Quantum leakage suppression method

Patent metadata

Field	Value
Publication number	US-10055690-B2
Application number	US-201715631548-A
Country	US
Kind code	B2
Filing date	Jun 23, 2017
Priority date	Jun 28, 2016
Publication date	Aug 21, 2018
Grant date	Aug 21, 2018

Abstract

A method of reducing quantum leakage in a qubit device which includes receiving a set of energy level values for a multi-level system which includes first and second working levels |0>, |1> which provide a qubit, and at least one other level |2>, and performing an iteration of determining quantum leakage from at least one of the first and second working levels to the at least one other level for a quantum operation A for at least one pulse wherein each pulse has a respective pulse duration, determining whether the quantum leakage is greater than or equal to a threshold value; and, based on the quantum leakage being greater than or equal to the threshold value, changing the duration of at least one of the at least one pulse.

First claim

The invention claimed is:

1. A method comprising:
receiving a set of energy level values for a multi-level system which includes first and second working levels |0>, |1>, which provide a qubit, and at least one other level |2>; and
performing an iteration at least once comprising
determining an estimate of a quantum operation A, said estimate comprising a plurality of first elements associated with said set of energy level values for said first and second working levels |0>, |1>, and said at least one other level |2>, and at least a second element associated with a coupling coefficient comprising at least one control field term comprising at least one pulse having a pulse duration;
determining quantum leakage from at least one of the first and second working levels to the at least one other level for said quantum operation A;
determining whether the quantum leakage is greater than or equal to a threshold value; and
based on the quantum leakage being greater than or equal to the threshold value, changing the pulse duration of the at least one said pulse to minimize said coupling coefficient so as to maintain said quantum leakage at or below said threshold value.

2. A method according to claim 1 comprising repeating the iteration for a different given pulse duration.

3. A method according to claim 1 , wherein determining quantum leakage comprises determining:

α
i

=

∑
j
N

⁢



C
ij



2

where α i is quantum leakage for a working level i, where i is zero or a positive integer, and j is a non-working level, where C ij are complex coefficients and j is zero or a positive integer and not equal to i, and N is a positive integer greater than or equal to 2.

4. A method according to claim 3 , wherein i=(0, 1) and j≠(0, 1)≥2.

5. A method according to claim 3 , wherein N≤10, N≥50 or N≥100.

6. A method according to claim 1 , further comprising measuring the set of energy level values.

7. A method according to claim 6 , wherein measuring the set of energy level values comprises measuring a test multi-level system.

8. A method according to claim 1 , wherein the threshold value is less than or equal to 1×10 −5 .

9. A method according to claim 1 , wherein the threshold value is less than or equal to 1×10 −6 .

10. A method according to claim 1 , wherein changing the duration of the at least one of the at least one pulse comprises increasing or decreasing the duration of the pulse by a predetermined amount.

Assignees

• Hitachi Ltd

Inventors

• Andreev Aleksey
• Williams David

Classifications

• G06N99/002 Primary

  Physics · mapped topic

• G06N10/70 Primary

  Quantum error correction, detection or prevention, e.g. surface codes or magic state distillation · CPC title