Method and apparatus for compensating for a parameter change in a synthetic aperture imaging system

US10042049B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10042049-B2
Application numberUS-201514928194-A
CountryUS
Kind codeB2
Filing dateOct 30, 2015
Priority dateJun 28, 2010
Publication dateAug 7, 2018
Grant dateAug 7, 2018

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

There is described a method for processing data generated by a synthetic aperture imaging system, comprising: receiving raw data representative of electromagnetic signals reflected by a target area to be imaged; receiving a parameter change for the synthetic aperture imaging system; digitally correcting the raw data in accordance with the parameter change, thereby compensating for the parameter change in order to obtain corrected data; and generating an image of the target area using the corrected data.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for processing data generated by a synthetic aperture imaging system, comprising the steps of: receiving raw data representative of return signal echoes from a target area to be imaged; receiving a parameter change causing a variation of an interference pattern parameter for said synthetic aperture imaging system, said interference pattern parameter being one of a Fresnel zone plate focal length and a Fourier slice scaling parameter; using a processing unit, digitally correcting said raw data in accordance with said parameter change, said correcting comprising determining a scaling factor using said parameter change and scaling said raw data in accordance with said scaling factor, thereby compensating for said parameter change in order to obtain corrected data; and generating an image of said target area using said corrected data, said generating comprising: generating an incident light; modulating said incident light in accordance with said corrected data, thereby obtaining a modulated light; and optically processing said modulated light, thereby obtaining an optical image of said target area. 2. The method as claimed in claim 1 , further comprising the step of detecting said optical image to obtain a digital image of said target area. 3. The method as claimed in claim 1 , wherein said parameter change comprises a change of one of a pulse repetition frequency, a range sampling frequency, and a slant range distance. 4. The method as claimed in claim 1 , wherein said receiving said raw data comprises receiving said raw data from one of a synthetic aperture radar system, a synthetic aperture sonar system, a synthetic aperture lidar system, a synthetic aperture terahertz system, and a synthetic aperture infrared system. 5. A system for generating a synthetic aperture image of a target area, comprising: a memory configured to store raw data representative of return signal echoes from said target area and a parameter change causing a variation of an interference pattern parameter for said synthetic aperture imaging system, said interference pattern parameter comprising one of a Fresnel zone plate focal length and a Fourier slice scaling parameter; a processing unit configured to determine a scaling factor using said parameter change and to scale said raw data in accordance with said scaling factor in order to compensate for said parameter change and obtain corrected data; and an image generator configured to generate an image of said target area using said corrected data, said image generator comprising: a light source configured to generate incident light; a light modulator configured to modulate said incident light in accordance with said corrected data, thereby obtaining a modulated light; and an optical processor configured to optically process said modulated light, thereby obtaining said image of said target area. 6. The system as claimed in claim 5 , wherein said image generator further comprises an image sensor configured to detect said optical image and to generate a digital image of said target area. 7. The system as claimed in claim 5 , wherein said parameter change comprises a change of one of a pulse repetition frequency, a range sampling frequency, and a slant range distance. 8. The system as claimed in claim 5 , wherein said memory is configured to store said raw data generated by one of a synthetic aperture radar system, a synthetic aperture sonar system, a synthetic aperture lidar system, a synthetic aperture terahertz system, and a synthetic aperture infrared system.

Assignees

Inventors

Classifications

  • using synthetic aperture techniques · CPC title

  • using two or more images, e.g. averaging or subtraction · CPC title

  • Synthetic aperture · CPC title

  • G01S13/904Primary

    SAR modes · CPC title

  • Optics for apodization or superresolution; Optical synthetic aperture systems · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US10042049B2 cover?
There is described a method for processing data generated by a synthetic aperture imaging system, comprising: receiving raw data representative of electromagnetic signals reflected by a target area to be imaged; receiving a parameter change for the synthetic aperture imaging system; digitally correcting the raw data in accordance with the parameter change, thereby compensating for the parameter…
Who is the assignee on this patent?
Institut Nat Doptique
What technology area does this patent fall under?
Primary CPC classification G01S13/904. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Aug 07 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).