Method and apparatus for using radiation imaging data to analyze components
US-2024369500-A1 · Nov 7, 2024 · US
US10046412B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10046412-B2 |
| Application number | US-201414337566-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 22, 2014 |
| Priority date | Aug 2, 2013 |
| Publication date | Aug 14, 2018 |
| Grant date | Aug 14, 2018 |
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A method of manufacturing a component includes providing a powder layer; scanning the powder layer using an electron beam; detecting back scattered electrons produced by the interaction of the electron beam with the powder layer; identifying, from the detected back scattered electrons, any defects in the powder layer; selectively melting at least a part of the powder layer so as to generate a solid layer; and repeating these steps at least once so as to build up a shape corresponding to the component. The method may also includes steps of making a decision about whether to remove any identified defects in the powder layer, and adjusting one or more parameters of the step of providing a powder and/or adjusting one or more parameters of the selective melting step so as to avoid future recurring defects at that position based on stored data relating to the scanned powder layer.
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I claim: 1. A method of manufacturing a component using additive layer manufacture, the method comprising: providing a powder layer to be melted in order to produce a layer of the component; scanning the powder layer using an electron beam; detecting back scattered electrons produced by the interaction of the electron beam with the powder layer; identifying, from the detected back scattered electrons, any defects in the powder layer to be melted; if a defect is identified in the powder layer, making a decision about whether or not to remove the identified defect in the powder layer, the decision being based on one or more predetermined criteria; then selectively melting at least a part of the powder layer so as to generate a solid layer of the component; and repeating the steps of: providing a powder layer; scanning the powder layer; detecting back scattered electrons; identifying defects in the powder layer; making a decision about whether or not to remove any identified defects; and selectively melting at least a part of the powder layer at least once so as to build up a shape corresponding to the component. 2. A method of manufacturing a component according to claim 1 , wherein the power of the electron beam used to scan the powder layer is insufficient to cause melting of the powder layer. 3. A method of manufacturing a component according to claim 1 , wherein the step of selectively melting at least a part of the powder layer is performed by an energy beam. 4. A method of manufacturing a component according to claim 3 , wherein: the electron beam used to scan the powder layer is a first electron beam; the energy beam used to selectively melt at least a part of the powder layer is a second electron beam; and the power of the first electron beam is lower than the power of the second electron beam. 5. A method of manufacturing a component according to claim 4 , wherein the first electron beam and the second electron beam are generated using the same electron beam source. 6. A method of manufacturing a component according to claim 1 , further comprising: removing identified defects in the powder layer prior to selectively melting at least a part of the powder layer. 7. A method of manufacturing a component according to claim 1 , wherein the decision is based at least in part on at least one of the size of the defect, the shape of the defect and the position of the defect. 8. A method of manufacturing a component according to claim 1 , wherein the decision is taken by a machine. 9. A method of manufacturing a component according to claim 1 , wherein the decision is taken by an operator of a machine. 10. A method of manufacturing a component according to claim 1 , further comprising storing data relating to the scanned powder layer. 11. A method of manufacturing a component according to claim 10 , further comprising: using the stored data to determine whether any defects have been identified at the same position in two or more different powder layers, such defects being recurring defects; and if any such recurring defects have been identified, adjusting one or more parameters of the step of providing a powder and/or adjusting one or more parameters of the selective melting step so as to avoid future recurring defects at that position. 12. A method of manufacturing a component according to claim 1 , further comprising: identifying any defects in the solid layer by scanning the solid layer using a solid layer scanning electron beam and detecting back scattered electrons produced by the interaction of the solid layer scanning electron beam with the solid layer. 13. A method of manufacturing a component according to claim 12 , wherein the power of the solid layer scanning electron beam is lower than the power of the second electron beam. 14. A method according to claim 1 , wherein the powder layer is a metal powder layer. 15. A component manufactured using a method comprising the steps of claim 1 . 16. A method of manufacturing a component using additive layer manufacture, the method comprising: providing a powder layer to be melted in order to produce a layer of the component; scanning the powder layer using an electron beam; detecting back scattered electrons produced by the interaction of the electron beam with the powder layer; identifying, from the detected back scattered electrons, any defects in the powder layer to be melted; storing data relating to the scanned powder layer; selectively melting at least a part of the powder layer so as to generate a solid layer of the component; and repeating the steps of: providing a powder layer; scanning the powder layer; detecting back scattered electrons; identifying defects in the powder layer; storing data relating to the scanned powder layer; and selectively melting at least a part of the powder layer at least once so as to build up a shape corresponding to the component; using the stored data to determine whether any defects have been identified at the same position in two or more different powder layers, such defects being recurring defects; and if any such recurring defects have been identified, adjusting one or more parameters of the step of providing a powder and/or adjusting one or more parameters of the selective melting step so as to avoid future recurring defects at that position. 17. A method of manufacturing a component according to claim 16 , wherein the power of the electron beam used to scan the powder layer is insufficient to cause melting of the powder layer. 18. A method of manufacturing a component according to claim 16 , wherein the step of selectively melting at least a part of the powder layer is performed by an energy beam. 19. A method of manufacturing a component according to claim 18 , wherein: the electron beam used to scan the powder layer is a first electron beam; the energy beam used to selectively melt at least a part of the powder layer is a second electron beam; and the power of the first electron beam is lower than the power of the second electron beam. 20. A method of manufacturing a component according to claim 16 , further comprising: removing identified defects in the powder layer prior to selectively melting at least a part of the powder layer.
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