System-level testing of non-singulated integrated circuit die on a wafer
US-2015109015-A1 · Apr 23, 2015 · US
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Wei Jian patents
Wei Jian is listed as an inventor on 1 patent in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Wei Jian |
| Total patents | 1 |
| First publication | Apr 23, 2015 |
| Latest publication | Apr 23, 2015 |
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Ati Technologies Ulc | 1 |
| Advanced Micro Devices Inc | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01R1/073 | 1 |
| G01R1/0433 | 1 |
| G01R31/2889 | 1 |