Sensor circuit for detecting rotation of an object and method therefor

Patent metadata

Field	Value
Publication number	US-10018654-B2
Application number	US-201414533742-A
Country	US
Kind code	B2
Filing date	Nov 5, 2014
Priority date	Nov 13, 2013
Publication date	Jul 10, 2018
Grant date	Jul 10, 2018

Abstract

In one embodiment, a sensor circuit may include a first receiver circuit that may be configured to receive a first signal that is representative of a first mutual inductance and form a first detection signal that is representative of the first mutual inductance, wherein the first variable mutual inductance varies in response to a position of a metal object. An embodiment may include a second receiver circuit configured to receive a second signal that is representative of a second mutual inductance and form a second detection signal that is representative of the second mutual inductance, wherein the second mutual inductance varies in response to the position of the metal object. In an embodiment, the sensor circuit may include a recognition circuit configured to assert a movement detected signal responsively to a first value of the first detection signal, configured to assert a movement direction signal responsively to a first value of the second detection signal.

First claim

The invention claimed is:

1. A device for detecting rotation of an object comprising:
a semiconductor device having a sensor circuit that includes a signal generator configured to generate an excitation signal;
a first terminal of the sensor circuit configured to couple the excitation signal to an excitation element wherein the excitation element is configured to be substantially fixed both positionally and rotationally such that the excitation element is non-rotating;
a first demodulator of the sensor circuit configured to receive the excitation signal and to receive a first receiver signal from a first receiver sensor wherein the first receiver sensor is substantially fixed positionally and rotationally relative to the excitation element and wherein the first receiver signal is representative of a first mutual inductance that is formed between the excitation element and the first receiver sensor, the first demodulator configured to form a first detection signal that is representative of the first mutual inductance;
a second demodulator of the sensor circuit configured to receive the excitation signal and to receive a second receiver signal from a second receiver sensor wherein the second receiver sensor is substantially fixed positionally and rotationally relative to the excitation element and wherein the second receiver signal is representative of a second mutual inductance that is formed between the excitation element and the second receiver sensor, the second demodulator configured to form a second detection signal that is representative of the second mutual inductance;
the sensor circuit configured to assert a rotation detected signal responsively to a difference between the first detection signal and a first reference signal; and
the sensor circuit configured to assert a rotation direction signal responsively to a difference between the second detection signal and an adaptable reference signal.

2. The device of claim 1 further including a first comparator configured to receive the first detection signal and the first reference signal and form the rotation detected signal on an output of the first comparator.

3. The device of claim 2 further including a second comparator configured to receive the second detection signal and the adaptable reference signal and form the rotation direction signal on an output of the second comparator.

4. The device of claim 1 wherein the excitation element has a first geometric shape and the first receiver sensor has a second geometric shape that is substantially a twisted image of the first geometric shape.

5. The device of claim 4 wherein the second receiver sensor has a third geometric shape that is substantially a twisted image of the second geometric shape.

6. The device of claim 1 wherein the first demodulator is configured to remove an a.c. component of the excitation signal from the first receiver signal.

7. The device of claim 6 wherein the signal generator is configured to form an a.c. signal having a frequency that is greater than a first frequency at which the first mutual inductance varies and greater that a second frequency at which the second mutual inductance varies and wherein the a.c. component removed by the first demodulator corresponds the a.c. signal.

8. The device of claim 1 wherein the second demodulator is configured to remove an a.c. component of the excitation signal from the second receiver signal.

9. The device of claim 1 wherein an adaptable reference circuit forms an average signal that is substantially an average value of the second detection signal and forms the adaptable reference signal substantially equal to the average signal.

10. A method of forming a sensor circuit comprising:
forming the sensor circuit to excite an excitation element with an excitation signal is wherein the excitation element is substantially fixed and non-moving both rotationally and positionally;
forming the sensor circuit to receive a first receiver signal from a first receiver sensor and form a first detection signal wherein the first detection signal has a magnitude that increases in response to a metal object moving from distal to the first receiver sensor to proximal to a first portion of the first receiver sensor, wherein the magnitude of the first detection signal decreases in response to the metal object moving one of rotationally or substantially tangentially toward substantially a center of the first receiver sensor wherein the first receiver sensor is substantially fixed both rotationally and positionally relative to the excitation element and wherein the metal object moves relative to the excitation element;
configuring the sensor circuit to assert a rotation detection signal responsively to a first value of the first detection signal;
forming the sensor circuit to receive a second receiver signal from a second receiver sensor and form a second detection signal wherein the second detection signal has a minimum value in response to the metal object in a position substantially centered to the second receiver sensor, and has a greater value in response to the metal object having a position distal from the center of the second receiver sensor; and
configuring the sensor circuit to assert a rotation direction signal responsively to a first value of the second detection signal.

11. The method of claim 10 further including configuring an adaptable reference circuit to form an adaptable reference signal having a value that is a percentage of a difference between the greater value of the second detection signal and the minimum value of the second detection signal wherein the first value of the second detection signal is substantially equal to the value of the adaptable reference signal.

12. The method of claim 10 further including configuring an adaptable reference circuit to form an adaptable reference signal having a value that is an average of a maximum value and the minimum value of the second detection signal wherein the first value of the second detection signal is substantially equal to the value of the adaptable reference signal.

13. The method of claim 10 further including configuring the sensor circuit to form the first detection signal to include a minimum value in response to the metal object in a position substantially centered to the first receiver sensor and in response to the metal object being distal to the first receiver sensor.

14. The method of claim 10 further including configuring the sensor circuit to form the first detection signal to correspond to a mutual inductance formed between the first receiver sensor and an excitation element and to form the second detection signal to correspond to another mutual inductance formed between the second receiver sensor and the excitation element.

15. A sensor circuit comprising:
a first receiver circuit configured to receive a first signal that is representative of a first variable mutual inductance between an excitation element and a first sensor element and form a first detection signal that is representative of the first variable mutual inductance, wherein the first variable mutual inductance varies in response to a position of a metal object and wherein the first sensor element is substantially fixed in position relative to the excitation element so that the excitation element is axially coextensive with the first sensor element and is fixed rotationally with the first sensor element;
a second receiver circuit configured to receive a second signal that is representative of a second variable mutual inductance between the excitation element and a second sensor element and form a second detection signa

Assignees

• Semiconductor Components Ind Llc

Inventors

• Bertin Jacques

Classifications

• G01R3/00 Primary

  Apparatus or processes specially adapted for the manufacture {or maintenance} of measuring instruments {, e.g. of probe tips} · CPC title

• Y10T29/49117

  Conductor or circuit manufacturing · CPC title

• G01R33/0017 Primary

  Means for compensating offset magnetic fields or the magnetic flux to be measured; Means for generating calibration magnetic fields · CPC title

• G01D5/2258

  by a movable ferromagnetic element, e.g. core · CPC title

• G01D5/2266

  specially adapted circuits therefor · CPC title