Method of forming a scintillation crystal and a radiation detection apparatus including a scintillation crystal including a rare earth halide
US-2016200972-A1 · Jul 14, 2016 · US
US10053624B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10053624-B2 |
| Application number | US-201715710509-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 20, 2017 |
| Priority date | Jun 6, 2011 |
| Publication date | Aug 21, 2018 |
| Grant date | Aug 21, 2018 |
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A scintillation crystal can include Ln (1-y) RE y X 3 , wherein Ln represents a rare earth element, RE represents a different rare earth element, y has a value in a range of 0 to 1, and X represents a halogen. In an embodiment, RE is Ce, and the scintillation crystal is doped with Sr, Ba, or a mixture thereof at a concentration of at least approximately 0.0002 wt. %. In another embodiment, the scintillation crystal can have unexpectedly improved linearity and unexpectedly improved energy resolution properties. In a further embodiment, a radiation detection system can include the scintillation crystal, a photosensor, and an electronics device. Such a radiation detection system can be useful in a variety of radiation imaging applications.
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What is claimed is: 1. A scintillation crystal comprising La (1-y) RE y X 3 :Me 2+ , wherein: RE represents a rare earth element other than La; y has a value in a range of 0 to 1; X represents a halogen; and Me 2+ represents Sr, Ba, or any mixture thereof and has a concentration in a range of 0.0002 wt. % to 0.05 wt. %. 2. The scintillation crystal of claim 1 , wherein the scintillation crystal has a property including: for a radiation energy range of 60 keV to 356 keV, the scintillation crystal has an average value for a departure from perfect linearity of no less than −0.35%; for a radiation energy range of 2000 keV to 2600 keV, the scintillation crystal has an average value for a departure from perfect linearity of no greater than 0.07%; for a radiation energy range of 60 keV to 356 keV, the scintillation crystal has an absolute value for a furthest departure from perfect linearity of no greater than 0.7%; or any combination thereof. 3. The scintillation crystal of claim 2 , wherein the average value for the departure from perfect linearity (DFPL average ) is determined by: DFPL average = ∫ E lower E upper DFPL ( E i ) · dE i E upper - E lower , where DFPL(Ei) is DFPL at energy E i ; E upper is the upper limit of the energy range; and E lower is the lower limit of the energy range. 4. The scintillation crystal of claim 1 , wherein the concentration of Me 2+ is no greater than 0.03 wt. %. 5. The scintillation crystal of claim 1 , wherein the concentration of Me 2+ is in a range of 0.005 wt. % to 0.02 wt. %. 6. The scintillation crystal of claim 1 , wherein y has a value in a range of 0.001 to 0.5. 7. The scintillation crystal of claim 1 , wherein RE is Ce. 8. The scintillation crystal of claim 1 , wherein X is Br. 9. A radiation detection system comprising: a scintillation crystal including La (1-y) RE y X 3 :Me 2+ , wherein: RE represents a rare earth element other than La; y has a value in a range of 0 to 1; X represents a halogen; and Me 2+ represents Sr, Ba, or any mixture thereof and has a concentration in a range of 0.0002 wt. % to 0.05 wt. %; and a photosensor optically coupled to the scintillation crystal. 10. The radiation detection system of claim 9 , further comprising an electronics module coupled to the photosensor. 11. The radiation detection system of claim 10 , wherein the electronics module comprises an amplifier, a pre-amplifier, a discriminator, an analog-to-digital signal converter, a photon counter, another electronic component, or any combination thereof. 12. The radiation detection system of claim 9 , wherein the scintillation crystal has a property including: for a radiation energy range of 60 keV to 356 keV, the scintillation crystal has an average value for a departure from perfect linearity of no less than −0.35%; for a radiation energy range of 2000 keV to 2600 keV, the scintillation crystal has an average value for a departure from perfect linearity of no greater than 0.07%; for a radiation energy range of 60 keV to 356 keV, the scintillation crystal has an absolute value for a furthest departure from perfect linearity of no greater than 0.7%; or any combination thereof. 13. The radiation detection system of claim 12 , wherein the average value for the departure from perfect linearity (DFPL average ) is determined by: DFPL average = ∫ E lower E upper DFPL ( E i ) · dE i E upper - E lower , where DFPL(Ei) is DFPL at energy E i ; E upper is the upper limit of the energy range; and E lower is the lower limit of the energy range. 14. The radiation detection system of claim 9 , wherein RE is Ce, and X is Br. 15. A method comprising: providing a radiation detection system including a scintillation crystal that includes La (1-y) RE y X 3 :Me 2+ , wherein: RE represents a rare earth element other than La; y has a value in a range of 0 to 1; X represents a halogen; and Me 2+ represents Sr, Ba, or any mixture thereof and has a concentration in a range of 0.0002 wt. % to 0.05 wt. %; and exposing the scintillation crystal to a radioactive material; and determine a performance characteristic at different energies. 16. The method of claim 15 , wherein determining the performance characteristic comprises determining a departure from perfect linearity for the scintillation crystal, wherein: for a radiation energy range of 60 keV to 356 keV, an average value for the departure from perfect linearity of no less than −0.35%; for a radiation energy range of 2000 keV to 2600 keV, an average value for the departure from perfect linearity of no greater than 0.07%; for a radiation energy range of 60 keV to 356 keV, an absolute value for a furthest departure from perfect linearity of no greater than 0.7%; or any combination thereof. 17. The method of claim 16 , determining the departure from perfect linearity is performed such
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