Magnetic-characteristics detection device
US-2016071350-A1 · Mar 10, 2016 · US
US10026495B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10026495-B2 |
| Application number | US-201715606910-A |
| Country | US |
| Kind code | B2 |
| Filing date | May 26, 2017 |
| Priority date | May 30, 2016 |
| Publication date | Jul 17, 2018 |
| Grant date | Jul 17, 2018 |
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A method of controlling a magnetization state using an imprinting technique may be provided. The method may include moving first and second magnetic structures, which have different magnetization states, toward each other and changing a magnetization state of the first or second magnetic structure, when a distance between the first and second magnetic structures is reduced. A magnetic field, which is produced by a magnetization state of one of the first and second magnetic structures, may be used to align a magnetization state of the other, when the magnetization state of the first or second magnetic structure is changed.
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What is claimed is: 1. A method of controlling a magnetization state using an imprinting technique, the method comprising: moving a first magnetic structure and a second magnetic structure toward each other, the first and second magnetic structures having different magnetization states; changing a magnetization state of the first or second magnetic structure when a distance between the first and second magnetic structures is reduced; and using a magnetic field produced by a magnetization state of one of the first and second magnetic structures to align a magnetization state of another of the first and second magnetic structures when the magnetization state of the first or second magnetic structure is changed, wherein, when the first magnetic structure or the second magnetic structure has a patterned shape, the magnetization state of the first magnetic structure or the second magnetic structure is changed at a portion, in which the first and second magnetic structures are adjacent to or overlapped with each other. 2. The method of claim 1 , wherein moving the first and second magnetic structures toward each other comprises moving the first and second magnetic structures to be spaced apart from each other by a distance close to a size of an atom or to be overlapped with each other. 3. The method of claim 1 , wherein, when the first magnetic structure has a coercive force that is relatively stronger than that of the second magnetic structure, the magnetization state of the second magnetic structure is changed by the first magnetic structure. 4. The method of claim 1 , wherein, when the second magnetic structure has a coercive force that is relatively stronger than that of the first magnetic structure, the magnetization state of the first magnetic structure is changed by the second magnetic structure. 5. The method of claim 1 , wherein the first magnetic structure and the second magnetic structure are in a form of a thin film. 6. The method of claim 1 , comprising moving the first and second magnetic structures away from each other when the changing of the magnetization state of the first or second magnetic structure is finished. 7. A method of controlling a magnetization state using an imprinting technique, the method comprising: moving a first magnetic structure and a second magnetic structure toward each other, the first and second magnetic structures having different magnetization states; changing a magnetization state of the first or second magnetic structure when a distance between the first and second magnetic structures is reduced; using a magnetic field produced by a magnetization state of one of the first and second magnetic structures to align a magnetization state of another of the first and second magnetic structures when the magnetization state of the first or second magnetic structure is changed; and applying a magnetic field to each of the first and second magnetic structures, before the moving of the first and second magnetic structures toward each other, wherein the applying of the magnetic field is performed to change a magnetization state of the first magnetic structure and a magnetization state of the second magnetic structure to allow the first and second magnetic structures to have different magnetization directions. 8. The method of claim 7 , wherein the first magnetic structure and the second magnetic structure are in a form of a thin film.
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