Inspection device, inspection method, and inspection program
US-12529684-B2 · Jan 20, 2026 · US
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Wada Takahiro patents
Wada Takahiro is listed as an inventor on 7 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Wada Takahiro |
| Total patents | 7 |
| First publication | Mar 19, 2015 |
| Latest publication | Jan 20, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Information processing device, determination method, and information processing program
US-12488574-B2 · Dec 2, 2025 · US
Information processing device, determination area setting method, and storage medium
US-2024402135-A1 · Dec 5, 2024 · US
Information processing device, determination method, and storage medium
US-2024161267-A1 · May 16, 2024 · US
Information processing device, determination method, and information processing program
US-2023298327-A1 · Sep 21, 2023 · US
Inspection device, inspection method, and inspection program
US-2023221286-A1 · Jul 13, 2023 · US
Method for producing compound semiconductor thin film and solar cell including compound semiconductor thin film
US-2015075614-A1 · Mar 19, 2015 · US
Recent patents
Latest publications not already listed above.
No data yet.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Hitachi Zosen Corp | 6 |
| Kanadevia Corp | 2 |
| Toppan Printing Co Ltd | 1 |
| Tokyo Inst Tech | 1 |
| Ryukoku University | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06T7/0008 | 5 |
| G01N29/11 | 5 |
| G01N2291/0289 | 4 |
| G01N2291/267 | 4 |
| G06T2207/10132 | 4 |