System and method for generating predictive images for wafer inspection using machine learning
US-12586170-B2 · Mar 24, 2026 · US
This page is not indexed by search engines while we improve data quality.
Maslow Mark John patents
Maslow Mark John is listed as an inventor on 30 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Maslow Mark John |
| Total patents | 30 |
| First publication | Aug 9, 2018 |
| Latest publication | Mar 24, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
System and method for generating predictive images for wafer inspection using machine learning
US-2025391010-A1 · Dec 25, 2025 · US
Method for determining defectiveness of pattern based on after development image
US-2025237967-A1 · Jul 24, 2025 · US
Method for determining defectiveness of pattern based on after development image
US-12332573-B2 · Jun 17, 2025 · US
Method of determining control parameters of a device manufacturing process
US-12197136-B2 · Jan 14, 2025 · US
A method for characterizing a manufacturing process of semiconductor devices
US-2024111218-A1 · Apr 4, 2024 · US
Method of determining control parameters of a device manufacturing process
US-2024012337-A1 · Jan 11, 2024 · US
Method and system to monitor a process apparatus
US-2024004299-A1 · Jan 4, 2024 · US
Method for characterizing a manufacturing process of semiconductor devices
US-11860548-B2 · Jan 2, 2024 · US
Deep learning for semantic segmentation of pattern
US-11847570-B2 · Dec 19, 2023 · US
Recent patents
Latest publications not already listed above.
Method of determining control parameters of a device manufacturing process
US-11768442-B2 · Sep 26, 2023 · US
Method and system to monitor a process apparatus
US-11733610-B2 · Aug 22, 2023 · US
Method of determining control parameters of a device manufacturing process
US-2023058839-A1 · Feb 23, 2023 · US
Separation of contributions to metrology data
US-2023042759-A1 · Feb 9, 2023 · US
Separation of contributions to metrology data
US-11520239-B2 · Dec 6, 2022 · US
Method of determining control parameters of a device manufacturing process
US-11513442-B2 · Nov 29, 2022 · US
System and method for generating predictive images for wafer inspection using machine learning
US-2022375063-A1 · Nov 24, 2022 · US
Method for determining defectiveness of pattern based on after development image
US-2022342316-A1 · Oct 27, 2022 · US
Deep learning for semantic segmentation of pattern
US-2022327686-A1 · Oct 13, 2022 · US
Deep learning for semantic segmentation of pattern
US-11379970-B2 · Jul 5, 2022 · US
A method for characterizing a manufacturing process of semiconductor devices
US-2022100098-A1 · Mar 31, 2022 · US
Deep learning for semantic segmentation of pattern
US-2021374936-A1 · Dec 2, 2021 · US
Method of determining control parameters of a device manufacturing process
US-2021149312-A1 · May 20, 2021 · US
Process window tracker
US-10866523-B2 · Dec 15, 2020 · US
Method and system to monitor a process apparatus
US-2020124968-A1 · Apr 23, 2020 · US
Method and system to monitor a process apparatus
US-10571806-B2 · Feb 25, 2020 · US
Method and apparatus to monitor a process apparatus
US-2019214318-A1 · Jul 11, 2019 · US
Method and system to monitor a process apparatus
US-2019196334-A1 · Jun 27, 2019 · US
Separation of contributions to metrology data
US-2019086810-A1 · Mar 21, 2019 · US
Process window tracker
US-2018224752-A1 · Aug 9, 2018 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Asml Netherlands Bv | 30 |
| Aslm Netherlands B V | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G03F7/705 | 21 |
| G03F7/70625 | 17 |
| G03F7/70616 | 15 |
| H10P74/23 | 15 |
| G03F7/70633 | 15 |