Metrology and process control for semiconductor manufacturing
US-2025181941-A1 · Jun 5, 2025 · US
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Rabinovich Eylon patents
Rabinovich Eylon is listed as an inventor on 7 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Rabinovich Eylon |
| Total patents | 7 |
| First publication | May 20, 2021 |
| Latest publication | Jun 5, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Metrology and process control for semiconductor manufacturing
US-12236364-B2 · Feb 25, 2025 · US
Metrology and process control for semiconductor manufacturing
US-2024078450-A1 · Mar 7, 2024 · US
Metrology and process control for semiconductor manufacturing
US-11763181-B2 · Sep 19, 2023 · US
Metrology and process control for semiconductor manufacturing
US-2022036218-A1 · Feb 3, 2022 · US
Metrology and process control for semiconductor manufacturing
US-11093840-B2 · Aug 17, 2021 · US
Metrology and process control for semiconductor manufacturing
US-2021150387-A1 · May 20, 2021 · US
Recent patents
Latest publications not already listed above.
No data yet.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Nova Ltd | 5 |
| Nova Measuring Instr Ltd | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P74/238 | 7 |
| H10P72/53 | 7 |
| G06N5/04 | 7 |
| G03F7/705 | 7 |
| G01B2210/56 | 7 |