Density measurement using a piezoelectric sensor in a non-compressible medium

US10018034B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10018034-B2
Application numberUS-201414203203-A
CountryUS
Kind codeB2
Filing dateMar 10, 2014
Priority dateMar 10, 2014
Publication dateJul 10, 2018
Grant dateJul 10, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A system, method and apparatus for determining a parameter of a fluid is disclosed. Measurements are obtained of a temperature of the fluid and a pressure of the fluid. A material is disposed in the fluid, and an actuator applies a stimulation pulse at a selected frequency to the material to generate an oscillation in the material. A measurement device measures a parameter of oscillation of the material in response to the stimulation pulse, the parameter of oscillation being affected by the fluid in which the material is disposed. A processor determines the parameter of the fluid from the measured parameter of the oscillation, the temperature measurement and the pressure measurement.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method of operating a production system, comprising: obtaining a measurement of a temperature of the fluid; obtaining a measurement of a pressure of the fluid; determining a self-resonance frequency of a sensor at the temperature and pressure of the fluid; selecting a stimulation frequency for a stimulation pulse that avoids the self-resonance frequency, wherein the stimulation frequency is inversely proportional to a duration of the stimulation pulse; applying the stimulation pulse to the sensor disposed in the fluid to deform the sensor from an equilibrium state; removing the stimulation pulse from the sensor to allow the sensor to relax back to its equilibrium state wherein the stimulation frequency is selected to avoid a self-resonance frequency of the sensor by about 5 octaves; determining a parameter of oscillation of the relaxation of the sensor; determining the parameter of the fluid from the determined parameter of the oscillation, the obtained measurement of the temperature and the obtained measurement of the pressure; and changing the parameter of the fluid to improve a flow of the fluid in the production system. 2. The method of claim 1 , wherein applying the stimulation pulse further comprises applying a low-frequency stimulation pulse and a high-frequency stimulation pulse, wherein the frequency of the low-frequency stimulation is less than a self-resonance frequency of the sensor and the frequency of the high-frequency stimulation pulse is greater than the self-resonance frequency of the sensor. 3. The method of claim 1 , wherein the parameter of oscillation further comprises at least one of: (i) a frequency of the oscillation; (ii) an amplitude of the oscillation; and (iii) a decay rate of the oscillation. 4. The method of claim 1 , wherein the sensor includes a piezoelectric material and obtaining the parameter of oscillation further comprises measuring an electrical signal generated by oscillation of the piezoelectric material in response to the applied stimulation pulse. 5. The method of claim 1 , wherein the parameter of the fluid further comprises at least one of: (i) a density of the fluid; and (ii) a composition of the fluid. 6. The method of claim 1 , further comprising determining the parameter of the fluid by performing one selected from the group consisting of: (i) using the determined parameter of the oscillation, the obtained measurement of the temperature and the obtained measurement of the pressure in a look-up table; and (ii) performing a calculation using the determined parameter of the oscillation, the obtained measurement of the temperature and the obtained measurement of the pressure. 7. The method of claim 1 , wherein the fluid is a production fluid obtained from a formation. 8. A production system, comprising: a pressure sensor configured to obtain a measurement of a pressure of a fluid; a temperature sensor configured to obtain a measurement of a temperature of the fluid; a material disposed in the fluid, an actuator configured to apply a stimulation pulse to the material to deform the material from an equilibrium state and to remove the stimulation pulse from the material to allow the material to relax back to its equilibrium state, wherein a frequency of the stimulation pulse is inversely proportional to a duration of the stimulation pulse and is selected to avoid a self-resonance frequency in the material by about 5 octaves; a measurement device configured to measure a parameter of oscillation of the relaxation of the material; and a processor configured to: determine the self-resonance frequency of the material at the temperature and pressure of the fluid, select the frequency of the stimulation pulse to avoid the self-resonance frequency, control the actuator to apply the stimulation pulse to the material, determine the parameter of the fluid from the measured parameter of the oscillation, the obtained measurement of the temperature and the obtained measurement of the pressure and change a parameter of the production system to correspond to the parameter of the fluid, and change the parameter of the fluid to improve a flow of the fluid in the production system. 