Arrangements for magnetic field sensors that act as movement detectors

Patent metadata

Field	Value
Publication number	US-10041810-B2
Application number	US-201615176665-A
Country	US
Kind code	B2
Filing date	Jun 8, 2016
Priority date	Jun 8, 2016
Publication date	Aug 7, 2018
Grant date	Aug 7, 2018

Abstract

Magnetic field sensors can sense speed of movement and direction of movement of a ferromagnetic object. The magnetic field sensors employ both planar Hall effect elements and vertical Hall effect elements to generate two-state signals in two different signal paths with relative phases that are ninety degrees apart, the ninety degrees having sufficient margin to aid in detection of the direction of motion. Other magnetic field sensors use at least four vertical Hall effect elements to identify a speed of rotation and a direction of rotation of a moving ferromagnetic object.

First claim

What is claimed is:

1. A magnetic field sensor for sensing a movement of an object along a path, a movement line tangent to the path, the magnetic field sensor comprising
a magnet, the magnet comprising a north pole, a south pole, and a magnet axis passing through the north pole and the south pole;
a semiconductor substrate proximate to the magnet in a back biased arrangement and at a position between the object and the magnet, the semiconductor substrate having first and second major opposing surfaces, the magnet axis substantially perpendicular to the first opposing surface of the semiconductor substrate, the semiconductor substrate having first and second orthogonal axes on the first opposing surface of the substrate intersecting at a substrate point on the first surface of the substrate, wherein the magnet axis intersects the substrate point, wherein a projection of the movement line onto the first opposing surface of the semiconductor substrate is substantially parallel to the first orthogonal axis on the first surface of the substrate;
a first magnetic field sensing element disposed on or under the first surface of the semiconductor substrate and disposed along the first or second orthogonal axis, wherein the first magnetic field sensing element comprises an axis of maximum sensitivity substantially perpendicular to the first opposing surface of the substrate;
a second magnetic field sensing element disposed on or under the first surface of the semiconductor substrate and disposed along the first or second orthogonal axis, wherein the second magnetic field sensing element comprises an axis of maximum sensitivity substantially parallel to the first opposing surface of the substrate, wherein the axis of maximum sensitivity of the second magnetic field sensing element is substantially parallel to the first orthogonal axis, wherein the first magnetic field sensing element is not disposed over or under the second magnetic field sensing element relative to the first surface of the semiconductor substrate;
a first electronic circuit channel coupled to the first magnetic field sensing element, the first electronic circuit channel operable to generate a first signal having a first phase: and
a second electronic circuit channel coupled to the second magnetic field sensing element, the second electronic circuit channel operable to generate a second signal having a second phase approximately +/−ninety degrees apart from the first phase regardless of a speed of the movement of the object, wherein a sign of the ninety degrees is indicative of a direction of the movement of the object.

2. The magnetic field sensor of claim 1 , wherein the first magnetic field sensing element comprises a planar Hall effect element and the second magnetic field sensing element comprises a vertical Hall effect element.

3. The magnetic field sensor of claim 1 , wherein the first magnetic field sensing element comprises a planar Hall effect element and the second magnetic field sensing element comprises a magnetoresistance element.

4. The magnetic field sensor of claim 1 , wherein a center of the first magnetic field sensing element is disposed along the first orthogonal axis.

5. The magnetic field sensor of claim 4 , wherein a center of second magnetic field sensing element is disposed along the first or second orthogonal axis.

6. A magnetic field sensor for sensing a movement of an object along a path, a movement line tangent to the path, the magnetic field sensor comprising:
a magnet, the magnet comprising a north pole, a south pole, and a magnet axis passing through the north pole and the south pole;
a semiconductor substrate proximate to the magnet in a back biased arrangement and at a position between the object and the magnet, the semiconductor substrate having first and second major opposing surfaces, the magnet axis substantially perpendicular to the first opposing surface of the semiconductor substrate, the semiconductor substrate having first and second orthogonal axes on the first opposing surface of the substrate intersecting at a substrate point on the first surface of the substrate, wherein the magnet axis intersects the substrate point, wherein a projection of the movement line onto the first opposing surface of the semiconductor substrate is substantially parallel to the first orthogonal axis on the first surface of the substrate;
a first magnetic field sensing element disposed on or under the first surface of the semiconductor substrate and disposed along the first or second orthogonal axis, wherein the first magnetic field sensing element comprises an axis of maximum sensitivity substantially perpendicular to the first opposing surface of the substrate;
a second magnetic field sensing element disposed on or under the first surface of the semiconductor substrate and disposed along the first or second orthogonal axis, wherein the second magnetic field sensing element comprises an axis of maximum sensitivity substantially parallel to the first opposing surface of the substrate, wherein the axis of maximum sensitivity of the second magnetic field sensing element is substantially parallel to the first orthogonal axis, wherein the first magnetic field sensing element is not disposed over or under the second magnetic field sensing element relative to the first surface of the semiconductor substrate;
a third magnetic field sensing element disposed on or under the first surface of the semiconductor substrate and disposed along the first or second orthogonal axis, wherein the third magnetic field sensing element comprises an axis of maximum sensitivity substantially perpendicular to the first opposing surface of the substrate;
a fourth magnetic field sensing element disposed on or under the first surface of the semiconductor substrate and disposed along the first or second orthogonal axis, wherein the fourth magnetic field sensing element comprising an axis of maximum sensitivity substantially parallel to the first opposing surface of the substrate, wherein the axis of maximum sensitivity of the fourth magnetic field sensing element is substantially parallel to the first orthogonal axis;
a first electronic circuit channel coupled to the first magnetic field sensing element and to the third magnetic field sensing element, the first electronic circuit channel operable to generate a first difference signal as a difference of signals generated by the first magnetic field sensing element and the third magnetic field sensing element, the first electronic circuit channel operable to generate the first difference signal having a first phase; and
a second electronic circuit channel coupled to the second magnetic field sensing element and to the fourth magnetic field sensing element, the second electronic circuit channel operable to generate a second difference signal as a difference of signals generated by the second magnetic field sensing element and the fourth magnetic field sensing element, the second electronic circuit channel operable to generate the second difference signal having a second phase approximately +/− ninety degrees apart from the first phase regardless of a speed of the movement of the object, wherein a sign of the ninety degrees is indicative of a direction of the movement of the object.

7. The magnetic field sensor of claim 6 , wherein the first and third magnetic field sensing elements comprise planar Hall effect elements and the second and fourth magnetic field sensing elements comprise vertical Hall effect elements.

8. The magnetic field sensor of claim 6 , wherein the first and third magnetic field sensing elements comprise planar Hall effect elements and the second and fourth magnetic field sensing elements comprise magnetoresistance elements.

9.

Assignees

• Allegro Microsystems Llc

Inventors

• Vig Ravi
• David Paul A
• Shoemaker Eric G

Classifications

• G01D5/142 Primary

  using Hall-effect devices (measuring magnetic variables using Hall-effect or other galvanomagnetic devices G01R33/06) · CPC title

• G01D5/147 Primary

  influenced by the movement of a third element, the position of Hall device and the source of magnetic field being fixed in respect to each other · CPC title