Method of examining a sample using a charged particle microscope
US-11002692-B2 · May 11, 2021 · US
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Tuma Tomas patents
Tuma Tomas is listed as an inventor on 2 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Tuma Tomas |
| Total patents | 2 |
| First publication | Feb 20, 2020 |
| Latest publication | May 11, 2021 |
Notable patents
Publications ranked by popularity score, then publication date.
Method of examining a sample using a charged particle microscope
US-2020057011-A1 · Feb 20, 2020 · US
Recent patents
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Fei Co | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01N23/2206 | 2 |
| G01N23/046 | 2 |
| G01N2223/053 | 2 |
| G01N2223/427 | 2 |
| G01J3/44 | 2 |