Surface-emitting semiconductor laser and method for producing a surface-emitting semiconductor laser
US-2024332901-A1 · Oct 3, 2024 · US
US10033157B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10033157-B2 |
| Application number | US-201514810601-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 28, 2015 |
| Priority date | Aug 26, 2014 |
| Publication date | Jul 24, 2018 |
| Grant date | Jul 24, 2018 |
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A surface-emitting semiconductor laser includes a first semiconductor multilayer film reflector, an active region, a second semiconductor multilayer film reflector, and a current confinement layer including an oxidized region formed by selective oxidation. The current confinement layer includes a first semiconductor layer having a relatively high Al content, a second semiconductor layer that is adjacent to the first semiconductor layer on an active-region side of the first semiconductor layer and has a lower Al content than the first semiconductor layer, and a composition-gradient layer adjacent to the first semiconductor layer on a side of the first semiconductor layer which is opposite to the active-region side. A portion of the composition-gradient layer which faces the first semiconductor layer has a lower Al content than the first semiconductor layer.
Opening claim text (preview).
What is claimed is: 1. A surface-emitting semiconductor laser comprising: a first semiconductor multilayer film reflector; an active region; a second semiconductor multilayer film reflector; and a current confinement layer including an oxidized region formed by selective oxidation, wherein the current confinement layer includes a first semiconductor layer having a relatively high Al content, a second semiconductor layer adjacent to the first semiconductor layer, the second semiconductor layer being disposed on an active-region side of the first semiconductor layer, the second semiconductor layer having a lower Al content than the first semiconductor layer, and a composition-gradient layer adjacent to the first semiconductor layer, the composition-gradient layer being disposed on a side of the first semiconductor layer which is opposite to the active-region side on which the second semiconductor layer is disposed, and wherein a portion of the composition-gradient layer which faces the first semiconductor layer has a lower Al content than the first semiconductor layer such that there is a discontinuity between the Al content in the first semiconductor layer and a maximum Al content in the composition-gradient layer in the portion of the composition-gradient layer. 2. The surface-emitting semiconductor laser according to claim 1 , wherein a difference in Al content between the portion of the composition-gradient layer which faces the first semiconductor layer and the first semiconductor layer is made such that an oxidation rate in the composition-gradient layer is lower than an oxidation rate in the first semiconductor layer by about one order of magnitude. 3. The surface-emitting semiconductor laser according to claim 1 , wherein the portion of the composition-gradient layer which faces the first semiconductor layer has an Al content of about 0.90 or less. 4. The surface-emitting semiconductor laser according to claim 1 , wherein the second semiconductor layer is adjacent to the active region. 5. The surface-emitting semiconductor laser according to claim 1 , wherein the composition-gradient layer is adjacent to a high-refractive-index layer constituting the second semiconductor multilayer film reflector, and wherein an Al content in the composition-gradient layer is reduced to an Al content substantially equal to an Al content in the high-refractive-index layer. 6. The surface-emitting semiconductor laser according to claim 1 , wherein the first semiconductor layer is composed of AlAs. 7. The surface-emitting semiconductor laser according to claim 1 , wherein the first semiconductor layer has a thickness of about 10 nm or more to about 50 nm or less. 8. A surface-emitting semiconductor laser device comprising: the surface-emitting semiconductor laser according to claim 1 ; and an optical element that light emitted by the surface-emitting semiconductor laser enters. 9. An optical transmission device comprising: the surface-emitting semiconductor laser device according to claim 8 ; and a transmission unit that transmits a laser beam emitted by the surface-emitting semiconductor laser device via an optical medium. 10. An information processing device comprising: the surface-emitting semiconductor laser according to claim 1 ; a light-condensing unit that condenses a laser beam emitted by the surface-emitting semiconductor laser on a recording medium; and a mechanism that scans the recording medium with the laser beam condensed by the light-condensing unit.
Structure of the reflectors, e.g. hybrid mirrors · CPC title
Apertures, e.g. defined by the shape of the upper electrode · CPC title
by oxidizing at least one of the DBR layers · CPC title
the whole junction comprising only (AI)GaAs · CPC title
Mesa comprising active layer · CPC title
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