Fixed position controller and method

Patent metadata

Field	Value
Publication number	US-10031083-B2
Application number	US-201415518341-A
Country	US
Kind code	B2
Filing date	Oct 16, 2014
Priority date	Oct 16, 2014
Publication date	Jul 24, 2018
Grant date	Jul 24, 2018

Abstract

The purpose of the present invention is to control, with a simple structure and high accuracy, irradiation of excitation light to a multi-nanopore substrate without interrupting a measurement. Irradiation of excitation light is performed concurrently to at least one nanopore and at least one reference object on a substrate mounted in an observation container 103. A position irradiated with the excitation light in a measurement sample is calculated on the basis of a signal generated from the reference object detected by a detector 109, and the measurement and a fixed position control is performed concurrently by performing measurement of the measurement object while a drive control part 115 controlling the position of the irradiation of the excitation light to the measurement sample on the basis of the calculation result, whereby an analysis of the measurement sample can be performed in a short time.

First claim

The invention claimed is:

1. A fixed position controller comprising:
an irradiation optical system that is capable of performing simultaneous irradiation with a plurality of beams of excitation light;
a detector that detects a signal generated from an irradiation position through irradiation with the excitation light;
a substrate that is provided with at least one nanopore and at least one reference object; and
a position control unit that calculates a position at which a measurement sample is irradiated with the excitation light, in response to the signal acquired from the reference object when the measurement sample positioned in the nanopore and the reference object are simultaneously irradiated with the excitation light, and that controls a position of the irradiation on the measurement sample with the excitation light based on corresponding calculation results,
wherein the measurement sample is measured while the position of the irradiation with the excitation light is controlled.

2. The fixed position controller according to claim 1 ,
wherein the signal generated through the irradiation with the excitation light means Raman scattered light or fluorescence.

3. The fixed position controller according to claim 1 ,
wherein a position of the detector or information of an image element of the detector is corrected using a spectrum of the reference object, which is generated through the irradiation with the excitation light.

4. The fixed position controller according to claim 1 ,
wherein the reference object has a diameter which is smaller than that of the measurement sample.

5. The fixed position controller according to claim 1 ,
wherein the reference object is irradiated with excitation light having a spot diameter which is smaller than a spot diameter of the excitation light with which the measurement sample is irradiated.

6. The fixed position controller according to claim 1 ,
wherein, when the spot diameter of the excitation light is smaller than those of the measurement sample and the reference object, the spot diameter of the excitation light to the reference object is larger than the spot diameter of the excitation light to the measurement sample.

7. The fixed position controller according to claim 1 ,
wherein the measurement sample is a biomolecule, and
wherein the reference object is formed of a silicon single crystal, molybdenum oxide, tungsten oxide, aluminum oxide, zinc oxide, tin oxide, titanium oxide, or silicon carbide.

8. The fixed position controller according to claim 1 ,
wherein the position control unit
scans the spot position of the excitation light with respect to both positions of the measurement sample and the reference object, and
calculates a position on the measurement sample which is intensively irradiated with the excitation light, in response to the signal acquired from the reference object, and controls the spot position on the measurement sample at a desirable position based on the calculation results.

9. The fixed position controller according to claim 8 ,
wherein the position control unit
detects a predetermined temperature change, then starts to scan the spot position of the excitation light, and controls the spot position at the desirable position.

10. The fixed position controller according to claim 1 ,
wherein the position control unit
calculates a drift amount and a drift direction in response to information of the position and signal intensity of the reference object obtained in advance and an increase and decrease in the signal acquired from the reference object, and controls the spot position at a desirable position.

11. A fixed position control method comprising:
simultaneously irradiating at least one nanopore and at least one reference object in a substrate with excitation light;
calculating a position at which a measurement sample is irradiated with the excitation light, based on a signal which is generated from the reference object and is detected by a detector; and
measuring the measurement object, while controlling a position of the irradiation on the measurement sample with the excitation light, based on corresponding calculation results.

12. The fixed position control method according to claim 11 ,
wherein the signal generated through the irradiation with the excitation light means Raman scattered light or fluorescence.

13. The fixed position control method according to claim 11 , further comprising:
scanning the spot position of the excitation light with respect to both positions of the measurement sample and the reference object, and
calculating a position at which the measurement sample is intensively irradiated with the excitation light, in response to the signal acquired from the reference object, and controlling the spot position on the measurement sample at a desirable position based on the calculation results.

14. The fixed position control method according to claim 13 , further comprising:
detecting a predetermined temperature change, then starting to scan the spot position of the excitation light, and controlling the spot position at the desirable position.

15. The fixed position control method according to claim 11 , further comprising:
calculating a drift amount and a drift direction in response to information of the position and signal intensity of the reference object, which is acquired in advance, and an increase and decrease in the signal acquired from the reference object, and controlling the spot position at a desirable position.

Assignees

• Hitachi High Tech Corp

Inventors

• Fujioka Michiru
• Sonehara Tsuyoshi
• Itabashi Naoshi

Classifications

• G01Q60/22

  Probes, their manufacture, or their related instrumentation, e.g. holders · CPC title

• G11B7/22

  Apparatus or processes for the manufacture of optical heads, e.g. assembly · CPC title

• G11B7/1387

  using the near-field effect · CPC title

• G01N33/48721

  Investigating individual macromolecules, e.g. by translocation through nanopores (Coulter counters in general G01N15/12; fabrication methods for nanoscale apertures B81B1/00; sequencing of nucleic acids C12Q1/68) · CPC title

• G11B7/08576

  Swinging-arm positioners · CPC title