High frequency time domain reflectometry probing system

Patent metadata

Field	Value
Publication number	US-10012686-B2
Application number	US-201615236783-A
Country	US
Kind code	B2
Filing date	Aug 15, 2016
Priority date	Aug 15, 2016
Publication date	Jul 3, 2018
Grant date	Jul 3, 2018

Abstract

A probe includes a self-aligning connector set, a moveable probe tip, a cable, a housing, and a spring. When the probe tip is pressed to a test point on a device-under-test, the probe tip moves within the housing to cause a first connector and a second connector of the self-aligning connector set to be connected through an adapter of the self-aligning connector set, thereby establishing a signal path through the probe. The first connector, second connector, and adapter are structured so that their respective ground conductors become connected prior to their respective signal conductors becoming connected. Electro-static charge present at the test point is safely discharged through a resistor to ground before the signal path through the probe is established, thereby preventing damage to the probe and connected host instrument. When the probe tip is removed from the device-under-test, the spring forces a disconnection of the first and second connectors.

First claim

What is claimed is:

1. A probe comprising:
a self-aligning connector set comprising a first connector, a second connector, and an adapter structured to be capable of connecting the first and second connectors;
a probe tip having a first end and a second end, the probe tip structured to provide an electrical path between a device-under-test contact disposed at the first end and the first connector disposed at the second end;
a cable having a first end and a second end, the first end being coupled to the second connector, and the second end being adapted for connecting to a host instrument;
a housing, in which the probe tip moves to cause the first and second connectors to be connected through the adapter when the probe is probing a device under test; and
a spring structured to cause the first and second connectors to be disconnected when the probe is not probing a device under test.

2. The probe according to claim 1 in which the first connector, the second connector, and the adapter of the self-aligning connector set each have a ground conductor and a signal conductor, and are each structured so that when the adapter connects the first and second connectors the respective ground conductors make electrical contact prior to the respective signal conductors making electrical contact.

3. The probe according to claim 1 in which the self-aligning connector set comprises a Sub-Miniature Push-on Micro (SMPM) Radio Frequency (RF) blind-mate connector set.

4. The probe according to claim 1 in which the adapter is captured and retained by the second connector.

5. The probe according to claim 1 in which the probe tip is exchangeable.

6. The probe according to claim 1 in which the probe tip comprises a printed circuit board.

7. The probe according to claim 6 in which the device-under-test contact comprises edge plating on the first end of the probe tip printed circuit board.

8. The probe according to claim 6 in which the probe tip printed circuit board comprises:
a device-under-test signal contact;
a device-under-test ground contact;
a signal path between the device-under-test signal contact and a signal conductor of the first connector;
a ground path between the device-under-test ground contact and a ground conductor of the first connector; and
a high resistance electro-static discharge resistor coupled between the signal path and the ground path.

9. The probe according to claim 8 in which the device-under-test signal contact and the device-under-test ground contact are arranged to match the spacing of a pair of test points on a device under test.

10. The probe according to claim 8 in which the probe tip printed circuit board further comprises:
a second device-under-test ground contact;
a second ground path between the second device-under-test ground contact and the ground conductor of the first connector; and
a second high resistance electro-static discharge resistor coupled between the signal path and the second ground path;
in which the device-under-test signal contact and the first and second device-under-test ground contacts are arranged to match the pitch of a single-ended ground-signal-ground coplanar waveguide on a device under test.

11. The probe according to claim 1 further comprising a sensing circuit configured to sense a voltage at the device-under-test contact on the probe tip.

12. The probe according to claim 11 in which the sensing circuit comprises:
a comparator having a reference input, a signal input, and an output;
a reference voltage coupled to the reference input of the comparator;
an indicator coupled to the output of the comparator;
a resistor divider network disposed on the probe tip and coupled between the device-under-test contact and a ground node disposed on the probe tip;
a first pickoff connector disposed on the probe tip, the first pickoff connector having a signal conductor coupled to an intermediate node of the resistor divider network; and
a second pickoff connector disposed within the housing, the second pickoff connector being connected to the first pickoff connector and having a signal conductor coupled to the signal input of the comparator.

13. The probe according to claim 12 in which the reference voltage is based on a specified input voltage limit for a host instrument and the indicator is coupled to the output of the comparator so that the indicator indicates when the sensed voltage exceeds the reference voltage.

14. The probe according to claim 12 in which the indicator comprises a light emitting diode.

15. The probe according to claim 12 in which the resistor divider network provides a high resistance electro-static discharge path to the ground node.

16. The probe according to claim 12 in which the first and second pickoff connectors self-align to each other.

17. A probe comprising:
a first self-aligning connector set comprising a first connector, a second connector, and a first adapter structured to be capable of connecting the first and second connectors, each of the first connector, second connector, and first adapter having a respective signal conductor and a ground conductor;
a second self-aligning connector set comprising a third connector, a fourth connector, and a second adapter structured to be capable of connecting the third and fourth connectors, each of the third connector, fourth connector, and second adapter having a respective signal conductor and ground conductor;
a probe tip having a first end and a second end, the probe tip structured to provide a first electrical signal path between a first device-under-test signal contact disposed at the first end and the signal conductor of the first connector disposed at the second end, a second electrical signal path between a second device-under-test signal contact disposed at the first end and the signal conductor of the third connector disposed at the second end, and a ground path between at least one device-under-test ground contact disposed at the first end and at least one of the ground conductors of the first and third connectors;
a first cable having a first end and a second end, the first end being coupled to the second connector, and the second end being adapted for connecting to a host instrument;
a second cable having a first end and a second end, the first end being coupled to the fourth connector, and the second end being adapted for connecting to the host instrument;
a housing, in which the probe tip moves to cause the first and second connectors to be connected through the first adapter, and the third and fourth connectors to be connected through the second adapter, when the probe is probing a device under test; and
a spring structured to cause the first and second connectors to be disconnected, and the third and fourth connectors to be disconnected, when the probe is not probing a device under test.

18. The probe according to claim 17 in which the first connector set and the second connector set are each structured so that when the first adapter connects the first and second connectors, and second adapter connects the third and fourth connectors, the respective ground conductors make electrical contact prior to the respective signal conductors making electrical contact.

19. The probe according to claim 17 , further comprising:
a first high resistance electro-static discharge resistor coupled between the first electrical signal path and the ground path on the probe tip; and
a second high resistance electro-static discharge resistor coupled between the second electrical signal path and t

Assignees

• Tektronix Inc

Inventors

• Rettig John B

Classifications

• G01R31/11 Primary

  using pulse reflection methods · CPC title

• G01R1/06772

  High frequency probes · CPC title

• G01R1/06722 Primary

  Spring-loaded · CPC title

• G01R1/0416

  Connectors, terminals (G01R1/0425 and G01R1/0433 take precedence; with measurement function for battery poles G01R31/364) · CPC title

• G01R1/06738

  related to tip portion · CPC title