Machine learning based examination for process monitoring
US-12561793-B2 · Feb 24, 2026 · US
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Tal Noam patents
Tal Noam is listed as an inventor on 44 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Tal Noam |
| Total patents | 44 |
| First publication | Mar 10, 2015 |
| Latest publication | Feb 24, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
End-to-end measurement for semiconductor specimens
US-12489020-B2 · Dec 2, 2025 · US
Machine learning based yield prediction
US-12469124-B2 · Nov 11, 2025 · US
Machine and deep learning methods for spectra-based metrology and process control
US-2025334887-A1 · Oct 30, 2025 · US
Metrology and process control for semiconductor manufacturing
US-2025181941-A1 · Jun 5, 2025 · US
Machine and deep learning methods for spectra-based metrology and process control
US-12321102-B2 · Jun 3, 2025 · US
Full-wafer metrology up-sampling
US-2025123571-A1 · Apr 17, 2025 · US
Machine learning based defect examination for semiconductor specimens
US-2025086781-A1 · Mar 13, 2025 · US
Metrology and process control for semiconductor manufacturing
US-12236364-B2 · Feb 25, 2025 · US
Machine and deep learning methods for spectra-based metrology and process control
US-2024310737-A1 · Sep 19, 2024 · US
Recent patents
Latest publications not already listed above.
Machine learning based yield prediction
US-2024281958-A1 · Aug 22, 2024 · US
Machine learning based examination for process monitoring
US-2024281956-A1 · Aug 22, 2024 · US
End-to-end measurement for semiconductor specimens
US-2024105522-A1 · Mar 28, 2024 · US
Metrology and process control for semiconductor manufacturing
US-2024078450-A1 · Mar 7, 2024 · US
System and method for controlling measurements of sample's parameters
US-11874606-B2 · Jan 16, 2024 · US
Machine and deep learning methods for spectra-based metrology and process control
US-11815819-B2 · Nov 14, 2023 · US
Metrology and process control for semiconductor manufacturing
US-11763181-B2 · Sep 19, 2023 · US
System and method for controlling measurements of sample's parameters
US-2023185203-A1 · Jun 15, 2023 · US
Configurable constellation mapping to control spectral efficiency versus signal-to-noise ratio
US-11665040-B2 · May 30, 2023 · US
Machine and deep learning methods for spectra-based metrology and process control
US-2023124431-A1 · Apr 20, 2023 · US
Signaling method for interference group discovery in cable modems
US-11463126-B2 · Oct 4, 2022 · US
Metrology and process control for semiconductor manufacturing
US-2022036218-A1 · Feb 3, 2022 · US
Configurable constellation mapping to control spectral efficiency versus signal-to-noise ratio
US-2022021475-A1 · Jan 20, 2022 · US
Cable modem and digital compensation for switchable analog filter to assist echo cancellation in full duplex cable modem
US-11133915-B2 · Sep 28, 2021 · US
Metrology and process control for semiconductor manufacturing
US-11093840-B2 · Aug 17, 2021 · US
Configurable constellation mapping to control spectral efficiency versus signal-to-noise ratio
US-11075713-B2 · Jul 27, 2021 · US
Metrology and process control for semiconductor manufacturing
US-2021150387-A1 · May 20, 2021 · US
Configurable constellation mapping to control spectral efficiency versus signal-to-noise ratio
US-10848267-B2 · Nov 24, 2020 · US
Signaling method for interference group discovery in cable modems
US-10742264-B2 · Aug 11, 2020 · US
Clock synchronization and ofdm symbol timing synchronization algorithm and architecture for data over cable service interface specification (docsis) full duplex (fdx) cable modem (cm) to enable fast recovery of downstream channels following an extended downstream freeze
US-2020244505-A1 · Jul 30, 2020 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Intel Corp | 21 |
| Nova Ltd | 13 |
| Applied Materials Israel Ltd | 7 |
| Nova Measuring Instr Ltd | 2 |
| Maxlinear Inc | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G03F7/706841 | 13 |
| G06N20/00 | 12 |
| G03F7/70616 | 12 |
| G03F7/705 | 12 |
| H04L1/0041 | 11 |