Improved scanning electron microscope and method of using the same
US-2025231130-A1 · Jul 17, 2025 · US
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Uncovsky Marek patents
Uncovsky Marek is listed as an inventor on 8 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Uncovsky Marek |
| Total patents | 8 |
| First publication | Oct 6, 2015 |
| Latest publication | Jul 17, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Light guide assembly for an electron microscope
US-11335536-B2 · May 17, 2022 · US
Measurement and endpointing of sample thickness
US-10978272-B2 · Apr 13, 2021 · US
Light guide assembly for an electron microscope
US-2021082659-A1 · Mar 18, 2021 · US
Measurement and endpointing of sample thickness
US-2020135427-A1 · Apr 30, 2020 · US
Environmental cell for charged particle beam system
US-9679741-B2 · Jun 13, 2017 · US
Investigation of high-temperature specimens in a charged particle microscope
US-2017103868-A1 · Apr 13, 2017 · US
Detection method for use in charged-particle microscopy
US-9153416-B2 · Oct 6, 2015 · US
Recent patents
Latest publications not already listed above.
No data yet.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Fei Co | 8 |
| Novak Libor | 1 |
| Uncovsky Marek | 1 |
| Toth Milos | 1 |
| Cafourek Martin | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/28 | 7 |
| H01J37/244 | 6 |
| H01J2237/2445 | 5 |
| H01J2237/2802 | 4 |
| H01J37/226 | 4 |