Rolling element inspection method, rolling element manufacturing method, and rolling element

US10048214B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10048214-B2
Application numberUS-201214241043-A
CountryUS
Kind codeB2
Filing dateJul 27, 2012
Priority dateAug 26, 2011
Publication dateAug 14, 2018
Grant dateAug 14, 2018

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Abstract

Official abstract text for this publication.

An inspection method of a rolling element includes the steps of: projecting an X-ray from a light source to a rolling element, detecting the X-ray passing through the rolling element by a detector, calculating data of the detected X-ray to form an image, and detecting a defect in the rolling element based on the image. At the step of projecting an X-ray, the light source rotates relatively around the rolling element while the X-ray is projected to an entire region of the rolling element facing the light source. At the step of forming an image, data of the X-ray for one circuit around the rolling element is calculated to generate the image.

First claim

Opening claim text (preview).

The invention claimed is: 1. An inspection method of a rolling element made of ceramics, comprising the steps of: projecting an X-ray from a light source to said rolling element, said light source being rotated relatively around said rolling element while said X-ray is simultaneously projected to an entire region of said rolling element facing said light source; detecting said X-ray passing through said rolling element with a 2D detector, while said light source is rotated relatively around said rolling element; calculating data of said detected X-ray to generate a 3D image, data of said X-ray for one circuit around said rolling element being calculated to generate said 3D image; and based on said generated 3D image, detecting an internal defect in said rolling element that is a metal inclusion or a hole, wherein during the steps of projecting an X-ray and detecting said X-ray, the light source and the 2D detector rotate around said rolling element while maintaining a positional relationship relative to each other; and wherein the data of said detected X-ray calculated to generate the 3D image includes data of X-rays transmitted through the outer edge portion of the rolling element. 2. The inspection method of a rolling element according to claim 1 , wherein said X-ray is projected from said light source having a focal point size less than or equal to 10 μm, at said step of projecting an X-ray. 3. The inspection method of a rolling element according to claim 1 , wherein said X-ray spreading conically from said light source is projected to said rolling element, at said step of projecting an X-ray. 4. The inspection method of a rolling element according to claim 1 , wherein said ceramics has silicon nitride or sialon as a main component. 5. The inspection method of a rolling element according to claim 1 , wherein a defect of at least 20 μm in size is detected at said step of detecting a defect. 6. A manufacturing method of a rolling element comprising the steps of: producing a rolling element made of ceramics, and inspecting said rolling element, said rolling element being inspected by the inspection method of a rolling element defined in claim 1 , at said step of inspecting a rolling element. 7. A rolling element manufactured by the manufacturing method of a rolling element defined in claim 6 . 8. The inspection method of a rolling element according to claim 1 , wherein the detecting step includes detecting a defect in said rolling element based on said 3D image that would not be detected based on a 2D image generated from data of said X-ray from any single position along the circuit around said rolling element.

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What does patent US10048214B2 cover?
An inspection method of a rolling element includes the steps of: projecting an X-ray from a light source to a rolling element, detecting the X-ray passing through the rolling element by a detector, calculating data of the detected X-ray to form an image, and detecting a defect in the rolling element based on the image. At the step of projecting an X-ray, the light source rotates relatively arou…
Who is the assignee on this patent?
Tanaka Yutaka, Muramatsu Katsutoshi, Suzuki Hiroaki, and 3 more
What technology area does this patent fall under?
Primary CPC classification G01N23/04. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Aug 14 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).