Method of deep learning-based examination of a semiconductor specimen and system thereof
US-12183066-B2 · Dec 31, 2024 · US
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Ravid Daniel patents
Ravid Daniel is listed as an inventor on 10 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Ravid Daniel |
| Total patents | 10 |
| First publication | Feb 4, 2016 |
| Latest publication | Dec 31, 2024 |
Notable patents
Publications ranked by popularity score, then publication date.
Method of deep learning-based examination of a semiconductor specimen and system thereof
US-11348001-B2 · May 31, 2022 · US
Method of deep learining-based examination of a semiconductor specimen and system thereof
US-2022067523-A1 · Mar 3, 2022 · US
Method of deep learning-based examination of a semiconductor specimen and system thereof
US-11205119-B2 · Dec 21, 2021 · US
Method of deep learning-based examination of a semiconductor specimen and system thereof
US-11010665-B2 · May 18, 2021 · US
Method of deep learning-based examination of a semiconductor specimen and system thereof
US-2017364798-A1 · Dec 21, 2017 · US
Method of deep learining-based examination of a semiconductor specimen and system thereof
US-2017357895-A1 · Dec 14, 2017 · US
Registration of CAD data with SEM images
US-9715724-B2 · Jul 25, 2017 · US
Method of deep learining-based examination of a semiconductor specimen and system thereof
US-2017177997-A1 · Jun 22, 2017 · US
Registration of cad data with sem images
US-2016035076-A1 · Feb 4, 2016 · US
Recent patents
Latest publications not already listed above.
No data yet.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Israel Ltd | 9 |
| Applied Materials Israel Ltd | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06T7/001 | 10 |
| G06V10/82 | 8 |
| G06V10/764 | 8 |
| G06N3/045 | 8 |
| G06F18/24133 | 8 |