Conductive paste composition and semiconductor devices made therewith
US-2020176147-A1 · Jun 4, 2020 · US
US10035725B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10035725-B2 |
| Application number | US-201715423052-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 2, 2017 |
| Priority date | Feb 2, 2016 |
| Publication date | Jul 31, 2018 |
| Grant date | Jul 31, 2018 |
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An X-ray and gamma-ray shielding glass, including the following components in weight-%: 10-35% SiO 2 ; 60-70% PbO; 0-8% B 2 O 3 ; 0-10% Al 2 O 3 ; 0-10% Na 2 O; 0-10% K 2 O; 0-0.3% As 2 O 3 ; 0-2% Sb 2 O 3 ; 0-6% BaO; and 0.05-2% ZrO 2 .
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What is claimed is: 1. An X-ray and gamma-ray shielding glass, comprising the following components in weight-%: 10-35% SiO 2 ; 60-70% PbO; 0-8% B 2 O 3 ; 0-10% Al 2 O 3 ; 0-10% Na 2 O; 0-10% K 2 O; 0-0.3% As 2 O 3 ; 0-2% Sb 2 O 3 ; 0-6% BaO; and 0.05-2% ZrO 2 . 2. The X-ray and gamma-ray shielding glass composition according to claim 1 , wherein said glass includes the following composition in weight-%: 20-30% SiO 2 ; 60-67% PbO; 1-5% B 2 O 3 ; 0% Al 2 O 3 ; 0.05-2% Na 2 O; 0.1-3% K 2 O; 0-0.3% As 2 O 3 ; 0.1-0.5% Sb 2 O 3 ; 0% BaO; and 0.1-2% ZrO 2 . 3. The X-ray and gamma-ray shielding glass composition according to claim 1 , wherein said glass includes the following composition in weight-%: 20-30% SiO 2 ; 60-65% PbO; 1.5-2.5% B 2 O 3 ; 0% Al 2 O 3 ; 0.05-2% Na 2 O; 0.1-3% K 2 O; 0-0.3% As 2 O 3 ; 0.1-0.5% Sb 2 O 3 ; 0% BaO; and 0.5-2% ZrO 2 . 4. The X-ray and gamma-ray shielding glass composition according to claim 1 , wherein said glass includes the following composition in weight-%: 20-30% SiO 2 ; 60-65% PbO; 1.5-2.5% B 2 O 3 ; 0% Al 2 O 3 ; 0.05-2% Na 2 O; 0.1-3% K 2 O; 0-0.3% As 2 O 3 ; 0.1-0.5% Sb 2 O 3 ; 0% BaO; and 1-2% ZrO 2 . 5. The X-ray and gamma-ray shielding glass composition according to claim 1 , wherein said glass is BaO-free, except for contaminants. 6. The X-ray and gamma-ray shielding glass composition according to claim 1 , wherein said glass also includes at least one of 1-8 weight-% B 2 O 3 , 0.5-6 weight-% B 2 O 3 , and 1-5 weight-% B 2 O 3 . 7. The X-ray and gamma-ray shielding glass composition according to claim 1 , wherein the composition is selected so that a kinetic of crystallization dØ/dt is at least one of less than 0.2 μm/min., less than 0.1 μm/min., less than 0.05 μm/min., and less than 0.02 μm/min. 8. The X-ray and gamma-ray shielding glass composition according to claim 1 , wherein except for contaminants, the glass does not contain at least one of SrO and MgO. 9. The X-ray and gamma-ray shielding glass composition according to claim 1 , wherein said glass includes the following composition in weight-%: 25-35% SiO 2 ; 60-70% PbO; 0.5-2% Na 2 O; 0.5-3% K 2 O; 0.5-0.75% Sb 2 O 3 ; 0.05-5% ZrO 2 ; and 0-5% BaO; and in that except for contaminants, the composition is free of B 2 O 3 , SrO, As 2 O 3 . 10. A glass plate, comprising the following components in weight-%: 10-35% SiO 2 ; 60-70% PbO; 0-8% B 2 O 3 ; 0-10% Al 2 O 3 ; 0-10% Na 2 O; 0-10% K 2 O; 0-0.3% As 2 O 3 ; 0-2% Sb 2 O 3 ; 0-6% BaO; and 0.05-2% ZrO 2 , wherein the glass plate has a thickness in the rage of 5 μm to 50 mm. 11. The glass plate according to claim 10 , wherein said thickness is in the range of 25 μm to 20 mm. 12. The glass plate according to claim 10 , wherein said thickness is in the range of 0.8 mm to 10 mm. 13. The glass plate according to claim 10 , wherein at a thickness of 10 mm and a wavelength of 400 nm, the glass plate has a transmission which is at least one of >50%, >70%, >75%, and >80%. 14. The glass plate according to claim 13 , wherein at a thickness of 10 mm and a wavelength of 400 nm, the glass plate has a transmission in the range of 75% to 90%. 15. A method to produce gamma-ray shielding glass plates, wherein the method comprises the following steps: providing a glass composition including the following components in weight-%: 10-35% SiO 2 , 60-70% PbO, 0-8% B 2 O 3 , 0-10% Al 2 O 3 , 0-10% Na 2 O, 0-10% K 2 O, 0-0.3% As 2 O 3 , 0-2% Sb 2 O 3 , 0-6% BaO, and 0.05-2% ZrO 2 ; drawing a glass ribbon with a thickness in the range of 0.8 mm to 20 mm upwards from a melt against gravitational force, guiding the glass ribbon by a plurality of rolls; running the glass ribbon through a cooling section; and cutting the glass ribbon into glass plates. 16. The method according to claim 15 , wherein said thickness of the glass ribbon is in the range of 0.8 mm to 10 mm. 17. A method to produce gamma-ray shielding glass plates, wherein the method comprises the following steps: providing a glass composition including the following components in weight-%: 10-35% SiO 2 , 60-70% PbO, 0-8% B 2 O 3 , 0-10% Al 2 O 3 , 0-10% Na 2 O, 0-10% K 2 O, 0-0.3% As 2 O 3 , 0-2% Sb 2 O 3 , 0-6% BaO, and 0.05-2% ZrO 2 ; drawing a glass ribbon with a thickness in the range of 25 μm-1.1 mm downwards from a melt with the gravitational force, guiding the glass ribbon by a plurality of rolls; running the glass ribbon through a cooling section; and cutting the glass ribbon into glass plates. 18. The method according to claim 15 , wherein the method is performed so that a kinetic of crystallization of the glass composition dØ/dt is at least one of less than 0.3 μm/min., less than 0.2 μm/min., less than 0.1 μm/min., less than 0.05 μm/min., and less than 0.02 μm/min. 19. The method according to claim 17 , wherein the method is performed so that a kinetic of crystallization of the glass composition dØ/dt is at least one of less than 0.3 μm/min., less than 0.2 μm/min., less than 0.1 μm/min., less than 0.05 μm/min., and less than 0.02 μm/min.
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