Thin film transistor and organic EL display device

US10008611B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10008611-B2
Application numberUS-201515321975-A
CountryUS
Kind codeB2
Filing dateJun 24, 2015
Priority dateJun 26, 2014
Publication dateJun 26, 2018
Grant dateJun 26, 2018

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  1. Title

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  2. Abstract

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  4. Key dates

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  5. First independent claim

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Abstract

Official abstract text for this publication.

A thin film transistor includes: a substrate; an undercoat layer disposed on the substrate; an oxide semiconductor layer formed above the undercoat layer and including at least indium; a gate insulating layer located opposite the undercoat layer with the oxide semiconductor layer being between the gate insulating layer and the undercoat layer; a gate electrode located opposite the oxide semiconductor layer with the gate insulating layer being between the gate electrode and the oxide semiconductor layer; and a source electrode and a drain electrode electrically connected to the oxide semiconductor layer, wherein fluorine is included in a region which is an internal region in the oxide semiconductor layer and is close to the undercoat layer.

First claim

Opening claim text (preview).

The invention claimed is: 1. A thin film transistor comprising: a substrate; an inorganic layer disposed on the substrate; an oxide semiconductor layer formed above the inorganic layer and including at least indium, wherein the oxide semiconductor layer comprises: a first region containing fluorine, and a second region free of fluorine, wherein the first region is between the second region and the inorganic layer; an insulating layer located opposite the inorganic layer with the oxide semiconductor layer being between the insulating layer and the inorganic layer; a gate electrode located opposite the oxide semiconductor layer with the insulating layer being between the gate electrode and the oxide semiconductor layer; and a source electrode and a drain electrode electrically connected to the oxide semiconductor layer. 2. The thin film transistor according to claim 1 , wherein the inorganic layer is an undercoat layer including silicon oxide or silicon oxynitride and is formed on a top surface of the substrate. 3. The thin film transistor according to claim 2 , wherein the inorganic layer is formed by stacking insulating films. 4. The thin film transistor according to claim 1 , wherein the inorganic layer is a layer including amorphous silicon as a main component and is formed on an under surface of the substrate. 5. The thin film transistor according to claim 1 , wherein a fluorine concentration of the first region closer to the inorganic layer in the oxide semiconductor layer is higher than a fluorine concentration of the first region close to the second region. 6. The thin film transistor according to claim 1 , wherein the first region has a fluorine concentration gradient in a thickness direction. 7. The thin film transistor according to claim 1 , wherein the first region has a film thickness of at least 15 nm. 8. The thin film transistor according to claim 1 , wherein the first region has a film thickness of at least 20 nm. 9. The thin film transistor according to claim 1 , wherein a fluorine concentration of the oxide semiconductor layer is higher than a hydrogen concentration of the oxide semiconductor layer. 10. The thin film transistor according to claim 1 , wherein metallic elements included in the oxide semiconductor layer further include at least one of gallium or zinc. 11. An organic EL display device including the thin film transistor according to claim 1 , the organic EL display device comprising: pixels arranged in a matrix; and organic EL elements each formed corresponding to a different one of the pixels, wherein the thin film transistor is a driving transistor which drives the organic EL elements.

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Classifications

  • characterised by the semiconductor material · CPC title

  • within a single semiconductor body or layer in a solid phase; between different semiconductor bodies or layers, both in a solid phase · CPC title

  • between a solid phase and a gaseous phase · CPC title

  • composed of oxides, glassy oxides or oxide-based glasses · CPC title

  • Inorganic materials · CPC title

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What does patent US10008611B2 cover?
A thin film transistor includes: a substrate; an undercoat layer disposed on the substrate; an oxide semiconductor layer formed above the undercoat layer and including at least indium; a gate insulating layer located opposite the undercoat layer with the oxide semiconductor layer being between the gate insulating layer and the undercoat layer; a gate electrode located opposite the oxide semicon…
Who is the assignee on this patent?
Joled Inc
What technology area does this patent fall under?
Primary CPC classification H01L29/7869. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Jun 26 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).