9. The system of claim 8 , wherein the actuator is configured to apply a low-frequency stimulation pulse to the material having a frequency less than the self-resonance frequency of the material and a high-frequency stimulation pulse to the material having a frequency of the greater than the self-resonance frequency of the material. 10. The system of claim 8 , wherein the parameter of oscillation further comprises at least one of: (i) a frequency of the oscillation; (ii) an amplitude of the oscillation; and (iii) a decay rate of the oscillation. 11. The system of claim 8 , wherein the material is a piezoelectric material and the measurement device is configured to measure an electrical signal generated by oscillation of the piezoelectric material. 12. The system of claim 8 , wherein the parameter of the fluid further comprises at least one of: (i) a density of the fluid; and (ii) a composition of the fluid. 13. The system of claim 8 , wherein the processor is further configured to determine the parameter of the fluid by performing one selected from the group consisting of: (i) using the determined parameter of the oscillation, the obtained measurement of the temperature and the obtained measurement of the pressure in a look-up table; and (ii) performing a calculation using the measured parameter of the oscillation, the obtained measurement of the temperature and the obtained measurement of the pressure. 14. The system of claim 8 , wherein the fluid is a production fluid obtained from a formation. 15. A production system, comprising: a member for providing flow of a fluid from a formation; a pressure sensor configured to obtain a measurement of a pressure of the fluid in the member; a temperature sensor configured to obtain a measurement of a temperature of the fluid in the member; a material disposed in the member and submerged in the fluid, an actuator configured to apply a stimulation pulse to the material to deform the material from an equilibrium state and remove the stimulation pulse from the sensor to allow the sensor to relax back to its equilibrium state, wherein a frequency of the stimulation pulse is inversely proportional to a duration of the stimulation pulse and is selected to avoid a self-resonance frequency in the material by about 5 octaves; a measurement device configured to measure a parameter of oscillation of the relaxation of the material; and a processor configured to: determine the self-resonance frequency of the material at the temperature and pressure of the fluid, select the frequency of the stimulation pulse to avoid the self-resonance frequency, control the actuator to apply the stimulation pulse to the material, determine the parameter of the fluid from the measured parameter of the oscillation, the obtained measurement of the temperature and the obtained measurement of the pressure and change a parameter of the production system to correspond to the parameter of the fluid, and change the parameter of the fluid to improve a flow of the fluid in the production system. 16. The production system of claim 15 , wherein the actuator is configured to apply a low-frequency stimulation pulse to the material having a frequency less than the self-resonance frequency of the material and a high-frequency stimulation pulse to the material having a frequency of the greater than the self-resonance frequency of the sens

Assignees

Inventors

Classifications

  • using piezoelectric gauges · CPC title

  • vibrating tube, tuning fork · CPC title

  • Methods or apparatus for controlling the flow of the obtained fluid to or in wells (E21B43/25 takes precedence; valve arrangements E21B34/00) · CPC title

  • E21B47/10Primary

    Locating fluid leaks, intrusions or movements · CPC title

  • using variation of the resonant frequency of an element vibrating in contact with the material submitted to analysis (G01N9/34 takes precedence) · CPC title

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What does patent US10018034B2 cover?
A system, method and apparatus for determining a parameter of a fluid is disclosed. Measurements are obtained of a temperature of the fluid and a pressure of the fluid. A material is disposed in the fluid, and an actuator applies a stimulation pulse at a selected frequency to the material to generate an oscillation in the material. A measurement device measures a parameter of oscillation of the…
Who is the assignee on this patent?
Chronister Vernon, Baker Hughes A Ge Co Llc
What technology area does this patent fall under?
Primary CPC classification E21B47/10. Mapped technology areas include Fixed Constructions.
When was this patent published?
Publication date Tue Jul 10 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).