Electronic component, method for producing same, and sealing material paste used in same

Patent metadata

Field	Value
Publication number	US-10026923-B2
Application number	US-201715635893-A
Country	US
Kind code	B2
Filing date	Jun 28, 2017
Priority date	Jul 30, 2012
Publication date	Jul 17, 2018
Grant date	Jul 17, 2018

Abstract

An electronic component has an organic member between two transparent substrates, in which outer peripheral portions of the two transparent substrates are bonded by a sealing material containing low melting glass. The low melting glass contains vanadium oxide, tellurium oxide, iron oxide and phosphoric acid, and satisfies the following relations (1) and (2) in terms of oxides. The sealing material is formed of a sealing material paste which contains the low melting glass, a resin binder and a solvent, the low melting glass containing vanadium oxide, tellurium oxide, iron oxide and phosphoric acid, and satisfies the following relations (1) and (2) in terms of the oxides. Thereby, thermal damages to an organic element or an organic material contained in the electronic component can be reduced and an electronic component having a glass bonding layer of high reliability can be produced efficiently.

V 2 O 5 +TeO 2 +Fe 2 O 3 +P 2 O 5 ≥90 (mass %)  (1)

V 2 O 5 >TeO 2 >Fe 2 O 3 >P 2 O 5 (mass %)  (2)

First claim

The invention claimed is:

1. An electronic component having an organic member between two transparent substrates, in which outer peripheral portions of the two transparent substrates are bonded by a sealing material containing a low melting glass,
wherein the low melting glass contains vanadium oxide, tellurium oxide, iron oxide and phosphorous oxide, and satisfies the following relations (1) and (2) in terms of oxides
V 2 O 5 +TeO 2 +Fe 2 O 3 +P 2 O 5 ≥90 (mass %)  (1)

V 2 O 5 >TeO 2 >Fe 2 O 3 >P 2 O 5 (mass %).  (2)

2. The electronic component according to claim 1 ,
wherein the low melting glass further contains one or more of tungsten oxide, molybdenum oxide, manganese oxide, zinc oxide, barium oxide, strontium oxide and calcium oxide, and satisfies the following relation (3) in terms of oxides
WO 3 +MoO 3 +MnO 2 +ZnO+BaO+SrO+CaO≤10 mass %.  (3).

3. The electronic component according to claim 1 ,
wherein the low melting glass contains 35 to 50 mass % of V 2 O 5 , 20 to 35 mass % of TeO 2 , 10 to 20 mass % of Fe 2 O 3 , and 4 to 15 mass % of P 2 O 5 in terms of oxides.

4. The electronic component according to claim 1 ,
wherein the low melting glass contained in the sealing material is softened and fluidized by an irradiation of a laser at a wavelength in a range from 400 to 1100 nm to the sealing material.

5. The electronic component according to claim 1 ,
wherein the low melting glass has a transition point of 350° C. or lower and a softening point of 410° C. or lower.

6. The electronic component according to claim 1 ,
wherein the low melting glass has a heat expansion coefficient of 100×10 −7 /° C. or less at 30 to 250° C.

7. The electronic component according to claim 1 ,
wherein the sealing material contains filler particles and the filler particles are one or more of zirconium phosphotungstate (Zr 2 (WO 4 )(PO 4 ) 2 ), niobium oxide (Nb 2 O 5 ) and β-eucryptite (LiAlSiO 4 ).

8. The electronic component according to claim 7 ,
wherein the filler particles are zirconium phosphotungstate (Zr 2 (WO 4 )(PO 4 ) 2 ) and further contain iron tungstate (FeWO 4 ) and zirconium phosphate (ZrO(PO 4 ) 2 ).

9. The electronic component according to claim 7 ,
wherein a content of the filler particles is greater than zero and less than or equal to 35 parts by volume based on 100 parts by volume of the low melting glass.

10. The electronic component according to claim 1 ,
wherein the thickness of the sealing material that bonds the outer peripheral portions of the two transparent substrates is 20 μm or less.

11. The electronic component according to claim 1 ,
wherein a distance between the two transparent substrates is 100 μm or more, the outer peripheral portions of the two transparent substrates are bonded by the sealing material with a spacer, and a thickness of the sealing material which bonds each of the two transparent substrates and the spacer is 20 μm or less.

12. The electronic component according to claim 11 ,
wherein the transparent substrate and the spacer are made of a glass or a resin.

Assignees

• Hitachi Chemical Co Ltd

Inventors

• Naito Takashi
• Tachizono Shinichi
• Yoshimura Kei
• Hashiba Yuji
• Kodama Motomune
• Miyagi Masanori
• Aoyagi Takuya
• Sawai Yuichi
• Fujieda Tadashi
• Tsukamoto Takeshi
• Murakami Hajime

Classifications

• H10W74/473

  containing a filler · CPC title

• C08K3/0033

  Chemistry & Metallurgy · mapped topic

• H01L51/5246 Primary

  Electricity · mapped topic

• C08K2201/008

  Additives improving gas barrier properties · CPC title

• H01L51/448

  Electricity · mapped topic