Machine learning based examination for process monitoring
US-12561793-B2 · Feb 24, 2026 · US
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Sinitsa Sergey patents
Sinitsa Sergey is listed as an inventor on 3 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Sinitsa Sergey |
| Total patents | 3 |
| First publication | Aug 22, 2024 |
| Latest publication | Feb 24, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Machine learning based defect examination for semiconductor specimens
US-2025086781-A1 · Mar 13, 2025 · US
Machine learning based examination for process monitoring
US-2024281956-A1 · Aug 22, 2024 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Israel Ltd | 3 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06T2207/30148 | 3 |
| G06T2207/20084 | 3 |
| G06T2207/20081 | 3 |
| G06N3/0455 | 3 |
| G06N3/047 | 3 |