Signal-to-noise metric for annotation guidance, dl model tunability, and robustness
US-2026065666-A1 · Mar 5, 2026 · US
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Yang Hedong patents
Yang Hedong is listed as an inventor on 11 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Yang Hedong |
| Total patents | 11 |
| First publication | Nov 1, 2016 |
| Latest publication | Mar 5, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Noise diagnostics for an electron beam inspection system with swathing
US-12372486-B2 · Jul 29, 2025 · US
Noise diagnostics for an electron beam inspection system with swathing
US-2024068967-A1 · Feb 29, 2024 · US
System and method of fiber location mapping in a multi-beam system
US-2023003615-A1 · Jan 5, 2023 · US
Scanning electron microscope objective lens calibration using X-Y voltages iteratively determined from images obtained using said voltages
US-10790114-B2 · Sep 29, 2020 · US
Unified neural network for defect detection and classification
US-10607119-B2 · Mar 31, 2020 · US
Contour based defect detection
US-10395362-B2 · Aug 27, 2019 · US
Unified neural network for defect detection and classification
US-2019073568-A1 · Mar 7, 2019 · US
Scanning Electron Microscope Objective Lens Calibration
US-2019004298-A1 · Jan 3, 2019 · US
Contour based defect detection
US-2018293721-A1 · Oct 11, 2018 · US
Recent patents
Latest publications not already listed above.
Contour-based array inspection of patterned defects
US-9483819-B2 · Nov 1, 2016 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kla Tencor Corp | 7 |
| Kla Corp | 4 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06T2207/30148 | 9 |
| G06T2207/10061 | 7 |
| G06T7/001 | 6 |
| G06N3/08 | 6 |
| G06N3/0464 | 6 |