Protective device with self-test

Patent metadata

Field	Value
Publication number	US-10020649-B2
Application number	US-201514806991-A
Country	US
Kind code	B2
Filing date	Jul 23, 2015
Priority date	Jul 23, 2015
Publication date	Jul 10, 2018
Grant date	Jul 10, 2018

Abstract

A protective electrical wiring device includes a protective assembly including a sensor portion, a fault detection portion and a switch portion. A control circuit is configured to automatically perform a test cycle from time to time, each test cycle including a series of tests that determine the operational state of the protective assembly. At least one successive test in the test cycle is configured to test at least a portion of the protective assembly tested by a predecessor test in the test cycle. The control circuit is configured to establish a test result for each test in the series of tests, with each test result being stored in a test result table. The control circuit is configured to effect or not effect an end-of-life state by evaluating at least a portion of the test results in the test result table in accordance with a predetermined voting scheme.

First claim

What is claimed is:

1. A protective electrical wiring device comprising:
a plurality of line terminals and a plurality of load terminals configured to be coupled to an AC electrical distribution system;
a protective assembly including a sensor portion, a fault detection portion and a switch portion, the sensor portion being configured to provide at least one sensor signal corresponding to electrical signals propagating on the plurality of line terminals or the plurality of load terminals, the fault detection portion being configured to provide a detector output signal when the at least one sensor signal exceeds a predetermined threshold, the switch portion including a conditioning circuit coupled to a switch element, the conditioning circuit generating a control voltage signal in response to the detector output signal, the switch element being configured to turn ON when the control voltage signal is greater than or equal to a switch actuation threshold; and
a control circuit configured to automatically perform a test cycle from time to time, each test cycle comprising a series of tests that determine the operational state of the protective assembly, at least one successive test in the test cycle being configured to test at least a portion of the protective assembly tested by a predecessor test in the test cycle, the control circuit being configured to establish a test result for each test in the series of tests, each test result being stored in a test result table, the control circuit being configured to effect or not effect an end-of-life state by evaluating at least a portion of the test results in the test result table in accordance with a predetermined voting scheme.

2. The device of claim 1 , wherein the test result table includes test results from a plurality of test cycles, the predetermined voting scheme allowing at least one predetermined pattern of test failures to occur for each test in the series of tests within a predetermined number of test cycles before the control circuit effects the end-of-life state.

3. The device of claim 1 , wherein the predetermined voting scheme provides a predetermined number of allowable aggregate test table failures to occur within a predetermined number of test cycles, the control circuit being configured to effect the end-of-life state when an aggregate number of test failures in the test table is greater than or equal to the predetermined number of allowable aggregate test table failures.

4. The device of claim 3 , wherein the control circuit is configured to effect the end-of-life state based on the aggregate number of test failures even when a number of tests failures attributable to each individual test in the series of tests is less than a failure number required by the predetermined voting scheme.

5. The device of claim 1 , wherein a predetermined number of allowable test failures for one test in the series of tests is different than a predetermined number of allowable column test failures for another test in the series of tests.

6. The device of claim 5 , wherein the predetermined number of allowable test failures for the one test are for a first predetermined number of cycles and the predetermined number of allowable column test failures for the other test are for a second predetermined number of cycles.

7. The device of claim 1 , wherein the control circuit is configured to generate a recurring test signal in a first test of the series of tests, the sensor portion and the fault detection portion being operational if the conditioning circuit provides the control voltage signal in response to the recurring test signal, the control circuit terminating the recurring test signal when the control voltage signal reaches a test acceptance voltage, the control circuit storing a first test result in the test result table indicative of whether the control voltage signal reaches the test acceptance voltage within a predetermined time frame.

8. The device of claim 1 , wherein the fault detection portion includes a delay filter that delays the detector output signal with respect to the at least one sensor signal.

9. The device of claim 8 , wherein the fault detection portion includes a comparator that compares an amplified sensor signal to a reference signal, the delay filter being coupled to the output of the comparator.

10. The device of claim 1 , further comprising a housing including a front cover portion and a back body portion, the front cover portion including a user accessible portion having a manual test control input, a manual reset control input and at least one indicator portion, the at least one indicator portion providing at least one of a reset state, a trip state, or an operational status.

11. The device of claim 1 , wherein the plurality of load terminals includes receptacle load terminals and feed-through load terminals that are decoupled in a tripped state.

12. The device of claim 1 , further comprising a circuit interrupter disposed between the plurality of line terminals and the plurality of load terminals, the circuit interrupter coupling the plurality of line terminals and the plurality of load terminals in a reset state and decoupling the plurality of line terminals and the plurality of load terminals in a tripped state, the tripped state being effected when the control voltage signal reaches the switch actuation threshold or when the control circuit effects the end-of-life state.

13. The device of claim 12 , wherein the protective electrical wiring device is configured to drive the circuit interrupter into the tripped state only during a predetermined half cycle polarity of the AC voltage source, and wherein the control circuit is configured to test the sensor portion or fault detection portion for an end-of-life condition in the predetermined half cycle polarity of the AC voltage source.

14. The device of claim 1 , wherein the control circuit is configured to provide a second recurring test signal in place of the detector output signal in a second test of the series of tests, the second recurring test signal driving the conditioning circuit to provide a control voltage signal that is greater than or equal to the switch actuation threshold if the conditioning circuit is in an operational state, the switch element being configured to turn ON in response to the control voltage signal if the switch element is in an operational state, the control circuit storing a second test result in the test table indicative of whether the switch element turned ON within a second predetermined time frame.

15. The device of claim 14 , further comprising a circuit interrupter assembly disposed between the plurality of line terminals and the plurality of load terminals, the circuit interrupter assembly including a solenoid coil coupled to an AC power source in the AC electrical distribution system, the solenoid coil being energized to trip the circuit interrupter assembly when the switch element is turned ON during a fault detection mode, the solenoid coil not being energized to trip the circuit interrupter assembly when the switch element is turned ON during the second test.

16. The device of claim 15 , further comprising a second switch element disposed in series between the switch element and the solenoid coil, the second switch element preventing the switch element from energizing the solenoid coil during the second test.

17. The device of claim 16 , wherein the second switch element includes a diode.

18. The device of claim 16 , wherein the control circuit is configured to monitor a switch voltage of the switch element during a th

Assignees

• Pass & Seymour Inc

Inventors

• Du Hai Hu

Classifications

• H02H3/335 Primary

  the main function being self testing of the device · CPC title

• H02H9/041

  using a short-circuiting device · CPC title