Light Emitting Diode and Fabrication Method Thereof
US-2017331002-A1 · Nov 16, 2017 · US
US10038117B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10038117-B2 |
| Application number | US-201715699658-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 8, 2017 |
| Priority date | Jan 16, 2015 |
| Publication date | Jul 31, 2018 |
| Grant date | Jul 31, 2018 |
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A semiconductor light-emitting device comprises an epitaxial structure comprising an main light-extraction surface, a lower surface opposite to the main light-extraction surface, a side surface connecting the main light-extraction surface and the lower surface, a first portion and a second portion between the main light-extraction surface and the first portion, wherein a concentration of a doping material in the second portion is higher than that of the doping material in the first portion and, in a cross-sectional view, the second portion comprises a first width near the main light-extraction surface and second width near the lower surface, and the first width is smaller than the second width.
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What is claimed is: 1. A semiconductor light-emitting device comprising: an epitaxial structure comprising an main light-extraction surface, a lower surface opposite to the main light-extraction surface, a side surface connecting the main light-extraction surface and the lower surface, a first portion and a second portion between the side surface and the first portion; wherein a concentration of a doping material in the second portion is higher than that of the doping material in the first portion; wherein in a cross-sectional view the second portion comprises a first width near the main light-extraction surface and second width near the lower surface, and the first width is smaller than the second width. 2. The semiconductor light-emitting device according to claim 1 , wherein the main light-extraction surface comprises a first light-extraction region corresponding to the first portion and a second light-extraction region corresponding to the second portion, and when the semiconductor light-emitting device is driven, a near-field luminous intensity in the first light-extraction region is larger than a near-field luminous intensity in the second light-extraction region. 3. The semiconductor light-emitting device according to claim 2 , wherein the main light-extraction surface further comprises a maximum near-field luminous intensity, and the near-field luminous intensity in the first light-extraction region is between 70% and 100% of the maximum near-field luminous intensity, the near-field luminous intensity in the second light-extraction region is between 0% and 70% of the maximum near-field luminous intensity, and a ratio of an area of the first light-extraction region to an area of the second light-extraction region is between 0.25 and 0.45. 4. The semiconductor light-emitting device according to claim 2 , wherein the second light-extraction region is between the first light-extraction region and the side surface. 5. The semiconductor light-emitting device according to claim 1 , wherein the epitaxial structure comprises a first semiconductor stack, a second semiconductor stack, and an active layer between the first semiconductor stack and the second semiconductor stack, and the main light-extraction surface is on the first semiconductor stack and the lower surface is on the second semiconductor stack. 6. The semiconductor light-emitting device according to claim 5 , wherein the concentration of the doping material in the second semiconductor stack in the second portion is over 1*10 18 /cm 3 , and that in the first semiconductor stack in the second portion is lower than 1*10 18 /cm 3 . 7. The semiconductor light-emitting device according to claim 1 , wherein the second portion exposes on the side surface. 8. The semiconductor light-emitting device according to claim 1 , wherein the doping material comprises Zn, Te or Sb. 9. The semiconductor light-emitting device according to claim 8 , wherein the concentration of the doping material in the second portion decreases along a direction from the lower surface to the main light-extraction surface. 10. The semiconductor light-emitting device according to claim 2 , wherein a shape of the first light-extraction region is the same as a shape of the main light-extraction surface. 11. The semiconductor light-emitting device according to claim 1 , wherein a shape of the main light-extraction surface comprises a circle or a regular polygon. 12. The semiconductor light-emitting device according to claim 1 , further comprising an upper electrode connecting the main light-extraction surface and a second ohmic contact structure connecting the lower surface. 13. The semiconductor light-emitting device according to claim 12 , wherein the upper electrode, the second ohmic contact structure and the first portion are overlapped in a vertical direction. 14. The semiconductor light-emitting device according to claim 12 , wherein an area of the upper electrode is between 1% and 10% of an area of the main light-extraction surface, and an area of the second ohmic contact structure is between 1% and 10% of the area of the lower surface. 15. The semiconductor light-emitting device according to claim 12 , wherein a material of the second ohmic contact structure comprises transparent conductive material. 16. The semiconductor light-emitting device according to claim 12 , further comprising a reflective stack covering the second ohmic contact structure and the second semiconductor stack. 17. The semiconductor light-emitting device according to claim 16 , further comprising a conductive substrate and an adhesive layer between the reflective stack and the conductive substrate. 18. The semiconductor light-emitting device according to claim 1 , wherein the main light-extraction surface comprises a circumference and a ratio of a thickness of the epitaxial structure to the circumference is between 2% and 20%. 19. The semiconductor light-emitting device according to claim 1 , further comprising a boundary between the first portion and the second portion, wherein the boundary is a curve.
Electricity · mapped topic
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