Optical calibrator, calibration system, and method

Patent metadata

Field	Value
Publication number	US-10048121-B2
Application number	US-201615252430-A
Country	US
Kind code	B2
Filing date	Aug 31, 2016
Priority date	Aug 31, 2016
Publication date	Aug 14, 2018
Grant date	Aug 14, 2018

Abstract

Calibration devices, systems, and methods for calibrating a sensor. In one example a calibrator includes a housing, a dual-axis mirror positioning mechanism disposed within the housing, and a single calibration mirror coupled to the dual-axis mirror positioning mechanism and disposed within the housing, the dual-axis mirror positioning mechanism being configured to rotate the calibration mirror about a first axis to move the calibration mirror from a stowed position into a deployed position and, when the calibration mirror is in the deployed position, to rotate the calibration mirror about a second axis into a plurality of calibration positions, the first and second axes being orthogonal.

First claim

What is claimed is:

1. A calibrator comprising:
a housing;
a dual-axis mirror positioning mechanism disposed within the housing; and
a single calibration mirror coupled to the dual-axis mirror positioning mechanism and disposed within the housing, the dual-axis mirror positioning mechanism being configured to rotate the calibration mirror about a first axis to move the calibration mirror from a stowed position into a deployed position and, when the calibration mirror is in the deployed position, to rotate the calibration mirror about a second axis into a plurality of calibration positions, the first and second axes being orthogonal.

2. The calibrator of claim 1 wherein the dual-axis mirror positioning mechanism includes a movable arm configured to rotate about the first axis, the calibration mirror being mounted to the movable arm.

3. The calibrator of claim 2 wherein the dual-axis mirror positioning mechanism includes a motor and a resolver.

4. A calibration system for calibrating a sensor, the calibration system comprising:
at least one radiation source configured to emit electromagnetic radiation;
a dual-axis mirror positioning mechanism disposed opposite the at least one radiation source; and
a single calibration mirror coupled to the dual-axis mirror positioning mechanism, the dual-axis mirror positioning mechanism being configured to rotate the calibration mirror about a first axis to move the calibration mirror from a stowed position into a deployed position, and, when the calibration mirror is in the deployed position, to rotate the calibration mirror about a second axis to at least one calibration position, the calibration mirror in the at least one calibration position forming an optical path between the sensor and the at least one radiation source and being configured to receive the electromagnetic radiation from the at least one radiation source and to reflect the electromagnetic radiation toward the sensor, wherein in the stowed position, the calibration mirror does not reflect the electromagnetic radiation from the at least one radiation source, and wherein the first and second axes are orthogonal to one another.

5. The calibration system of claim 4 wherein the at least one radiation source is a black body calibration source configured to emit infrared electromagnetic radiation.

6. The calibration system of claim 4 further comprising a housing, the dual-axis mirror positioning mechanism being mounted to the housing and the calibration mirror being contained within the housing.

7. The calibration system of claim 6 further comprising a mounting platform, the at least one radiation source being fixedly mounted to the mounting platform.

8. The calibration system of claim 7 wherein the mounting platform is integral with the housing.

9. The calibration system of claim 7 wherein the mounting platform is fixedly connected to the housing.

10. The calibration system of claim 7 wherein the at least one radiation source includes a plurality of radiation sources, the plurality of radiation sources including a plurality of black body calibration sources each configured to emit infrared electromagnetic radiation.

11. The calibration system of claim 10 wherein the plurality of radiation sources further includes a visible-band calibration source, the visible-band calibration source including an integrating sphere mounted to the mounting platform and a visible light source coupled to the integrating sphere.

12. The calibration system of claim 11 wherein the visible light source includes at least one light emitting diode.

13. The calibration system of claim 10 wherein, when the calibration mirror is in the deployed position, the dual-axis mirror positioning mechanism is configured to rotate the calibration mirror about the second axis to a plurality of calibration positions, the calibration mirror in each of the plurality of calibration positions forming an optical path between the sensor and at least one radiation source of the plurality of radiation sources and being configured to receive the electromagnetic radiation from the at least one radiation source and to reflect the electromagnetic radiation toward the sensor.

14. The calibration system of claim 10 further comprising a thermal management sub-system coupled to the plurality of black body calibration sources and configured to maintain each black body calibration source within a respective predetermined temperature range.

15. The calibration system of claim 10 wherein the plurality of black body calibration sources includes three black body calibration sources, and the plurality of calibration positions includes four calibration positions.

16. The calibration system of claim 4 wherein the at least one radiation source includes a visible-band calibration source, the visible-band calibration source including an integrating sphere and a visible light source coupled to the integrating sphere.

17. A method of calibrating a sensor, the method comprising:
rotating a calibration mirror about a first axis from a stowed position to a deployed position;
rotating the calibration mirror, when in the deployed position, about a second axis to a first calibration position of a plurality of calibration positions, the second axis being orthogonal to the first axis;
receiving at the calibration mirror a first radiation beam from a first one of a plurality of radiation sources, the first radiation beam being within a first spectral range;
reflecting the first radiation beam from the calibration mirror to the sensor; and
performing a first calibration measurement at the sensor using the first radiation beam.

18. The method of claim 17 further comprising:
after performing the first calibration measurement, rotating the calibration mirror about the second axis into a second calibration position of the plurality of calibration positions;
receiving at the calibration mirror a second radiation beam from a second one of the plurality of radiation sources, the second radiation beam being within a second spectral range different from the first spectral range;
reflecting the second radiation beam from the calibration mirror to the sensor; and
performing a second calibration measurement at the sensor using the second radiation beam.

19. The method of claim 18 wherein the first and second spectral ranges are non-overlapping.

20. The method of claim 18 further comprising:
after performing the second calibration measurement, rotating the calibration mirror about the first axis to return the calibration mirror to the stowed position.

Assignees

• Raytheon Co

Inventors

• Zimmerman Andrew J
• Spencer Susan B
• Menendez Michael L

Classifications

• G01J1/0414 Primary

  using plane or convex mirrors, parallel phase plates, or plane beam-splitters · CPC title

• G02B7/1827

  Motorised alignment · CPC title

• G01J5/0806

  Focusing or collimating elements, e.g. lenses or concave mirrors · CPC title

• G01J5/047 Primary

  Mobile mounting; Scanning arrangements · CPC title

• G01J5/53

  Reference sources, e.g. standard lamps; Black bodies · CPC title