Semiconductor device and method for determining deterioration of semiconductor device
US-12438056-B2 · Oct 7, 2025 · US
Wang Qichen is listed as an inventor on 22 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Wang Qichen |
| Total patents | 22 |
| First publication | Jun 25, 2015 |
| Latest publication | Oct 7, 2025 |
Publications ranked by popularity score, then publication date.
US-12438056-B2 · Oct 7, 2025 · US
US-2023369142-A1 · Nov 16, 2023 · US
US-11632038-B2 · Apr 18, 2023 · US
US-11424610-B2 · Aug 23, 2022 · US
US-2022224221-A1 · Jul 14, 2022 · US
US-11218070-B2 · Jan 4, 2022 · US
US-11165333-B2 · Nov 2, 2021 · US
US-10825605-B2 · Nov 3, 2020 · US
US-2020295652-A1 · Sep 17, 2020 · US
US-2020244158-A1 · Jul 30, 2020 · US
Latest publications not already listed above.
US-2020161851-A1 · May 21, 2020 · US
US-10398029-B2 · Aug 27, 2019 · US
US-2019131062-A1 · May 2, 2019 · US
US-10122281-B2 · Nov 6, 2018 · US
US-9887539-B2 · Feb 6, 2018 · US
US-2017367184-A1 · Dec 21, 2017 · US
US-2016380546-A1 · Dec 29, 2016 · US
US-9531298-B2 · Dec 27, 2016 · US
US-9397582-B2 · Jul 19, 2016 · US
US-2016028232-A1 · Jan 28, 2016 · US
US-2015194908-A1 · Jul 9, 2015 · US
US-2015180368-A1 · Jun 25, 2015 · US
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Fuji Electric Co Ltd | 22 |
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| Y02B70/10 | 8 |
| H02M7/487 | 6 |
| H02M1/346 | 6 |
| H02M1/34 | 6 |
| H02M7/5387 | 6 |