Detecting defects in semiconductor specimens using weak labeling
US-11790515-B2 · Oct 17, 2023 · US
Schleyen Ran is listed as an inventor on 14 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Schleyen Ran |
| Total patents | 14 |
| First publication | Sep 22, 2016 |
| Latest publication | Oct 17, 2023 |
Publications ranked by popularity score, then publication date.
US-11790515-B2 · Oct 17, 2023 · US
US-2022301151-A1 · Sep 22, 2022 · US
US-11449711-B2 · Sep 20, 2022 · US
US-11379972-B2 · Jul 5, 2022 · US
US-2021383530-A1 · Dec 9, 2021 · US
US-2021343000-A1 · Nov 4, 2021 · US
US-11151710-B1 · Oct 19, 2021 · US
US-2021209418-A1 · Jul 8, 2021 · US
US-10340116-B1 · Jul 2, 2019 · US
US-10101206-B2 · Oct 16, 2018 · US
Latest publications not already listed above.
US-2018252583-A1 · Sep 6, 2018 · US
US-9900562-B2 · Feb 20, 2018 · US
US-9490101-B2 · Nov 8, 2016 · US
US-2016276127-A1 · Sep 22, 2016 · US
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Israel Ltd | 11 |
| Univ Ramot | 3 |
| Applied Mat Isreal Ltd | 1 |
| Ramot At Tel Avi Univ Ltd | 1 |
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06T2207/30148 | 9 |
| G06T2207/20084 | 8 |
| G06T2207/20081 | 8 |
| G06T7/0004 | 8 |
| G01N21/9501 | 8 |