Probe and manufacturing method thereof

Patent metadata

Field	Value
Publication number	US-10016179-B2
Application number	US-201514833011-A
Country	US
Kind code	B2
Filing date	Aug 21, 2015
Priority date	Dec 26, 2014
Publication date	Jul 10, 2018
Grant date	Jul 10, 2018

Abstract

A probe includes: a piezoelectric layer to generate ultrasonic waves, a backing layer to absorb ultrasonic waves generated at the piezoelectric layer and proceeding toward a rear, a reflective layer occupying an area smaller than an area of the piezoelectric layer and provided in between the piezoelectric layer and the backing layer to amplify the ultrasonic waves generated at the piezoelectric layer, and a lens layer to focus the ultrasonic waves proceeding toward a front of the piezoelectric layer at a certain point.

First claim

What is claimed is:

1. A probe, comprising:
a piezoelectric layer to generate ultrasonic waves;
a backing layer to absorb ultrasonic waves generated at the piezoelectric layer and proceeding toward a rear;
a reflective layer occupying an area smaller than an area of the piezoelectric layer and provided in between the piezoelectric layer and the backing layer to amplify the ultrasonic waves generated at the piezoelectric layer; and
a lens layer to focus the ultrasonic waves proceeding toward a front of the piezoelectric layer at a certain point.

2. The probe of claim 1 , wherein:
the reflective layer is configured to be provided at a central portion in an elevation direction of the probe.

3. The probe of claim 1 , wherein:
the reflective layer is configured to be formed of material having am acoustic impedance higher than an acoustic impedance of the piezoelectric layer.

4. The probe of claim 1 , wherein:
the reflective layer is configured to be formed of material having an acoustic impedance 1.5 times higher than an acoustic impedance of the acoustic impedance of the piezoelectric layer.

5. The probe of claim 1 , further comprising:
a matching layer to reduce a difference of acoustic impedances between the piezoelectric layer and a subject.

6. The probe of claim 1 , wherein:
the reflective layer is configured to be provided at a depressed surface of the backing layer.

7. The probe of claim 1 , wherein:
the piezoelectric layer and the reflective layer are configured to be provided at the depressed surface of the backing layer.

8. The probe of claim 1 , wherein:
the reflective layer is configured to occupy a shorter length in the elevation direction than a length of the piezoelectric layer.

9. The probe of claim 1 , wherein:
the piezoelectric layer, the backing layer, the reflective layer, and the lens layer each is configured to be provided with both end portions thereof symmetrical to each other about a central portion of the probe having a length in the elevation direction.

Assignees

• Samsung Medison Co Ltd

Inventors

• Ko Jong-Sun
• Kim Ki Soo
• Ko Hyun Phill
• Kim Yong Jae
• Akramov Saidmurod
• Lee Jong Mok

Classifications

• B06B1/067

  which is used as, or combined with, an impedance matching layer · CPC title

• A61B8/4444 Primary

  related to the probe · CPC title

• A61B8/00 Primary

  Diagnosis using ultrasonic, sonic or infrasonic waves · CPC title

• A61B8/4272

  involving the acoustic interface between the transducer and the tissue · CPC title

• G01N29/24

  Probes {(transducers for acoustic waves B06B, G10K; for measuring G01H)} · CPC title