 1 wherein the observed low mass cutoff is an average across at least two calibrant ion species. 7. The mass spectrometry system of claim 1 wherein the RF voltage is determined based on the effective r0, the frequency of the RF voltage, and a tune table. 8. The mass spectrometry system of claim 7 wherein the tune table includes optimum q values for mass-to-charge ratios. 9. A method of analyzing ion fragments, comprising: generating a tune curve for an ion guide; determining an observed low mass cutoff for the ion guide from the tune curve; calculating an effective r0 for the ion guide based on the observed low mass cutoff; determining an RF voltage based on the effective r0 and the RF frequency; applying the RF voltage to the ion guide; and performing a mass analysis of ions in a sample. 10. The method of claim 9 wherein the ion guide is a quadrupole, a square quadrupole, a hexapole, an octopole, a stacked ring ion guide, an ion funnel, an ion carpet, or any combination thereof. 11. The method of claim 9 wherein calculating an effective r0 is based on the observed low mass cutoff, a nominal r0, and an expected low mass cutoff. 12. The method of claim 11 wherein calculating the effective r0 is in accordance with r ⁢ ⁢ 0 effective = K observed * r ⁢ ⁢ 0 nominal 2 / K expected ⁢ the expected value for a parameter and K observed is the observed value for the parameter, the parameter selected from q, q*(m/z), q*(m/z)*ω 2 , q*(m/z)*f 2 , V, V/ω 2 , V/f 2 , or a combination thereof. 13. The method of claim 11 wherein calculating the effective r0 is in accordance with r ⁢ ⁢ 0 effective = cutoff observed *

Assignees

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Classifications

  • Mass spectrometers or separator tubes · CPC title

  • Calibration of the apparatus · CPC title

  • by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode · CPC title

  • Ion guides (linear ion traps performing mass selection H01J49/4225, mass filters H01J49/421) · CPC title

  • Step by step routines describing the handling of the data generated during a measurement · CPC title

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What does patent US10056244B1 cover?
A mass spectrometry apparatus includes an ion source configured to generate ions; an ion guide configured to guide ions from the ion source towards a detector; the ion detector configured to detect ions; and a mass spectrometry controller. The mass spectrometry controller is configured to generate a tune curve for the ion guide; determine an observed low mass cutoff for the ion guide from the t…
Who is the assignee on this patent?
Thermo Finnigan Llc
What technology area does this patent fall under?
Primary CPC classification H01J49/0009. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Aug 21 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).